Abstract: A processing method for applying an analog dynamic circuit to a digital testing tool includes the following steps. In a step (a), a transistor-level analog dynamic circuit is provided. In a step (b), plural equivalent models are designed according to operations of plural transistors in the transistor-level analog dynamic circuit. In a step (c), a substitution operation is performed to substitute the equivalent models for dynamic logic elements in the transistor-level analog dynamic circuit. Consequently, a gate-level substitution circuit is produced. In a step (d), the gate-level substitution circuit is imported into a digital testing tool. Consequently, a test pattern is generated. In a step (e), the transistor-level analog dynamic circuit is tested according to the test pattern.

Abstract: An integrated circuit includes a first stage and a second stage. The first stage receives a previous stage output data and a clock signal and generates a first output data. The second stage receives the first output data and the clock signal. The first stage includes a first flip-flop circuit, a first static combinational circuit, a dynamic combinational circuit and a multi-phase generator. The first flip-flop circuit receives the previous output data and the clock signal and generates an input data. The first static combinational circuit receives the input data and generates an intermediate data. The multi-phase generator receives the clock signal and generates a delayed clock signal. The dynamic combinational circuit receives the intermediate data and the delayed clock signal and generates the first output data.