Patents by Inventor Ching-Fen Kao

Ching-Fen Kao has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10527463
    Abstract: A sensing chip structure of an optical scale reader includes a substrate having at least one conductive pad. The substrate has thereon a photosensitive chip. The photosensitive chip has at least one pin. The pins are each connected to a conductive pad by a conducting wire. A coded graphic layer is disposed on a side of the photosensitive chip, and the side of the photosensitive chip faces away from the substrate. The sensing chip structure is conducive to structural simplification and miniaturization of the optical scale reader.
    Type: Grant
    Filed: April 18, 2018
    Date of Patent: January 7, 2020
    Assignee: Carmar Accuracy Co., Ltd.
    Inventors: Ching Fen Kao, Chia Jung Chang
  • Publication number: 20190323862
    Abstract: A sensing chip structure of an optical scale reader includes a substrate having at least one conductive pad. The substrate has thereon a photosensitive chip. The photosensitive chip has at least one pin. The pins are each connected to a conductive pad by a conducting wire. A coded graphic layer is disposed on a side of the photosensitive chip, and the side of the photosensitive chip faces away from the substrate. The sensing chip structure is conducive to structural simplification and miniaturization of the optical scale reader.
    Type: Application
    Filed: April 18, 2018
    Publication date: October 24, 2019
    Inventors: Ching Fen Kao, Chia Jung Chang
  • Patent number: 7187451
    Abstract: An apparatus for measuring a two-dimensional displacement is disclosed and includes a laser light source, a collimator lens, a beam splitter, a plurality of staggered conjugate optic lens and a plurality of interference optical dephasing modules. The laser light source provides a laser light incident on the collimator lens to generate collimated laser beams. Each of the collimated laser beams are incident on the beam splitter to be separated into two incident beams and incident on a two-dimensional diffraction unit to generate a plurality of first diffracted beams and a plurality of second-order diffracted beams. The staggered conjugate optic lens are used to reflect the first diffracted beams so that the first diffracted beams return to the two-dimensional diffraction unit to generate a plurality of second diffracted beams where the second diffracted beams and the second-order diffracted beams generated as a result of the first diffraction of the beams stagger.
    Type: Grant
    Filed: September 8, 2004
    Date of Patent: March 6, 2007
    Assignee: Industrial Technology Reserach Institute
    Inventors: Ching-Fen Kao, Chung-Chu Chang, Ching-Fang Lin
  • Publication number: 20050062981
    Abstract: An apparatus for measuring a two-dimensional displacement is disclosed and includes a laser light source, a collimator lens, a beam splitter, a plurality of staggered conjugate optic lens and a plurality of interference optical dephasing modules. The laser light source provides a laser light incident on the collimator lens to generate collimated laser beams. Each of the collimated laser beams are incident on the beam splitter to be separated into two incident beams and incident on a two-dimensional diffraction unit to generate a plurality of first diffracted beams and a plurality of second-order diffracted beams. The staggered conjugate optic lens are used to reflect the first diffracted beams so that the first diffracted beams return to the two-dimensional diffraction unit to generate a plurality of second diffracted beams where the second diffracted beams and the second-order diffracted beams generated as a result of the first diffraction of the beams stagger.
    Type: Application
    Filed: September 8, 2004
    Publication date: March 24, 2005
    Applicant: Industrial Technology Research Institute
    Inventors: Ching-Fen Kao, Chung-Chu Chang, Ching-Fang Lin
  • Patent number: 6744520
    Abstract: A method for measuring two-dimensional displacement using conjugate optics comprises the steps of emitting an incident beam onto a diffraction element to generate many firstly diffracted beams, selecting two axially symmetric beams of the same order of diffraction from the firstly diffracted beams, introducing corresponding sets of wavefront reconstruction optics to reflect the two selected beams back onto the same incident spot along the same optical paths and to generate many secondly diffracted beams, selecting two axially symmetric pairs of beams of the same order of diffraction from the secondly diffracted beams, forming two interference fringes by superposing the two selected pairs of beams via corresponding mirrors and interferometric optics, and obtaining two linearly independent displacements of the diffraction element relative to the rest of the optics by decoding the two interference fringes.
    Type: Grant
    Filed: March 4, 2002
    Date of Patent: June 1, 2004
    Assignee: Industrial Technology Research Institute
    Inventors: Chung-Chu Chang, Ching-Fen Kao, Chih-Kung Lee
  • Publication number: 20030164950
    Abstract: A method for measuring two-dimensional displacement using conjugate optics comprises the steps of emitting an incident beam onto a diffraction element to generate many firstly diffracted beams, selecting two axially symmetric beams of the same order of diffraction from the firstly diffracted beams, introducing corresponding sets of wavefront reconstruction optics to reflect the two selected beams back onto the same incident spot along the same optical paths and to generate many secondly diffracted beams, selecting two axially symmetric pairs of beams of the same order of diffraction from the secondly diffracted beams, forming two interference fringes by superposing the two selected pairs of beams via corresponding mirrors and interferometric optics, and obtaining two linearly independent displacements of the diffraction element relative to the rest of the optics by decoding the two interference fringes.
    Type: Application
    Filed: March 4, 2002
    Publication date: September 4, 2003
    Inventors: Chung-Chu Chang, Ching-Fen Kao, Chih-Kung Lee
  • Patent number: 5966392
    Abstract: A butt-coupling pumped single-mode solid-state laser is provided for generating a laser of single-transverse and single-longitudinal mode. The butt-coupling pumped single-mode solid-state laser includes: (1) a laser diode having an output facet for producing a pumping light; (2) a laser crystal immediately connected to the output facet of the laser diode with a specific length therebetween for generating an excited light at a fundamental wavelength in response to the pumping light; and (3) a mirror disposed away from the laser crystal with a specific distance for emanating a laser output.
    Type: Grant
    Filed: August 13, 1997
    Date of Patent: October 12, 1999
    Assignee: National Science Council
    Inventors: Yung-Fu Chen, Ting-Ming Huang, Ching-Fen Kao, Chi-Luen Wang, Jui-I Tsai
  • Patent number: 5640778
    Abstract: An apparatus for measuring the curvature radii of spherical and cylindrical surfaces is provided. The apparatus comprises a base, a probe and four ball rings of the same size, wherein the four ball rings are provided on the base and arranged into a square having a side length C. The probe is upward and downward movably mounted on the top surface of the base at the center of the square. There is also provided a method for measuring the curvature radii of spherical and cylindrical surfaces, wherein a ball-ring-distance is equal to C for the cylindrical surface or is equal to .sqroot.2C for the spherical surface.
    Type: Grant
    Filed: November 15, 1995
    Date of Patent: June 24, 1997
    Assignee: National Science Council
    Inventors: Shin-Gwo Shiue, Tai-San Liao, Sheng-Tsang Chang, Ching-Fen Kao