Patents by Inventor Chris Carrington

Chris Carrington has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Screening test for transverse magnetic-field excited noise in giant magnetoresistive heads
    Patent number: 6538430
    Abstract: A method and system for the rapid automatic screening of GMR heads for Barkhausen noise during production. This system rapidly and repeatedly measures associated noise in a GMR head subjected to a smoothly-varying external transverse magnetic field. The repeated Transverse Magnetic-field Excited Noise (TMEN) measurements are automatically sorted into bins to form a histogram, which is then automatically evaluated to develop TMEN range and weighted sum measures, which are then compared with predetermined standards for automatic acceptance or rejection of the GMR head under test. The GMR sensor Barkhausen noise is quantified through the use of a bandpass filter to remove all direct sensor responses, leaving only the noise signals, which are then repeatedly sampled to develop valid statistical Barkhausen noise measures suitable for automated analysis.
    Type: Grant
    Filed: August 23, 2001
    Date of Patent: March 25, 2003
    Assignee: International Business Machines Corporation
    Inventors: Chris Carrington, Peter Cheng-I Fang, Don Horne, Christopher Dana Keener, Kenneth Donald Mackay, Antonio Perez, Jr., Frederick William Stukey, Jr.
  • SCREENING TEST FOR TRANSVERSE MAGNETIC-FIELD EXCITED NOISE IN GIANT MAGNETORESISTIVE HEADS
    Publication number: 20030038626
    Abstract: A method and system for the rapid automatic screening of GMR heads for Barkhausen noise during production. This system rapidly and repeatedly measures associated noise in a GMR head subjected to a smoothly-varying external transverse magnetic field. The repeated Transverse Magnetic-field Excited Noise (TMEN) measurements are automatically sorted into bins to form a histogram, which is then automatically evaluated to develop TMEN range and weighted sum measures, which are then compared with predetermined standards for automatic acceptance or rejection of the GMR head under test. The GMR sensor Barkhausen noise is quantified through the use of a bandpass filter to remove all direct sensor responses, leaving only the noise signals, which are then repeatedly sampled to develop valid statistical Barkhausen noise measures suitable for automated analysis.
    Type: Application
    Filed: August 23, 2001
    Publication date: February 27, 2003
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Chris Carrington, Peter Cheng-I Fang, Don Horne, Christopher Dana Keener, Kenneth Donald Mackay, Antonio Perez,, Frederick William Stukey,