Abstract: There is provided an x-ray detector system including a photon-counting x-ray detector for detecting x-ray radiation from an x-ray source, and a coincidence detection system configured to determine and/or obtain information about the radiation incident on the x-ray detector based on information about the time of photon interactions in the x-ray detector and information about the location of the x-ray source in relation to the x-ray detector. There is also provide an x-ray imaging system including such an x-ray detector system, as well as a corresponding coincidence detection system and a corresponding method.

Abstract: There is provided an x-ray detector system including a photon-counting x-ray detector for detecting x-ray radiation from an x-ray source, and a coincidence detection system configured to determine and/or obtain information about the radiation incident on the x-ray detector based on information about the time of photon interactions in the x-ray detector and information about the location of the x-ray source in relation to the x-ray detector. There is also provide an x-ray imaging system including such an x-ray detector system, as well as a corresponding coincidence detection system and a corresponding method.

Abstract: An x-ray imaging system includes an x-ray source and detector. The detector is a photon counting x-ray detector, enabling detection of photon-counting events. The system acquires at least one phase contrast image based on photon-counting events. The detector includes x-ray detector sub-modules, also referred to as wafers, each including detector elements. The sub-modules are oriented in edge-on geometry with their edge directed towards the x-ray source, assuming the x-rays enter through the edge. Each sub-module or wafer has a thickness with two opposite sides of different potentials to enable charge drift towards the side, where the detector elements/pixels, are arranged. The system estimates charge diffusion from a Compton interaction or an interaction through photoeffect related to an incident x-ray photon in a sub-module or wafer of the x-ray detector, and estimates a point of interaction of the x-ray photon sub-module based on the determined estimate of charge diffusion.

Abstract: An x-ray imaging system includes an x-ray source and detector. The detector is a photon counting x-ray detector, enabling detection of photon-counting events. The system acquires at least one phase contrast image based on photon-counting events. The detector includes x-ray detector sub-modules, also referred to as wafers, each including detector elements. The sub-modules are oriented in edge-on geometry with their edge directed towards the x-ray source, assuming the x-rays enter through the edge. Each sub-module or wafer has a thickness with two opposite sides of different potentials to enable charge drift towards the side, where the detector elements/pixels, are arranged. The system estimates charge diffusion from a Compton interaction or an interaction through photoeffect related to an incident x-ray photon in a sub-module or wafer of the x-ray detector, and estimates a point of interaction of the x-ray photon sub-module based on the determined estimate of charge diffusion.