Abstract: Disclosed is a method of inspecting a reticle for defects that occur over time. The invention accomplishes this by generating and storing a “baseline” image of the reticle and then periodically generating a “current” image of the reticle and comparing the current and baseline images. The baseline image is taken at a time when the reticle is known to be acceptable. This may be when the reticle has been “qualified” by an optical test or when a die fabricated by reticle has passed an electrical test. Also disclosed in a method for compacting the baseline image before storage.