Abstract: Method, device and computer program for managing units of bulk material of an ore mine with a throughput of a few tons of bulk material per minute, wherein a material property of each unit, in particular on a conveyor system, is determined, an entry for each unit containing the respective material property of the unit and the position of each unit are stored in a database, and additional includes at least one (i) determining a transport path downstream for the each unit based on the respective entry in the database, (ii) adapting the subsequent processing of each unit based on the material property of the unit, and creating a virtual model of the repository if a unit is supplied to a repository, where a position of each unit is stored, together with its respective material property, in the database.

Abstract: A tilt sensor with zero position indication for indicating a predetermined zero position, including an indication device with an optical indication means and a control unit for actuating the indication device, wherein the indication device is configured to transmit a set first signal from an optical indication means in the zero position and to transmit a set second signal from the optical indication means in a position deviating from the zero position, wherein the second signal comprises an item of information about an extent of the deviation of the position deviating from the zero position, and wherein the optical indication means consists of only one light source.

Abstract: The invention relates to a device for testing electronic components (3) with at least two mechanical transfer elements (5a, 5b), of which each can be loaded in each case at a dedicated loading position with an electronic component (3) and with a common test position (7), into which the two transfer elements (5a, 5b) can be brought. Furthermore, the invention relates to a device for testing electronic components with at least two mechanical transfer elements (80a, 80b), of which each can be loaded in each case at a common loading position (88) with an electronic component (3) and with a common test position (89), into which the two transfer elements (80a, 80b) can be brought. The invention also relates to the associated method.

Abstract: The invention relates to a device for testing electronic components (3) with at least two mechanical transfer elements (5a, 5b), of which each can be loaded in each case at a dedicated loading position with an electronic component (3) and with a common test position (7), into which the two transfer elements (5a, 5b) can be brought. Furthermore, the invention relates to a device for testing electronic components with at least two mechanical transfer elements (80a, 80b), of which each can be loaded in each case at a common loading position (88) with an electronic component (3) and with a common test position (89), into which the two transfer elements (80a, 80b) can be brought. The invention also relates to the associated method.