Patents by Inventor Christian Kuwasaki

Christian Kuwasaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe card analysis system and method
    Patent number: 9638782
    Abstract: A system and method for evaluating wafer test probe cards under real-world wafer test cell condition integrates wafer test cell components into the probe card inspection and analysis process. Disclosed embodiments may utilize existing and/or modified wafer test cell components such as, a head plate, a test head, a signal delivery system, and a manipulator to emulate wafer test cell dynamics during the probe card inspection and analysis process.
    Type: Grant
    Filed: June 18, 2013
    Date of Patent: May 2, 2017
    Assignee: Rudolph Technologies, Inc.
    Inventors: Eric Endres, John T. Strom, Christian Kuwasaki, Christopher McLaughlin
  • PROBE CARD ANALYSIS SYSTEM AND METHOD
    Publication number: 20140021970
    Abstract: A system and method for evaluating wafer test probe cards under real-world wafer test cell condition integrates wafer test cell components into the probe card inspection and analysis process. Disclosed embodiments may utilize existing and/or modified wafer test cell components such as, a head plate, a test head, a signal delivery system, and a manipulator to emulate wafer test cell dynamics during the probe card inspection and analysis process.
    Type: Application
    Filed: June 18, 2013
    Publication date: January 23, 2014
    Inventors: Eric Endres, John T. Strom, Christian Kuwasaki, Christopher McLaughlin
  • Probe card analysis system and method
    Patent number: 8466703
    Abstract: A system and method for evaluating wafer test probe cards under real-world wafer test cell condition integrates wafer test cell components into the probe card inspection and analysis process. Disclosed embodiments may utilize existing and/or modified wafer test cell components such as, a head plate, a test head, a signal delivery system, and a manipulator to emulate wafer test cell dynamics during the probe card inspection and analysis process.
    Type: Grant
    Filed: August 24, 2010
    Date of Patent: June 18, 2013
    Assignee: Rudolph Technologies, Inc.
    Inventors: Eric Endres, John T. Strom, Christian Kuwasaki, Christopher McLaughlin
  • PROBE CARD ANALYSIS SYSTEM AND METHOD
    Publication number: 20110089965
    Abstract: A system and method for evaluating wafer test probe cards under real-world wafer test cell condition integrates wafer test cell components into the probe card inspection and analysis process. Disclosed embodiments may utilize existing and/or modified wafer test cell components such as, a head plate, a test head, a signal delivery system, and a manipulator to emulate wafer test cell dynamics during the probe card inspection and analysis process.
    Type: Application
    Filed: August 24, 2010
    Publication date: April 21, 2011
    Applicant: Rudolph Technologies, Inc.
    Inventors: Eric Endres, John T. Strom, Christian Kuwasaki, Christopher McLaughlin