Abstract: The present invention provides a method for detecting fungal DNA in a turf grass sample with a loop-mediated isothermal amplification (LAMP) assay which contains primers for fungal DNA of at least one turf pathogenic fungi selected from Sclerotinia homoeocarpa, Rhizoctonia solani spp., Pythium aphanidermatum, Gaeumannomyces graminis spp., Microdochium nivale spp., Magnaporthe poae, Colletotrichum graminicola, Colletotrichum cereale and Pythium ultimum var. ultimum, comprising: subjecting the turf sample to a LAMP reaction wherein the LAMP reaction uses a primer set of four or more nucleic acid sequences with each primer in the set having from 15 to 50 nucleic acids The primers useful in the present method are selected from specifically selected internal transcribed spacer regions or genes of the target fungi to provide improved assay results.

Abstract: In some disclosed embodiments, an image sensor is provided for recording incident radiation may include a first layer for filtering the incident radiation by attenuating incident radiation with a frequency below a cutoff frequency and a second light-sensitive layer for absorbing radiation passing through the first layer. The first layer may precede the second light-sensitive layer in a direction of propagation of the incident radiation and the first layer includes at least one aperture passing through the first layer to the second light-sensitive layer for propagating radiation therethrough. The cross sectional size of the at least one aperture may be configured to provide a cutoff frequency so that incident radiation with a frequency below the cutoff frequency is attenuated inside the at least one aperture and incident radiation with a frequency above the cutoff frequency propagates through the at least one aperture.

Abstract: The present invention provides a method for detecting fungal DNA in a turf grass sample with a loop-mediated isothermal amplification (LAMP) assay which contains primers for fungal DNA of at least one turf pathogenic fungi selected from Sclerotinia homoeocarpa, Rhizoctonia solani spp., Pythium ashanidematum, Gaeumannomyces graminis spp., Microdochium nivale spp., Magnaporthe poae, Colletotrihum graminicola, Colletotrichum cereale and Pytium ultimum var. ultimum, comprising: subjecting the turf sample to a LAMP reaction wherein the LAMP reaction uses a primer set of four or more nucleic acid sequences with each primer in the set having from 15 to 50 nucleic acids The primers useful in the present method are selected from specifically selected internal transcribed spacer regions or genes of the target fungi to provide improved assay results.

Abstract: The present invention provides a method for detecting fungal DNA in a turf grass sample with a loop- mediated isothermal amplification (LAMP) assay which contains primers for fungal DNA of at least one turf pathogenic fungi selected from Sclerotinia homoeocarpa, Rhizoctonia solani spp., Pythium ashanidematum, Gaeumannomyces graminis spp., Microdochium nivale spp., Magnaporthe poae, Colletotrihum graminicola, Colletotrichum cereale and Pytium ultimum var. ultimum, comprising: subjecting the turf sample to a LAMP reaction wherein the LAMP reaction uses a primer set of four or more nucleic acid sequences with each primer in the set having from 15 to 50 nucleic acids The primers useful in the present method are selected from specifically selected internal transcribed spacer regions or genes of the target fungi to provide improved assay results.

Abstract: In order to safeguard a hazardous area, in particular the hazardous area of an automatically operating machine, images of the hazardous area are recorded with at least a first and a second image recording unit that are arranged offset from one another. The images of the scene are subjected to three-dimensional scene analyses using different three-dimensional scene analysis methods, and the hazardous area is safeguarded when at least one of the scene analysis methods detects a foreign object.

Abstract: A method for reconstructing the profile of structures on surfaces. According to said method, at least two images of the same area of the surface that is to be analyzed are evaluated, said images being recorded from a nearly vertical perspective, for example, and the surface being illuminated from different directions at a flat angle thereto. Elevations or depressions on the surface thus cast a distinct shadow in the recorded images, the position of which varies according to the incident light. Inclined areas can be identified by means of a brighter reflection. The vertical profile of a structure on the surface can be determined, and the shape of a fin can hence be reconstructed, for example, by analyzing shadow contours and outlines of bright areas. Even flat inclination changes can be determined by integrating the shape-from-shading process so as to evaluate brightness patterns such that a 3D reconstruction of the surface can be obtained, which matches the original well.

Abstract: A method for reconstructing the profile of strictures on surfaces. According to said method, at least two images of the same area of the surface that is to be analyzed are evaluated, said images being recorded from a nearly vertical perspective, for example, and the surface being illuminated from different directions at a flat angle thereto. Elevations or depressions on the surface thus cast a distinct shadow in the recorded images, the position of which varies according to the incident light. Inclined areas can be identified by means of a brighter reflection. The vertical profile of a structure on the surface can be determined, and the shape of a fin can hence be reconstructed, for example, by analyzing shadow contours and outlines of bright areas. Even flat inclination changes can be determined by integrating the shape-from-shading process so as to evaluate brightness patterns such that a 3D reconstruction of the surface can be obtained, which matches the original well.

Abstract: In order to safeguard a hazardous area, in particular the hazardous area of an automatically operating machine, images of the hazardous area are recorded with at least a first and a second image recording unit that are arranged offset from one another. The images of the scene are subjected to three-dimensional scene analyses using different three-dimensional scene analysis methods, and the hazardous area is safeguarded when at least one of the scene analysis methods detects a foreign object.

Abstract: The invention is concerned with a device for determining an intensity and/or color and/or sharpness profile in each case of an optical lens system (3), which projects a test pattern (1) consisting of measuring fields (5), wherein the projection is directed indirectly or directly in each case toward a sensor area (6) of electronic color and brightness sensors of high resolution, whose measured signals, which are correlated to the measuring fields (5), are sent to a computer (60), which determines from these the intensity and/or color and/or sharpness profile and/or distortion propagation profile, outputs them to an image processing system (62) for an electronic image flaw correction of images (B) that were generated by an identical lens system (3), and stores them or temporarily stores them on a data carrier (61).

Abstract: A process for the processing of signals by which signal S is optimally verified for association with objects of a desired class Zk (wherein (with 1<=k<=number of different classes) and differentiated from undesired objects. One or more classes ZA of undesired objects, and beyond this, as an additional class, a rejection class R is defined, to which all signals are assigned which are not clearly assignable to one of classes Zk or ZA. Herein the decision criteria under which a signal S is assigned to the reject class R is the comparison of the output value Preject with the adjustable threshold value t, which is provided by a classification algorithm.

Abstract: A method for improving the definition of a digital image whose pixels are memorized light intensity values which are arranged in rows and columns in the form of a starting matrix Axy. A matrix section Aij is enlarged by reflection and subjected to a fast Fourier transform. The transformed matrix Bij is converted by elementary multiplication with an aberration correction matrix Cij to give a correct transformed matrix B′ij. This is transformed back into an intensity matrix A′ij from which a core section is set to a corrected intensity matrix A′xy. Following this, one matrix section after another is stagger-processed until a completely corrected intensity matrix A′xy has been obtained. The correcting function can be determined in different ways, in particular from an MFT of the imaging lens.