Patents by Inventor Christoph Hilmar Graf vom Hagen
Christoph Hilmar Graf vom Hagen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11975481Abstract: A method and an arrangement for producing a workpiece using additive manufacturing techniques involve pre-process, in-process and post-process measurement in order to determine individual characteristics of one or more workpiece layers. In particular, dimensional and/or geometrical characteristics of a workpiece layer are measured before the next workpiece layer is produced. Advantageously, production parameters are controlled in response to individual material characteristics determined prior to the production process. Also advantageously, measurement results are fed back into a production process in order to increase accuracy, reliability, repeatability and precision of the production process.Type: GrantFiled: October 23, 2020Date of Patent: May 7, 2024Assignee: Carl Zeiss Industrielle Messtechnik GmbHInventors: Marcin B. Bauza, Diana Spengler, Christoph Hilmar Graf Vom Hagen, Claus Hermannstaedter, Michael Totzeck, Robert Zarnetta, Markus Birkhold
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Patent number: 11972511Abstract: Improved (e.g., high-throughput, low-noise, and/or low-artifact) X-ray Microscopy images are achieved using a deep neural network trained via an accessible workflow. The workflow involves selection of a desired improvement factor (x), which is used to automatically partition supplied data into two or more subsets for neural network training. The neural network is trained by generating reconstructed volumes for each of the subsets. The neural network can be trained to take projection images or reconstructed volumes as input and output improved projection images or improved reconstructed volumes as output, respectively. Once trained, the neural network can be applied to the training data and/or subsequent data—optionally collected at a higher throughput—to ultimately achieve improved de-noising and/or other artifact reduction in the reconstructed volume.Type: GrantFiled: July 9, 2021Date of Patent: April 30, 2024Assignee: Carl Zeiss X-ray Microscopy, Inc.Inventors: Matthew Andrew, Lars Omlor, Andriy Andreyev, Christoph Hilmar Graf Vom Hagen
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Patent number: 11935228Abstract: A method for acquiring a 3D image of a sample structure includes acquiring a first raw 2D set of 2D images of a sample structure at a limited number of raw sample planes; calculating a 3D image of the sample structure represented by a 3D volumetric image data set; and extracting a measurement parameter from the 3D volumetric image data set. A further number of interleaving 2D image acquisitions are recorded at a further number of interleaved sample planes which do not coincide with previous acquisition sample planes. The steps “calculating,” “extracting” and “assigning” are repeated for the further interleaving 2D set until convergence or a maximum number of 2D image acquisitions is recorded. A projection system used for such method comprises a projection light source, a rotatable sample structure holder and a spatially resolving detector. Such method can also be used to acquire virtual tomographic images of a sample.Type: GrantFiled: October 26, 2021Date of Patent: March 19, 2024Assignees: Carl Zeiss SMT GmbH, Carl Zeiss X-ray Microscopy Inc.Inventors: Ramani Pichumani, Christoph Hilmar Graf vom Hagen, Jens Timo Neumann, Johannes Ruoff, Thomas Matthew Gregorich
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Patent number: 11817231Abstract: A detection system serves for X-ray inspection of an object. An imaging optical arrangement serves to image the object in an object plane illuminated by X-rays generated by an X-ray source. The imaging optical arrangement comprises an imaging optics to image a transfer field in a field plane into a detection field in a detection plane. A detection array is arranged at the detection field. An object mount holds the object to be imaged and is movable relative to the X-ray source via an object displacement drive along at least one lateral object displacement direction in the object plane. A shield stop with a transmissive shield stop aperture is arranged in an arrangement plane in a light path and is movable via a shield stop displacement drive in the arrangement plane.Type: GrantFiled: August 16, 2021Date of Patent: November 14, 2023Assignees: Carl Zeiss SMT GmbH, Carl Zeiss X-ray Microscopy Inc.Inventors: Johannes Ruoff, Juan Atkinson Mora, Thomas Anthony Case, Heiko Feldmann, Christoph Hilmar Graf Vom Hagen, Thomas Matthew Gregorich, Gerhard Krampert
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Publication number: 20230127194Abstract: In a method to acquire a 3D image of a sample structure initially a first raw 2D set of 2D images of a sample structure is acquired at a limited number of raw sample planes. From this first raw 2D set a 3D image of the sample structure being represented by a 3D volumetric image data set is calculated and a measurement parameter is extracted from the 3D volumetric image data set. Such measurement parameter is assigned to the number of 2D image acquisitions recorded during the acquisition step. Then, a further interleaving 2D set of 2D images of the sample structure is required by recording a further number of interleaving 2D image acquisitions at a further number of interleaved sample planes which do not coincide with the previous acquisition sample planes. The steps “calculating,” “extracting” and “assigning” are repeated for the further interleaving 2D set. The actual and the last extracted measurement parameters are compared to check whether a convergence criterion is met.Type: ApplicationFiled: October 26, 2021Publication date: April 27, 2023Inventors: Ramani Pichumani, Christoph Hilmar Graf vom Hagen, Jens Timo Neumann, Johannes Ruoff, Thomas Matthew Gregorich
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Patent number: 11633918Abstract: Methods and devices for additive manufacturing of workpieces are provided. For analysis during production, a test is carried out using a selected test method. The test results are compared with simulated test results derived during a simulation of the manufacturing and testing. The test may use one or more of a laser ultrasound test unit, an electronic laser speckle interferometry test unit, an infrared thermography test unit, or an x-ray test unit.Type: GrantFiled: December 20, 2019Date of Patent: April 25, 2023Assignee: Carl Zeiss Industrielle Messtechnik GmbHInventors: Michael Totzeck, Danny Krautz, Diana Spengler, Uwe Wolf, Christoph-Hilmar Graf Vom Hagen, Christian Holzner, Lars Omlor
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Publication number: 20230046280Abstract: A detection system serves for X-ray inspection of an object. An imaging optical arrangement serves to image the object in an object plane illuminated by X-rays generated by an X-ray source. The imaging optical arrangement comprises an imaging optics to image a transfer field in a field plane into a detection field in a detection plane. A detection array is arranged at the detection field. An object mount holds the object to be imaged and is movable relative to the light source via an object displacement drive along at least one lateral object displacement direction in the object plane. A shield stop with a transmissive shield stop aperture is arranged in an arrangement plane in a light path and is movable via a shield stop displacement drive in the arrangement plane.Type: ApplicationFiled: August 16, 2021Publication date: February 16, 2023Inventors: Johannes Ruoff, Juan Atkinson Mora, Thomas Anthony Case, Heiko Feldmann, Christoph Hilmar Graf Vom Hagen, Thomas Matthew Gregorich, Gerhard Krampert
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Publication number: 20230009951Abstract: Improved (e.g., high-throughput, low-noise, and/or low-artifact) X-ray Microscopy images are achieved using a deep neural network trained via an accessible workflow. The workflow involves selection of a desired improvement factor (x), which is used to automatically partition supplied data into two or more subsets for neural network training. The neural network is trained by generating reconstructed volumes for each of the subsets. The neural network can be trained to take projection images or reconstructed volumes as input and output improved projection images or improved reconstructed volumes as output, respectively. Once trained, the neural network can be applied to the training data and/or subsequent data—optionally collected at a higher throughput—to ultimately achieve improved de-noising and/or other artifact reduction in the reconstructed volume.Type: ApplicationFiled: July 9, 2021Publication date: January 12, 2023Inventors: Matthew ANDREW, Lars OMLOR, Andriy ANDREYEV, Christoph Hilmar GRAF VOM HAGEN
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Patent number: 11221206Abstract: A device for measuring objects is provided, said device comprising a mobile base such that it is movable to objects to be measured. Then, the object may be measured by means of a measuring head fastened to a kinematic unit.Type: GrantFiled: May 23, 2017Date of Patent: January 11, 2022Assignee: CARL ZEISS AGInventors: Frank Hoeller, Christoph-Hilmar Graf vom Hagen
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Publication number: 20210107215Abstract: A method and an arrangement for producing a workpiece using additive manufacturing techniques involve pre-process, in-process and post-process measurement in order to determine individual characteristics of one or more workpiece layers. In particular, dimensional and/or geometrical characteristics of a workpiece layer are measured before the next workpiece layer is produced. Advantageously, production parameters are controlled in response to individual material characteristics determined prior to the production process. Also advantageously, measurement results are fed back into a production process in order to increase accuracy, reliability, repeatability and precision of the production process.Type: ApplicationFiled: October 23, 2020Publication date: April 15, 2021Inventors: Marcin B. BAUZA, Diana SPENGLER, Christoph-Hilmar Graf Vom HAGEN, Claus HERMANNSTAEDTER, Michael TOTZECK, Robert ZARNETTA, Markus BIRKHOLD, Thomas ENGEL, Richard H. KNEBEL, Nils HAVERKAMP, Rainer SAGEMUELLER, Dominik SEITZ, Tobias HELD
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Publication number: 20200326175Abstract: A device for measuring objects is provided, said device comprising a mobile base such that it is movable to objects to be measured. Then, the object may be measured by means of a measuring head fastened to a kinematic unit.Type: ApplicationFiled: May 23, 2017Publication date: October 15, 2020Inventors: Frank Hoeller, Christoph-Hilmar Graf vom Hagen
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Publication number: 20200223146Abstract: Methods and devices for additive manufacturing of workpieces are provided. For analysis during production, a test is carried out using a selected test method. The test results are compared with simulated test results derived during a simulation of the manufacturing and testing. The test may use one or more of a laser ultrasound test unit, an electronic laser speckle interferometry test unit, an infrared thermography test unit, or an x-ray test unit.Type: ApplicationFiled: December 20, 2019Publication date: July 16, 2020Inventors: Michael TOTZECK, Danny KRAUTZ, Diana SPENGLER, Uwe WOLF, Christoph-Hilmar Graf Vom HAGEN, Christian HOLZNER, Lars OMLOR
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Patent number: 10309765Abstract: Coordinate measuring machine, comprising an optical sensor for capturing image data of a workpiece. The optical sensor comprises a lens, which defines an optical axis, and an illumination device for illuminating the workpiece. The illumination device comprises a diffusely radiating luminous body and an optical filter having a plurality of separate light passages. Light emitted by the luminous body enters the filter on an underside thereof, passes through the light passages and emerges again from the filter on an opposite top side thereof. Each of the light passages transmits only light rays that form an angle smaller than a predefined limiting angle with a longitudinal axis of the respective light passage. The lens and the filter are inclined relative to one another in such a way that a normal vector aligned perpendicularly to the top side of the filter forms an inclination angle other than 0° with the optical axis.Type: GrantFiled: April 19, 2017Date of Patent: June 4, 2019Assignee: CARL ZEISS INDUSTRIELLE MESSTECHNIK GMBHInventors: Dominik Seitz, Frank Widulle, Philipp Jester, Aksel Goehnermeier, Christoph-Hilmar Graf Vom Hagen, Andreas Ebser, Andreas Moebius
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Publication number: 20170307355Abstract: Coordinate measuring machine, comprising an optical sensor for capturing image data of a workpiece. The optical sensor comprises a lens, which defines an optical axis, and an illumination device for illuminating the workpiece. The illumination device comprises a diffusely radiating luminous body and an optical filter having a plurality of separate light passages. Light emitted by the luminous body enters the filter on an underside thereof, passes through the light passages and emerges again from the filter on an opposite top side thereof. Each of the light passages transmits only light rays that form an angle smaller than a predefined limiting angle with a longitudinal axis of the respective light passage. The lens and the filter are inclined relative to one another in such a way that a normal vector aligned perpendicularly to the top side of the filter forms an inclination angle other than 0° with the optical axis.Type: ApplicationFiled: April 19, 2017Publication date: October 26, 2017Inventors: Dominik SEITZ, Frank WIDULLE, Philipp JESTER, Aksel GOEHNERMEIER, Christoph-Hilmar GRAF VOM HAGEN, Andreas EBSER, Andreas MOEBIUS
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Patent number: 9250435Abstract: An optical assembly includes a connecting bridge to link up two autonomous optical units. The optical units are electronically connected to an analyzer. The connecting bridge is fitted each time with at least one coupling for each optical unit, said coupling making it possible, besides a mechanical coupling action, for the transmission of electronic signals and/or setting up an electric connection.Type: GrantFiled: April 19, 2011Date of Patent: February 2, 2016Assignee: Schmidt & Bender GmbH & Co. KGInventors: Christoph Hilmar Graf vom Hagen, Sven Roman Mueller
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Patent number: 8651748Abstract: The invention relates to a connecting bridge to connect two optical units. This connecting bridge is fitted in each case with at least one coupling for each optical unit making possible, besides mechanical coupling, also transmitting electronic signals and/or setting up an electrical connection.Type: GrantFiled: April 19, 2011Date of Patent: February 18, 2014Assignee: Schmidt & Bender GmbH & Co. KGInventors: Christoph Hilmar Graf vom Hagen, Sven Roman Mueller, Werner Schmidt, Alexander Zoellmann
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Publication number: 20120070119Abstract: The invention relates to a connecting bridge to connect two optical units. This connecting bridge is fitted in each case with at least one coupling for each optical unit making possible, besides mechanical coupling, also transmitting electronic signals and/or setting up an electrical connection.Type: ApplicationFiled: April 19, 2011Publication date: March 22, 2012Applicant: Schmidt & Bender GmbH & Co., KGInventors: Christoph Hilmar Graf vom HAGEN, Sven Roman Mueller, Werner Schmidt, Alexander Zoellmann
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Publication number: 20120069431Abstract: The invention relates to an optical assembly comprising a connecting bridge to link up two optical units. The optical units are electronically connected to an analyzer. The connecting bridge is fitted each time with at least one coupling for each optical unit, said coupling making it possible—besides a mechanical coupling action—transmission of electronic signals and/or setting up an electric connection.Type: ApplicationFiled: April 19, 2011Publication date: March 22, 2012Applicant: Schmidt & Bender GmbH & Co. KGInventors: Christoph Hilmar Graf vom Hagen, Sven Roman Mueller