Patents by Inventor Christoph Schick

Christoph Schick has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11092560
    Abstract: The present invention discloses an apparatus for realizing high-speed cooling of a trace material by using liquid drop cooling, which comprises an injector connected with an injection driver and used for dropwise adding a volatile cooling liquid; a temperature sensor placed below the injector; a data collector used for collecting a thermopile signal and a heating resistor signal of the temperature sensor; a gas purger used for purging a cooled sample; and a control center, wherein the injector, the temperature sensor, the data collector and the gas purger are all connected with the control center.
    Type: Grant
    Filed: March 29, 2019
    Date of Patent: August 17, 2021
    Assignee: NANJING UNIVERSITY
    Inventors: Dongshan Zhou, Evgeny Zhuravlev, Jing Jiang, Shaochuan Luo, Christoph Schick, Qi Xue, Xiaoliang Wang, Wei Chen, Wei Jiang, Qing Ji
  • Publication number: 20190242837
    Abstract: The present invention discloses an apparatus for realizing high-speed cooling of a trace material by using liquid drop cooling, which comprises an injector connected with an injection driver and used for dropwise adding a volatile cooling liquid; a temperature sensor placed below the injector; a data collector used for collecting a thermopile signal and a heating resistor signal of the temperature sensor; a gas purger used for purging a cooled sample; and a control center, wherein the injector, the temperature sensor, the data collector and the gas purger are all connected with the control center.
    Type: Application
    Filed: March 29, 2019
    Publication date: August 8, 2019
    Inventors: Dongshan ZHOU, Evgeny ZHURAVLEV, Jing JIANG, Shaochuan LUO, Christoph SCHICK, Qi XUE, Xiaoliang WANG, Wei CHEN, Wei JIANG, Qing JI
  • Patent number: 10060804
    Abstract: A cooling-heating stage-type fast scanning calorimeter capable of being integrated with other microscopic structure characterization techniques. The cooling-heating stage-type fast scanning calorimeter includes a sample chamber provided with light transmission and reflection transparent windows on the walls thereof, a cooling-heating stage provided with internal heating elements and coolant channels for temperature control and also provided with a transmission hole, a sample chamber temperature control system and a fast calorimetric system.
    Type: Grant
    Filed: December 20, 2013
    Date of Patent: August 28, 2018
    Assignee: Nanjing University
    Inventors: Dongshan Zhou, Lai Wei, Jing Jiang, Qi Xue, Wei Chen, Xiaoliang Wang, Wei Jiang, Christoph Schick
  • Publication number: 20160238465
    Abstract: A stage-type fast scanning calorimetry which can be integrated with other structure characterization approaches is provided. It relates to the field of phase and microstructure analysis. The stage-type fast scanning calorimetry comprises a sample chamber with reflection window and transmission window, a thermal stage with heating elements and coolant channels inside for temperature controlling and a transmission hole, a temperature control system for sample chamber, a fast calorimetric system. It provides the following advantages. Firstly, the fast calorimetric system is miniaturized in a thermal stage chamber, it allows the integration of fast calorimetry and structure characterization through the reflection, transmission windows and hole. Secondly, the temperature of sample can be compensated in real time by program controlling, in order to stable the sample temperature and study some metastable state conveniently.
    Type: Application
    Filed: December 20, 2013
    Publication date: August 18, 2016
    Inventors: Dongshan Zhou, Lai Wei, Jing Jiang, Qi Xue, Wei Chen, Xiaoliang Wang, Wei Jiang, Christoph Schick
  • Patent number: 7677795
    Abstract: A differential scanning calorimeter apparatus includes reference and sample cells and controlled temperature shields. The temperature of the shields is controlled such that baseline curvature is reduced by eliminating heat flow from the furnaces to their surroundings (quasi adiabatic conditions) and by controlling heat flow through a well defined solid state heat resistance between the furnaces and a temperature controlled heat sink. The temperature of each shield can be controlled independently to reduce differential heat flow over the whole temperature range of the scan, or maintained at a constant temperature for conventional power compensated DSC operation. The temperature/time profile for each shield can be controlled according to actual furnace temperature, obtained from an empty run, or stored in the computer memory and recalled for sample measurements.
    Type: Grant
    Filed: October 16, 2008
    Date of Patent: March 16, 2010
    Assignee: PerkinElmer LAS, Inc.
    Inventor: Christoph Schick
  • Publication number: 20090034579
    Abstract: A differential scanning calorimeter apparatus includes reference and sample cells and controlled temperature shields. The temperature of the shields is controlled such that baseline curvature is reduced by eliminating heat flow from the furnaces to their surroundings (quasi adiabatic conditions) and by controlling heat flow through a well defined solid state heat resistance between the furnaces and a temperature controlled heat sink. The temperature of each shield can be controlled independently to reduce differential heat flow over the whole temperature range of the scan, or maintained at a constant temperature for conventional power compensated DSC operation. The temperature/time profile for each shield can be controlled according to actual furnace temperature, obtained from an empty run, or stored in the computer memory and recalled for sample measurements.
    Type: Application
    Filed: October 16, 2008
    Publication date: February 5, 2009
    Inventor: Christoph Schick
  • Patent number: 7448796
    Abstract: A differential scanning calorimeter apparatus includes reference and sample cells and controlled temperature shields. The temperature of the shields is controlled such that baseline curvature is reduced by eliminating heat flow from the furnaces to their surroundings (quasi adiabatic conditions) and by controlling heat flow through a well defined solid state heat resistance between the furnaces and a temperature controlled heat sink. The temperature of each shield can be controlled independently to reduce differential heat flow over the whole temperature range of the scan, or maintained at a constant temperature for conventional power compensated DSC operation. The temperature/time profile for each shield can be controlled according to actual furnace temperature, obtained from an empty run, or stored in the computer memory and recalled for sample measurements.
    Type: Grant
    Filed: October 31, 2007
    Date of Patent: November 11, 2008
    Assignee: PerkinElmer LAS, Inc.
    Inventor: Christoph Schick
  • Patent number: 7371006
    Abstract: A differential scanning calorimeter apparatus includes reference and sample cells and controlled temperature shields. The temperature of the shields is controlled such that baseline curvature is reduced by eliminating heat flow from the furnaces to their surroundings (quasi adiabatic conditions) and by controlling heat flow through a well defined solid state heat resistance between the furnaces and a temperature controlled heat sink. The temperature of each shield can be controlled independently to reduce differential heat flow over the whole temperature range of the scan, or maintained at a constant temperature for conventional power compensated DSC operation. The temperature/time profile for each shield can be controlled according to actual furnace temperature, obtained from an empty run, or stored in the computer memory and recalled for sample measurements.
    Type: Grant
    Filed: February 10, 2005
    Date of Patent: May 13, 2008
    Assignee: PerkinElmer LAS, Inc.
    Inventor: Christoph Schick
  • Publication number: 20080049810
    Abstract: A differential scanning calorimeter apparatus includes reference and sample cells and controlled temperature shields. The temperature of the shields is controlled such that baseline curvature is reduced by eliminating heat flow from the furnaces to their surroundings (quasi adiabatic conditions) and by controlling heat flow through a well defined solid state heat resistance between the furnaces and a temperature controlled heat sink. The temperature of each shield can be controlled independently to reduce differential heat flow over the whole temperature range of the scan, or maintained at a constant temperature for conventional power compensated DSC operation. The temperature/time profile for each shield can be controlled according to actual furnace temperature, obtained from an empty run, or stored in the computer memory and recalled for sample measurements.
    Type: Application
    Filed: October 31, 2007
    Publication date: February 28, 2008
    Inventor: Christoph Schick
  • Publication number: 20050190813
    Abstract: A differential scanning calorimeter apparatus includes reference and sample cells and- controlled temperature shields. The temperature of the shields is controlled such that baseline curvature is reduced by eliminating heat flow from the furnaces to their surroundings (quasi adiabatic conditions) and by controlling heat flow through a well defined solid state heat resistance between the furnaces and a temperature controlled heat sink. The temperature of each shield can be controlled independently to reduce differential heat flow over the whole temperature range of the scan, or maintained at a constant temperature for conventional power compensated DSC operation. The temperature/time profile for each shield can be controlled according to actual furnace temperature, obtained from an empty run, or stored in the computer memory and recalled for sample measurements.
    Type: Application
    Filed: February 10, 2005
    Publication date: September 1, 2005
    Inventor: Christoph Schick
  • Patent number: 6497509
    Abstract: A method of measuring the absolute value of thermal conductivity of low thermal conducting solid materials is disclosed. Thermal conductivity and heat capacity of the sample are determined simultaneously in a single measurement with the prerequisite that these values are frequency independent. This method is realized on power-compensated differential scanning calorimeters without any modification in the measuring system. DSC is calibrated in a standard way for temperature and heat flow. The method uses temperature-time profiles consisting of one fast temperature jump of 0.5 to 2 K and an isotherm. The measuring time for each temperature is less than 1 min. As input parameters only sample thickness and contact area with the DSC furnace (or sample diameter if the sample is disk shaped) are needed together with sample mass. In addition to the sample thermal conductivity and heat capacity the effective thermal contact between sample and DSC furnace is determined.
    Type: Grant
    Filed: June 8, 2001
    Date of Patent: December 24, 2002
    Assignee: PerkinElmer Instruments LLC
    Inventors: Mikhail Merzliakov, Christoph Schick
  • Publication number: 20020041619
    Abstract: A method of measuring the absolute value of thermal conductivity of low thermal conducting solid materials is disclosed. Thermal conductivity and heat capacity of the sample are determined simultaneously in a single measurement with the prerequisite that these values are frequency independent. This method is realized on power-compensated differential scanning calorimeters without any modification in the measuring system. DSC is calibrated in a standard way for temperature and heat flow. The method uses temperature-time profiles consisting of one fast temperature jump of 0.5 to 2 K and an isotherm. The measuring time for each temperature is less than 1 min. As input parameters only sample thickness and contact area with the DSC furnace (or sample diameter if the sample is disk shaped) are needed together with sample mass. In addition to the sample thermal conductivity and heat capacity the effective thermal contact between sample and DSC furnace is determined.
    Type: Application
    Filed: June 8, 2001
    Publication date: April 11, 2002
    Inventors: Mikhail Merzliakov, Christoph Schick