Patents by Inventor Christoph Schick
Christoph Schick has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11092560Abstract: The present invention discloses an apparatus for realizing high-speed cooling of a trace material by using liquid drop cooling, which comprises an injector connected with an injection driver and used for dropwise adding a volatile cooling liquid; a temperature sensor placed below the injector; a data collector used for collecting a thermopile signal and a heating resistor signal of the temperature sensor; a gas purger used for purging a cooled sample; and a control center, wherein the injector, the temperature sensor, the data collector and the gas purger are all connected with the control center.Type: GrantFiled: March 29, 2019Date of Patent: August 17, 2021Assignee: NANJING UNIVERSITYInventors: Dongshan Zhou, Evgeny Zhuravlev, Jing Jiang, Shaochuan Luo, Christoph Schick, Qi Xue, Xiaoliang Wang, Wei Chen, Wei Jiang, Qing Ji
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Publication number: 20190242837Abstract: The present invention discloses an apparatus for realizing high-speed cooling of a trace material by using liquid drop cooling, which comprises an injector connected with an injection driver and used for dropwise adding a volatile cooling liquid; a temperature sensor placed below the injector; a data collector used for collecting a thermopile signal and a heating resistor signal of the temperature sensor; a gas purger used for purging a cooled sample; and a control center, wherein the injector, the temperature sensor, the data collector and the gas purger are all connected with the control center.Type: ApplicationFiled: March 29, 2019Publication date: August 8, 2019Inventors: Dongshan ZHOU, Evgeny ZHURAVLEV, Jing JIANG, Shaochuan LUO, Christoph SCHICK, Qi XUE, Xiaoliang WANG, Wei CHEN, Wei JIANG, Qing JI
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Patent number: 10060804Abstract: A cooling-heating stage-type fast scanning calorimeter capable of being integrated with other microscopic structure characterization techniques. The cooling-heating stage-type fast scanning calorimeter includes a sample chamber provided with light transmission and reflection transparent windows on the walls thereof, a cooling-heating stage provided with internal heating elements and coolant channels for temperature control and also provided with a transmission hole, a sample chamber temperature control system and a fast calorimetric system.Type: GrantFiled: December 20, 2013Date of Patent: August 28, 2018Assignee: Nanjing UniversityInventors: Dongshan Zhou, Lai Wei, Jing Jiang, Qi Xue, Wei Chen, Xiaoliang Wang, Wei Jiang, Christoph Schick
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Publication number: 20160238465Abstract: A stage-type fast scanning calorimetry which can be integrated with other structure characterization approaches is provided. It relates to the field of phase and microstructure analysis. The stage-type fast scanning calorimetry comprises a sample chamber with reflection window and transmission window, a thermal stage with heating elements and coolant channels inside for temperature controlling and a transmission hole, a temperature control system for sample chamber, a fast calorimetric system. It provides the following advantages. Firstly, the fast calorimetric system is miniaturized in a thermal stage chamber, it allows the integration of fast calorimetry and structure characterization through the reflection, transmission windows and hole. Secondly, the temperature of sample can be compensated in real time by program controlling, in order to stable the sample temperature and study some metastable state conveniently.Type: ApplicationFiled: December 20, 2013Publication date: August 18, 2016Inventors: Dongshan Zhou, Lai Wei, Jing Jiang, Qi Xue, Wei Chen, Xiaoliang Wang, Wei Jiang, Christoph Schick
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Patent number: 7677795Abstract: A differential scanning calorimeter apparatus includes reference and sample cells and controlled temperature shields. The temperature of the shields is controlled such that baseline curvature is reduced by eliminating heat flow from the furnaces to their surroundings (quasi adiabatic conditions) and by controlling heat flow through a well defined solid state heat resistance between the furnaces and a temperature controlled heat sink. The temperature of each shield can be controlled independently to reduce differential heat flow over the whole temperature range of the scan, or maintained at a constant temperature for conventional power compensated DSC operation. The temperature/time profile for each shield can be controlled according to actual furnace temperature, obtained from an empty run, or stored in the computer memory and recalled for sample measurements.Type: GrantFiled: October 16, 2008Date of Patent: March 16, 2010Assignee: PerkinElmer LAS, Inc.Inventor: Christoph Schick
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Publication number: 20090034579Abstract: A differential scanning calorimeter apparatus includes reference and sample cells and controlled temperature shields. The temperature of the shields is controlled such that baseline curvature is reduced by eliminating heat flow from the furnaces to their surroundings (quasi adiabatic conditions) and by controlling heat flow through a well defined solid state heat resistance between the furnaces and a temperature controlled heat sink. The temperature of each shield can be controlled independently to reduce differential heat flow over the whole temperature range of the scan, or maintained at a constant temperature for conventional power compensated DSC operation. The temperature/time profile for each shield can be controlled according to actual furnace temperature, obtained from an empty run, or stored in the computer memory and recalled for sample measurements.Type: ApplicationFiled: October 16, 2008Publication date: February 5, 2009Inventor: Christoph Schick
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Patent number: 7448796Abstract: A differential scanning calorimeter apparatus includes reference and sample cells and controlled temperature shields. The temperature of the shields is controlled such that baseline curvature is reduced by eliminating heat flow from the furnaces to their surroundings (quasi adiabatic conditions) and by controlling heat flow through a well defined solid state heat resistance between the furnaces and a temperature controlled heat sink. The temperature of each shield can be controlled independently to reduce differential heat flow over the whole temperature range of the scan, or maintained at a constant temperature for conventional power compensated DSC operation. The temperature/time profile for each shield can be controlled according to actual furnace temperature, obtained from an empty run, or stored in the computer memory and recalled for sample measurements.Type: GrantFiled: October 31, 2007Date of Patent: November 11, 2008Assignee: PerkinElmer LAS, Inc.Inventor: Christoph Schick
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Patent number: 7371006Abstract: A differential scanning calorimeter apparatus includes reference and sample cells and controlled temperature shields. The temperature of the shields is controlled such that baseline curvature is reduced by eliminating heat flow from the furnaces to their surroundings (quasi adiabatic conditions) and by controlling heat flow through a well defined solid state heat resistance between the furnaces and a temperature controlled heat sink. The temperature of each shield can be controlled independently to reduce differential heat flow over the whole temperature range of the scan, or maintained at a constant temperature for conventional power compensated DSC operation. The temperature/time profile for each shield can be controlled according to actual furnace temperature, obtained from an empty run, or stored in the computer memory and recalled for sample measurements.Type: GrantFiled: February 10, 2005Date of Patent: May 13, 2008Assignee: PerkinElmer LAS, Inc.Inventor: Christoph Schick
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Publication number: 20080049810Abstract: A differential scanning calorimeter apparatus includes reference and sample cells and controlled temperature shields. The temperature of the shields is controlled such that baseline curvature is reduced by eliminating heat flow from the furnaces to their surroundings (quasi adiabatic conditions) and by controlling heat flow through a well defined solid state heat resistance between the furnaces and a temperature controlled heat sink. The temperature of each shield can be controlled independently to reduce differential heat flow over the whole temperature range of the scan, or maintained at a constant temperature for conventional power compensated DSC operation. The temperature/time profile for each shield can be controlled according to actual furnace temperature, obtained from an empty run, or stored in the computer memory and recalled for sample measurements.Type: ApplicationFiled: October 31, 2007Publication date: February 28, 2008Inventor: Christoph Schick
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Publication number: 20050190813Abstract: A differential scanning calorimeter apparatus includes reference and sample cells and- controlled temperature shields. The temperature of the shields is controlled such that baseline curvature is reduced by eliminating heat flow from the furnaces to their surroundings (quasi adiabatic conditions) and by controlling heat flow through a well defined solid state heat resistance between the furnaces and a temperature controlled heat sink. The temperature of each shield can be controlled independently to reduce differential heat flow over the whole temperature range of the scan, or maintained at a constant temperature for conventional power compensated DSC operation. The temperature/time profile for each shield can be controlled according to actual furnace temperature, obtained from an empty run, or stored in the computer memory and recalled for sample measurements.Type: ApplicationFiled: February 10, 2005Publication date: September 1, 2005Inventor: Christoph Schick
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Patent number: 6497509Abstract: A method of measuring the absolute value of thermal conductivity of low thermal conducting solid materials is disclosed. Thermal conductivity and heat capacity of the sample are determined simultaneously in a single measurement with the prerequisite that these values are frequency independent. This method is realized on power-compensated differential scanning calorimeters without any modification in the measuring system. DSC is calibrated in a standard way for temperature and heat flow. The method uses temperature-time profiles consisting of one fast temperature jump of 0.5 to 2 K and an isotherm. The measuring time for each temperature is less than 1 min. As input parameters only sample thickness and contact area with the DSC furnace (or sample diameter if the sample is disk shaped) are needed together with sample mass. In addition to the sample thermal conductivity and heat capacity the effective thermal contact between sample and DSC furnace is determined.Type: GrantFiled: June 8, 2001Date of Patent: December 24, 2002Assignee: PerkinElmer Instruments LLCInventors: Mikhail Merzliakov, Christoph Schick
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Publication number: 20020041619Abstract: A method of measuring the absolute value of thermal conductivity of low thermal conducting solid materials is disclosed. Thermal conductivity and heat capacity of the sample are determined simultaneously in a single measurement with the prerequisite that these values are frequency independent. This method is realized on power-compensated differential scanning calorimeters without any modification in the measuring system. DSC is calibrated in a standard way for temperature and heat flow. The method uses temperature-time profiles consisting of one fast temperature jump of 0.5 to 2 K and an isotherm. The measuring time for each temperature is less than 1 min. As input parameters only sample thickness and contact area with the DSC furnace (or sample diameter if the sample is disk shaped) are needed together with sample mass. In addition to the sample thermal conductivity and heat capacity the effective thermal contact between sample and DSC furnace is determined.Type: ApplicationFiled: June 8, 2001Publication date: April 11, 2002Inventors: Mikhail Merzliakov, Christoph Schick