Patents by Inventor Christophe MIELOT

Christophe MIELOT has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Radiation source
    Patent number: 11219113
    Abstract: An inspection radiation source is provided. The inspection radiation source includes an electron accelerator for generating an electron current, and a target for the electron current including a first part and a second part. This first part is configured to be at least partly exposed to the electron current on an impact area having a first width in a direction substantially perpendicular to the electron current, and inhibit propagation of the electron current. The second part has a second width in the direction substantially perpendicular to the electron current, the second width of the second part being smaller than the first width of the impact area, the second part being configured to be at least partly exposed to the electron current, and generate inspection radiation by emitting X-rays in response to being exposed to the electron current.
    Type: Grant
    Filed: January 23, 2019
    Date of Patent: January 4, 2022
    Assignee: SMITHS HEIMANN SAS
    Inventors: Guillaume Jegou, Christophe Mielot
  • RADIATION SOURCE
    Publication number: 20200352015
    Abstract: An inspection radiation source is provided. The inspection radiation source includes an electron accelerator for generating an electron current, and a target for the electron current including a first part and a second part. This first part is configured to be at least partly exposed to the electron current on an impact area having a first width in a direction substantially perpendicular to the electron current, and inhibit propagation of the electron current. The second part has a second width in the direction substantially perpendicular to the electron current, the second width of the second part being smaller than the first width of the impact area, the second part being configured to be at least partly exposed to the electron current, and generate inspection radiation by emitting X-rays in response to being exposed to the electron current.
    Type: Application
    Filed: January 23, 2019
    Publication date: November 5, 2020
    Inventors: Guillaume JEGOU, Christophe MIELOT