Patents by Inventor Christopher D. Keener

Christopher D. Keener has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9076468
    Abstract: A scissor type magnetic sensor having a soft magnetic side shields for improved sensor stability. The soft magnetic side shield structure extends from the side of the sensor and although being constructed of a low coercivity soft magnetic material it has a shape the causes the magnetization of the side shield layer to remain oriented in a desired direction parallel to the media facing surface. The side shields include first and second magnetic layers with an antiparallel coupling layer sandwiched between them. Each of the magnetic layers of the side shield structure has a width measured perpendicular to the media facing surface and a thickness measured perpendicular to the width and parallel with the media facing surface, both the width and the thickness being less than 10 times an intrinsic exchange length of the magnetic layer.
    Type: Grant
    Filed: March 12, 2014
    Date of Patent: July 7, 2015
    Assignee: HGST Netherlands B.V.
    Inventors: Christopher D. Keener, Quang Le, David J. Seagle, Neil Smith, Petrus A. Van Der Heijden
  • Publication number: 20150002961
    Abstract: A scissor type magnetic sensor having a soft magnetic bias structure located at a back edge of the sensor stack. The sensor stack includes first and second magnetic free layers that are anti-parallel coupled across a non-magnetic layer sandwiched there-between. The soft magnetic bias structure has a length as measured perpendicular to the air bearing surface that is greater than its width as measured parallel with the air bearing surface. This shape allows the soft magnetic bias structure to have a magnetization that is maintained in a direction perpendicular to the air bearing surface and which allows the bias structure to maintain a magnetic bias field for biasing the free layers of the sensor stack.
    Type: Application
    Filed: June 26, 2013
    Publication date: January 1, 2015
    Inventors: Christopher D. Keener, Quang Le, David J. Seagle, Neil Smith, Petrus A. Van Der Heijden
  • Patent number: 6947871
    Abstract: A method for improving yields in manufacturing processes includes identifying parameters which affect performance at a subsequent step in the process, collecting data concerning individual performance parameters, creating a reference scale which correlates individual parameters with probability of failure at a subsequent step in the process, testing a manufactured unit to collect performance data concerning two or more of the individual parameters from a manufactured unit, comparing performance data concerning two or more of the individual parameters from the manufactured unit to the reference scale to assign probability of failure for each of the single performance parameters, calculating a Figure of Merit, and utilizing the Figure of Merit to sort or disposition units.
    Type: Grant
    Filed: September 30, 2003
    Date of Patent: September 20, 2005
    Assignee: Hitachi Global Storage Technologies Netherlands, B.V.
    Inventors: Youping Deng, Christopher D. Keener, Jinsong Wang