Patents by Inventor Christopher H. Rees

Christopher H. Rees has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • SYSTEMS AND METHODS FOR DETECTING DEFECTS IN POWDER MANUFACTURED COMPONENTS
    Publication number: 20240119579
    Abstract: A method for detecting defects includes steps of: (1) calculating an average value for intensity of CT image voxels in a neighborhood; (2) calculating a difference value for the intensity of the voxels in the neighborhood; (3) calculating a standard deviation for the intensity of the voxels in the neighborhood; (4) calculating a z-score for each one of the voxels; (5) identifying a cluster of neighboring ones of the voxels; (6) determining a cluster-boundary parameter of the cluster; and (7) classifying the cluster as a defect when the cluster-boundary parameter of the cluster is above a parameter threshold.
    Type: Application
    Filed: October 10, 2022
    Publication date: April 11, 2024
    Applicant: The Boeing Company
    Inventors: Dominic N. Nwoke, Robert W. Grube, Scott H. Fife, Christopher H. Rees