Abstract: A memory access system may include a first memory address translator, a second memory address translator and a mapping entry invalidator. The first memory address translator translates a first virtual address in a first protocol of a memory access request to a second virtual address in a second protocol and tracks memory access request completions. The second memory address translator is to translate the second virtual address to a physical address of a memory. The mapping entry invalidator requests invalidation of a first mapping entry of the first mapping address translator requests invalidation of a second mapping entry of the second memory address translator corresponding to the first mapping entry following invalidation of the first mapping entry and based upon the tracked memory access request completions.

Abstract: A memory access system may include a first memory address translator, a second memory address translator and a mapping entry invalidator. The first memory address translator translates a first virtual address in a first protocol of a memory access request to a second virtual address in a second protocol and tracks memory access request completions. The second memory address translator is to translate the second virtual address to a physical address of a memory. The mapping entry invalidator requests invalidation of a first mapping entry of the first mapping address translator requests invalidation of a second mapping entry of the second memory address translator corresponding to the first mapping entry following invalidation of the first mapping entry and based upon the tracked memory access request completions.

Abstract: Apparatus and other embodiments associated with a distributed Joint Test Access Group (JTAG) test bus controller (TBC) architecture are described. One example method includes providing first on-board scan programming (OSP) data to a first circuit board configured with a first TBC and located in a computer. The example method also includes providing second OSP data to a second circuit board configured with a second test bus controller and located in the same computer. The example method also includes controlling OSP to be performed at least partially in parallel on the first circuit board and the second circuit board.

Abstract: Apparatus and other embodiments associated with a distributed Joint Test Access Group (JTAG) test bus controller (TBC) architecture are described. One example method includes providing first on-board scan programming (OSP) data to a first circuit board configured with a first TBC and located in a computer. The example method also includes providing second OSP data to a second circuit board configured with a second test bus controller and located in the same computer. The example method also includes controlling OSP to be performed at least partially in parallel on the first circuit board and the second circuit board.

Abstract: The invention provides a method of implementing firmware updates to programmable parts within circuit boards on a manufacturing line. An image file of firmware for each of the parts is created and stored on a firmware server. The programmable parts are preferably integrated with the printed circuit boards; each of the boards networks to the firmware server by connection with an interface server, such that the image files download to the circuit board for programming the board's internal programmable parts. Networking between the parts and the firmware server can include communications across the Internet and/or one or more area networks. Multiple interface servers may be integral with the products incorporating the programmable parts so that many products may be updated concurrently.