Patents by Inventor Christopher W. Blaufus

Christopher W. Blaufus has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7301623
    Abstract: A chuck that clamps a substrate to the top surface using, e.g., a vacuum, electrostatic force, or other appropriate means, includes a plurality of lift pins that can raise the substrate off the top surface of the chuck. The chuck may be used with a metrology device that measures the substrate using a first type of measurement, e.g., film thickness measurement, while the substrate is held flat, and measures the substrate using a second type of measurement, e.g., radius of curvature measurement, while the substrate is supported on the lift pins. The thickness and radius of curvature measurements may then be used to determine the stress on the substrate. The lift pins may include an aperture through which a vacuum is applied through the top surface of the lift pins to the bottom of the substrate to securely hold the substrate while moving.
    Type: Grant
    Filed: December 16, 2003
    Date of Patent: November 27, 2007
    Assignee: Nanometrics Incorporated
    Inventors: Jonathan M. Madsen, Jiangtao Hu, Christopher W. Blaufus
  • Patent number: 7173417
    Abstract: A metrology instrument includes an eddy current sensor that is mounted to and concentric with a confocal distance sensor. By measuring the precise vertical placement of the eddy current probe with respect to the surface of the sample using the confocal distance sensor, the accuracy and precision of the eddy current measurement is improved. Because the confocal distance sensor and the eddy current sensor are confocal, there is no need to move the relative lateral positions between the sample and instrument, between the distance measurement and the eddy current measurement, thereby reducing error in the measurement as well are maximizing the throughput by minimizing the required stage travel for a single measurement.
    Type: Grant
    Filed: March 28, 2003
    Date of Patent: February 6, 2007
    Assignee: Nanometrics Incorporated
    Inventors: Jaime Poris, Claudio L. Rampoldi, Pablo I. Rovira, Christopher W. Blaufus
  • Patent number: 7032287
    Abstract: An actuated edge grip chuck includes tabs with raised portions that press against the side of a substrate as opposed clamping on the top or bottom surfaces. The edge grip chuck includes a solid-state actuator to move a moveable tab into an open position. The solid-state actuator may be, e.g., a piezoelectric actuator or a shape memory alloy. The tab may be biased into the closed position such that when a substrate is held by the edge by the moveable tab and one or more fixed tabs. If desired, more than one moveable tab may be used.
    Type: Grant
    Filed: July 19, 2002
    Date of Patent: April 25, 2006
    Assignee: Nanometrics Incorporated
    Inventors: Blaine R. Spady, Christopher W. Blaufus, Douglas A. Page, Dan M. Colban
  • Patent number: 6910847
    Abstract: A polar coordinate stage that may be used in a chamber includes a rotating chuck that moves in a linear direction and has the motors that drive the motion of the chuck outside the chamber. The stage can include a linkage of arms to support and drive the linear motion of the chuck. The chuck is coupled to a horizontal rail such that rotational motion of a first arm is translated into precise linear motion of the chuck along the horizontal rail through a second arm. In addition, a system of pulleys within the arms translates rotational (or linear) motion through the arms and rotates the chuck. Vertical motion may be provided by an actuator between the second arm and the chuck or by a motor under the stage. Because of the compact nature of the stage, it can be easily placed within a chamber.
    Type: Grant
    Filed: July 19, 2002
    Date of Patent: June 28, 2005
    Assignee: Nanometrics Incorporated
    Inventors: Christopher W. Blaufus, Blaine R. Spady, John D. Heaton, Dan M. Colban