Patents by Inventor Chul Ho Ham
Chul Ho Ham has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7464807Abstract: A transfer device of a handler for testing semiconductor devices is provided in which a pitch between each of a plurality of picker heads may be adjusted without replacing a cam plate. The transfer device may include a base part, a plurality of picker heads movably mounted on the base part, and a cam plate movably mounted on the base part and having a plurality of inclined cam grooves formed therein. Each picker head is connected to a corresponding cam groove by a connection part extending therebetween, with an end of each connection part movably coupled to its respective cam groove. A driving unit reciprocates the cam plate so that, as the ends of the connection parts move within the cam grooves, a position of the picker heads may be varied.Type: GrantFiled: August 10, 2005Date of Patent: December 16, 2008Assignee: Mirae CorporationInventors: Chul Ho Ham, Woo Young Lim, Young Geun Park, Ho Keun Song
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Patent number: 7429868Abstract: A socket assembly for testing semiconductor devices includes a socket board electrically connected to an outside testing device, and a socket guide which covers the socket board. The socket guide has an open part to receive the semiconductor device and allows pins on the semiconductor device to couple with connection pins on the socket board. A spacer may be interposed between the socket board and the socket guide to maintain a predetermined distance between the semiconductor device and the socket board. In this manner, the balls or the leads of each semiconductor device may be pressed onto connection pins of the socket to a predetermined depth, even when the semiconductor devices have different thicknesses.Type: GrantFiled: August 4, 2005Date of Patent: September 30, 2008Assignee: Mirae CorporationInventors: Chan Ho Park, Chul Ho Ham, Young Geun Park, Ho Keun Song, Woo Young Lim, Jae Bong Seo
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Patent number: 7408338Abstract: A handler for testing semiconductor devices is disclosed which is capable of simplifying the process carried out in an exchanging station, namely, the process of loading/unloading semiconductor devices in/from test trays, and greatly increasing the number of simultaneously testable semiconductor devices.Type: GrantFiled: March 5, 2007Date of Patent: August 5, 2008Assignee: Mirae CorporationInventors: Chul Ho Ham, Ho Keun Song, Young Geun Park, Woo Young Lim, Jae Bong Seo
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Patent number: 7253653Abstract: A test tray for a handler for testing semiconductor devices is disclosed which is capable of reducing the costs and time taken for replacement of carrier modules, and achieving an enhancement in workability.Type: GrantFiled: September 27, 2005Date of Patent: August 7, 2007Assignee: Mirae CorporationInventors: Chul Ho Ham, Ho Keun Song, Young Geun Park, Jae Bong Seo
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Patent number: 7196508Abstract: A handler for testing semiconductor devices is disclosed which is capable of simplifying the process carried out in an exchanging station, namely, the process of loading/unloading semiconductor devices in/from test trays, and greatly increasing the number of simultaneously testable semiconductor devices.Type: GrantFiled: August 4, 2005Date of Patent: March 27, 2007Assignee: Mirae CorporationInventors: Chul Ho Ham, Ho Keun Song, Young Geun Park, Woo Young Lim, Jae Bong Seo
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Patent number: 7135703Abstract: A carrier module for a semiconductor device handler, in which grooves for flow of cooling fluid are formed in a seating surface of the carrier module for the semiconductor device. The grooves improve cooling efficiency by forcing the cooling fluid sprayed from a test temperature deviation compensating system onto the carrier module to spread throughout substantially an entire surface of the semiconductor device, and to remain in the carrier module for a period of time before being discharged.Type: GrantFiled: February 14, 2003Date of Patent: November 14, 2006Assignee: Mirae CorporationInventors: Chul Ho Ham, Chan Ho Park, Woo Young Lim, Jae Bong Seo
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Publication number: 20060214655Abstract: A handler for testing semiconductor devices is disclosed which is capable of simplifying the process carried out in an exchanging station, namely, the process of loading/unloading semiconductor devices in/from test trays, and greatly increasing the number of simultaneously testable semiconductor devices.Type: ApplicationFiled: August 4, 2005Publication date: September 28, 2006Inventors: Chul Ho Ham, Ho Keun Song, Young Geun Park, Woo Young Lim, Jae Bong Seo
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Patent number: 7061101Abstract: Carrier module including a carrier module body for seating a semiconductor device on an underside thereof, having a pass through hole from an upper part to the underside the semiconductor device is seated thereon, a housing over the carrier module body, a supplementary housing fitted in a lower part of the housing to be movable in up/down directions, for elastic contact with the carrier module body by a first elastic member fitted inside of the housing, a vacuum tube in the supplementary housing so as to be in communication with the pass through hole in the carrier module body, at least one pair of latches in a lower part of the carrier module body to move apart or close in an outer or inner side, for holding or releasing the semiconductor device seated on the carrier module body, a latch button fitted in an upper part of the carrier module body so as to be movable in up/down directions, and coupled to the latch with a connection pin for moving in up/down directions by an external force, to making the latch tType: GrantFiled: March 11, 2004Date of Patent: June 13, 2006Assignee: Mirae CorporationInventors: Chul Ho Ham, Byoung Dae Lee, Ho Keun Song, Young Geun Park
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Patent number: 7008804Abstract: Methods for compensating for a test temperature deviation in a semiconductor device handler are provided, in which a test temperature deviation of a semiconductor device caused by heat produced by the semiconductor device itself during testing of the semiconductor device at a preset temperature is compensated for. This allows a test of the semiconductor device to be carried out at an exact temperature.Type: GrantFiled: February 14, 2003Date of Patent: March 7, 2006Assignee: Mirae CorporationInventors: Jae Myeong Song, Chul Ho Ham, Chan Ho Park, Byeng Gi Lee
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Patent number: 6873169Abstract: Carrier module for a semiconductor device test handler including a carrier module body, a device seating part in an underside part of the carrier module body, at least one pair of first latches at opposite sides of the device seating part arranged opposite to, and movable away from, or close to, each other, for holding, or releasing opposite side parts of the semiconductor device seated on the device seating part, at least one pair of second latches rotatably fitted on opposite sides of the first latch, for holding an underside part of the semiconductor device seated on the device seating part, and releasing the semiconductor device interlocked with a releasing action of the first latch, a latch button fitted in an upper part of the carrier module to move in up/down directions and coupled to one end of the first latch, for moving up and down to make the first latch to move, and a first elastic member, and a second elastic member for elastic supporting of the first latch, and the second latch, thereby securelyType: GrantFiled: March 11, 2004Date of Patent: March 29, 2005Assignee: Mirae CorporationInventors: Chul Ho Ham, Byoung Dae Lee, Ho Keun Song, Young Geun Park
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Patent number: 6861861Abstract: A semiconductor device handler is provided, in which a test temperature deviation of a semiconductor device caused by heat produced by the semiconductor device itself during testing is compensated for, allowing a test of the semiconductor device to be carried out at an exact temperature, or within an exact temperature range.Type: GrantFiled: February 14, 2003Date of Patent: March 1, 2005Assignee: LG Electronics Inc.Inventors: Jae Myeong Song, Chul Ho Ham, Chan Ho Park, Eui Sung Hwang, Woo Young Lim, Jae Bong Seo, Eung Yong Lee, Byeng Gi Lee
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Publication number: 20040016993Abstract: A carrier module for a semiconductor device handler, in which grooves for flow of cooling fluid are formed in a seating surface of the carrier module for the semiconductor device. The grooves improve cooling efficiency by forcing the cooling fluid sprayed from a test temperature deviation compensating system onto the carrier module to spread throughout substantially an entire surface of the semiconductor device, and to remain in the carrier module for a period of time before being discharged.Type: ApplicationFiled: February 14, 2003Publication date: January 29, 2004Applicant: Mirae CorporationInventors: Chul Ho Ham, Chan Ho Park, Woo Young Lim, Jae Bong Seo
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Publication number: 20040017185Abstract: A semiconductor device handler is provided, in which a test temperature deviation of a semiconductor device caused by heat produced by the semiconductor device itself during testing is compensated for, allowing a test of the semiconductor device to be carried out at an exact temperature, or within an exact temperature range.Type: ApplicationFiled: February 14, 2003Publication date: January 29, 2004Applicant: Mirae CorporationInventors: Jae Myeong Song, Chul Ho Ham, Chan Ho Park, Eui Sung Hwang, Woo Young Lim, Jae Bong Seo, Eung Yong Lee, Byeng Gi Lee
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Publication number: 20040019452Abstract: Methods for compensating for a test temperature deviation in a semiconductor device handler are provided, in which a test temperature deviation of a semiconductor device caused by heat produced by the semiconductor device itself during testing of the semiconductor device at a preset temperature is compensated for. This allows a test of the semiconductor device to be carried out at an exact temperature.Type: ApplicationFiled: February 14, 2003Publication date: January 29, 2004Applicant: Mirae CorporationInventors: Jae Myeong Song, Chul Ho Ham, Chan Ho Park, Byeng Gi Lee