Abstract: An electrostatic discharge protection circuit is provided. The electrostatic discharge protection circuit includes first, second, and third transistors and a discharge circuit. The first transistor has a first gate, a first drain coupled to the bonding pad, and a first source coupled to a first node. The second transistor has a second gate coupled to a power terminal, a second drain coupled to the first gate, and a second source coupled to a ground. The third transistor has a third gate coupled to the power terminal, a third drain coupled to the first node, and a third source coupled to the ground. The discharge circuit is controlled by a driving voltage at the first node. In response to an electrostatic discharge event occurring on the bonding pad, the discharge circuit provides a discharge path between the bonding pad and the ground according to the driving voltage.

Abstract: A smart wearable device has a signal calibration function executed by a signal calibration method and applied to a finger, a limb and/or a neck of a user. The smart wearable device includes at least one physiological signal detector, at least one pressure detector and an operation processor. The at least one physiological signal detector is adapted to abut against a detection area of the user for detecting a physiological signal. The at least one pressure detector is disposed around the at least one physiological signal detector and adapted to detect a pressure value of the detection area. The operation processor is electrically connected with the at least one physiological signal detector and the at least one pressure detector. The operation processor is adapted to optimize the physiological signal when the pressure value exceeds a predefined pressure threshold.

Abstract: An optical element driving mechanism is provided and includes a fixed assembly, a movable assembly, a driving assembly and a stopping assembly. The fixed assembly has a main axis. The movable assembly is configured to connect an optical element, and the movable assembly is movable relative to the fixed assembly. The driving assembly is configured to drive the movable assembly to move relative to the fixed assembly. The stopping assembly is configured to limit the movement of the movable assembly relative to the fixed assembly within a range of motion.

Abstract: The present invention is related to a novel positive electrode active material for lithium-ion battery. The positive electrode active material is expressed by the following formula: Li1.2NixMn0.8-x-yZnyO2, wherein x and y satisfy 0<x?0.8 and 0<y?0.1. In addition, the present invention provides a method of manufacturing the positive electrode active material. The present invention further provides a lithium-ion battery which uses said positive electrode active material.

Abstract: A voltage tracking circuit is provided. The voltage tracking circuit includes first and second P-type transistors and a control circuit. The drain of the first P-type transistor is coupled to a first voltage terminal. The gate and the drain of the second P-type transistor are respectively coupled to the first voltage terminal and a second voltage terminal. The control circuit is coupled to the first and second voltage terminals and generates a control voltage according to the first voltage and the second voltage. The sources of the first and second P-type transistors are coupled to an output terminal of the voltage tracking circuit, and the output voltage is generated at the output terminal. In response to the second voltage being higher than the first voltage, the control circuit generates the control signal to turn off the first P-type transistor.

Abstract: A semiconductor device and method of fabricating the same include a substrate, a first epitaxial layer, a first protection layer, and a contact etching stop layer. The substrate includes a PMOS transistor region, and the first epitaxial layer is disposed on the substrate, within the PMOS transistor region. The first protection layer is disposed on the first epitaxial layer, covering surfaces of the first epitaxial layer. The contact etching stop layer is disposed on the first protection layer and the substrate, wherein a portion of the first protection layer is exposed from the contact etching stop layer.

Abstract: A thermal abnormality detection system includes: a first heat dissipation system having a first temperature sensor for measuring an actual temperature of the first heat dissipation system; a second heat dissipation system having a second temperature sensor for measuring an actual temperature of the second heat dissipation system. Assuming that a difference between the actual temperature of the first heat dissipation system and an upper limit temperature of the first heat dissipation system is d1, and a difference between the actual temperature of the second heat dissipation system and an upper limit temperature of the second heat dissipation system is d2, when a value of d1?d2 is greater than an error threshold value Error1_level, the first heat dissipation system is determined to be abnormal, and when the value of d1?d2 is less than an error threshold value Error2_level, the second heat dissipation system is determined to be abnormal.

Abstract: A method for determining failure of a power element for use in an electronic device is provided. The electronic device includes a power element and a detection circuit. The method includes the steps of: obtaining a temperature-calculation model of the power element, and obtaining a parameterized temperature-calculation model of a power-element parameter and a parameterized temperature of the power element; detecting load information and the power-element parameter by the detection circuit; calculating a modeled temperature of the power element according to the load information and the temperature-calculation model, and calculating the parameterized temperature of the power element according to the power-element parameter and the parameterized temperature-calculation model; determining whether an error between the modeled temperature and the parameterized temperature exceeds a permitted range; and determining that the power element has failed in response to the error exceeding the permitted range.

Abstract: A method for determining failure of a power element for use in an electronic device is provided. The electronic device includes a power element and a detection circuit. The method includes the steps of: obtaining a temperature-calculation model of the power element, and obtaining a parameterized temperature-calculation model of a power-element parameter and a parameterized temperature of the power element; detecting load information and the power-element parameter by the detection circuit; calculating a modeled temperature of the power element according to the load information and the temperature-calculation model, and calculating the parameterized temperature of the power element according to the power-element parameter and the parameterized temperature-calculation model; determining whether an error between the modeled temperature and the parameterized temperature exceeds a permitted range; and determining that the power element has failed in response to the error exceeding the permitted range.

Abstract: A thermal abnormality detection system includes: a first heat dissipation system having a first temperature sensor for measuring an actual temperature of the first heat dissipation system; a second heat dissipation system having a second temperature sensor for measuring an actual temperature of the second heat dissipation system. Assuming that a difference between the actual temperature of the first heat dissipation system and an upper limit temperature of the first heat dissipation system is d1, and a difference between the actual temperature of the second heat dissipation system and an upper limit temperature of the second heat dissipation system is d2, when a value of d1?d2 is greater than an error threshold value Error1_level, the first heat dissipation system is determined to be abnormal, and when the value of d1?d2 is less than an error threshold value Error2_level, the second heat dissipation system is determined to be abnormal.

Abstract: A method and device for flexible, dynamic and optimal buffering in a networking system are provided. Sizes of incoming packets are recognized and the packets are buffered into buffers of appropriate sizes. Usage times of buffers are counted, and during an idle state of the networking system, buffer number and descriptor number are re-calculated based on usage times. Then, buffers and descriptors are re-allocated based on the re-calculated number. By re-allocation, buffer sets with higher usage times are allocated with more buffers, and vice versa, so memory waste is lowered and the overall performance of the networking system is improved.

Abstract: A method and system for accessing audiovisual data in a computer, which has a hard disk, a hard disk controller and a device driver. The hard disk is divided into a partition region and a non-partition region. The partition region has an audiovisual table to record a location of the audiovisual data stored in the non-partition region. The non-partition region is emulated as an emulated compact disk drive. When the device driver determines to access the emulated compact disk drive, it performs a converting procedure to convert an access instruction to the compact disk drive into an access instruction to the non-partition region, and sets a command register of the hard disk controller in accordance with the instruction converted and the audiovisual table, thereby accessing the non-partition region.

Abstract: A method and device for flexible, dynamic and optimal buffering in a networking system are provided. Sizes of incoming packets are recognized and the packets are buffered into buffers of appropriate sizes. Usage times of buffers are counted, and during an idle state of the networking system, buffer number and descriptor number are re-calculated based on usage times. Then, buffers and descriptors are re-allocated based on the re-calculated number. By re-allocation, buffer sets with higher usage times are allocated with more buffers, and vice versa, so memory waste is lowered and the overall performance of the networking system is improved.

Abstract: A method and system for accessing audiovisual data in a computer, which has a hard disk, a hard disk controller and a device driver. The hard disk is divided into a partition region and a non-partition region. The partition region has an audiovisual table to record a location of the audiovisual data stored in the non-partition region. The non-partition region is emulated as an emulated compact disk drive. When the device driver determines to access the emulated compact disk drive, it performs a converting procedure to convert an access instruction to the compact disk drive into an access instruction to the non-partition region, and sets a command register of the hard disk controller in accordance with the instruction converted and the audiovisual table, thereby accessing the non-partition region.