Abstract: An array of active devices and a method for testing an array of active devices are provided. The array comprises a substrate, a plurality of scan lines, a plurality of data lines, a plurality of pixel units and a plurality of test pads. The substrate comprises a display area and a peripheral area. The scan lines and the data lines are positioned on the substrate, and enclose a plurality of pixel areas and dummy pixel areas in the display area and the peripheral area, respectively. The pixel units are positioned in the pixel areas and are connected to the scan lines and the data lines, respectively. Finally, The test pads are positioned close to the scan lines and/or the data lines, and positioned on the substrate and in the peripheral area. Each of the test pads is connected to the corresponding data line or the corresponding scan line.