Patents by Inventor Chun-Shun Tseng

Chun-Shun Tseng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11892854
    Abstract: The assistance system for correcting vessel path comprises a receiver, a memory, at least one sensor, a processor and a display. The processor connects to the receiver, the memory and the at least one sensor, and the display is coupled to the processor. The assistance system based on the processor is able to be utilizing the preset machine-readable grid in determining the distance parameters of obstacles above water, and in which these distance parameters are corrected by using the sensor measurement data acquired by the at least one sensor. Thereby the assistance system could finish the distance measurements of abovementioned obstacles without using Lidar, and even in the case of high-undulating water surface.
    Type: Grant
    Filed: August 18, 2021
    Date of Patent: February 6, 2024
    Assignee: SHIP AND OCEAN INDUSTRIES R&DCENTER
    Inventors: Chun-Shun Tseng, I-Hsiang Chen, Yi-Pin Kuo
  • Publication number: 20220179431
    Abstract: The assistance system for correcting vessel path comprises a receiver, a memory, at least one sensor, a processor and a display. The processor connects to the receiver, the memory and the at least one sensor, and the display is coupled to the processor. The assistance system based on the processor is able to be utilizing the preset machine-readable grid in determining the distance parameters of obstacles above water, and in which these distance parameters are corrected by using the sensor measurement data acquired by the at least one sensor. Thereby the assistance system could finish the distance measurements of abovementioned obstacles without using Lidar, and even in the case of high-undulating water surface.
    Type: Application
    Filed: August 18, 2021
    Publication date: June 9, 2022
    Inventors: Chun-Shun Tseng, I-Hsiang Chen, Yi-Pin Kuo
  • Patent number: 8983205
    Abstract: Disclosed herein is a method for auto-depicting trends in object contours (referred to as ADTOC). At the heart of ADTOC is a sifting process to determine a significant angular value via evaluating a plurality of angular values in a predefined range. ADTOC is characterized in that a probe-ahead concept is applied to obtain a reference angular value along the current route, and then the probed angular value is used to modify the significant angular value in order to timely correct the subsequent trace direction, thus achieving more accurate trace result. Contours with discontinuous segments caused by noise, obstacles, illumination, shading variations, etc. can also be auto-depicted without requiring a predefined auxiliary route.
    Type: Grant
    Filed: August 23, 2013
    Date of Patent: March 17, 2015
    Assignees: IEI Integration Corp., Armorlink SH Corp.
    Inventors: Chun-Shun Tseng, Jung-Hua Wang, Shan-Chun Tsai, Chiao-Wei Lin, Chang-Te Lin, Yi-Hua Wang
  • Publication number: 20140233846
    Abstract: Disclosed herein is a method for auto-depicting trends in object contours (referred to as ADTOC). At the heart of ADTOC is a sifting process to determine a significant angular value via evaluating a plurality of angular values in a predefined range. ADTOC is characterized in that a probe-ahead concept is applied to obtain a reference angular value along the current route, and then the probed angular value is used to modify the significant angular value in order to timely correct the subsequent trace direction, thus achieving more accurate trace result. Contours with discontinuous segments caused by noise, obstacles, illumination, shading variations, etc. can also be auto-depicted without requiring a predefined auxiliary route.
    Type: Application
    Filed: August 23, 2013
    Publication date: August 21, 2014
    Applicants: Armorlink SH Corp., IEI Integration Corp.
    Inventors: Chun-Shun Tseng, Jung-Hua Wang, Shan-Chun Tsai, Chiao-Wei Lin, Chang-Te Lin, Yi-Hua Wang
  • Patent number: 8469274
    Abstract: A method for fast locating a decipherable pattern in an input image, which is characterized in utilizing an overly downscaled binary image to not only reduce computation time but also facilitate extraction of skeletons for fast and accurately locating pattern, is disclosed. First, a pre-process is applied to an input image to acquire a binary image downscaled n times, from which at least one skeleton corresponding to a decipherable pattern is extracted. Coordinate values of at least one pixel of each skeleton are respectively enlarged n1/2 times and used as the central points on the original image plane for establishing a plurality of detecting blocks with the identical size. Subsequently, a grading mechanism is employed to determine the corresponding detecting blocks of the decipherable pattern.
    Type: Grant
    Filed: October 23, 2009
    Date of Patent: June 25, 2013
    Assignees: Armorlink SH Corp., ICP Electronics, Inc.
    Inventors: Chun-Shun Tseng, Ya-Yun Jheng, Ming-Chi Jhuang, Shih-Hsun Chen, Hai-Peng Cheng, Te-Heng Hsiang, Jung-Hua Wang
  • Publication number: 20100163632
    Abstract: A method for fast locating a decipherable pattern in an input image, which is characterized in utilizing an overly downscaled binary image to not only reduce computation time but also facilitate extraction of skeletons for fast and accurately locating pattern, is disclosed. First, a pre-process is applied to an input image to acquire a binary image downscaled n times, from which at least one skeleton corresponding to a decipherable pattern is extracted. Coordinate values of at least one pixel of each skeleton are respectively enlarged n1/2 times and used as the central points on the original image plane for establishing a plurality of detecting blocks with the identical size. Subsequently, a grading mechanism is employed to determine the corresponding detecting blocks of the decipherable pattern.
    Type: Application
    Filed: October 23, 2009
    Publication date: July 1, 2010
    Inventors: Chun-Shun Tseng, Ya-Yun Jheng, Ming-Chi Jhuang, Shih-Hsun Chen, Hai-Peng Cheng, Te-Heng Hsiang, Jung-Hua Wang