Abstract: In an embodiment, a device includes: an integrated circuit die; an encapsulant at least partially encapsulating the integrated circuit die; a conductive via extending through the encapsulant; a redistribution structure on the encapsulant, the redistribution structure including: a metallization pattern electrically coupled to the conductive via and the integrated circuit die; a dielectric layer on the metallization pattern, the dielectric layer having a first thickness of 10 ?m to 30 ?m; and a first under-bump metallurgy (UBM) having a first via portion extending through the dielectric layer and a first bump portion on the dielectric layer, the first UBM being physically and electrically coupled to the metallization pattern, the first via portion having a first width, a ratio of the first thickness to the first width being from 1.33 to 1.66.

Abstract: In an embodiment, a device includes: a first integrated circuit die having a first contact region and a first non-contact region; an encapsulant contacting sides of the first integrated circuit die; a dielectric layer contacting the encapsulant and the first integrated circuit die, the dielectric layer having a first portion over the first contact region, a second portion over the first non-contact region, and a third portion over a portion of the encapsulant; and a metallization pattern including: a first conductive via extending through the first portion of the dielectric layer to contact the first integrated circuit die; and a conductive line extending along the second portion and third portion of the dielectric layer, the conductive line having a straight portion along the second portion of the dielectric layer and a first meandering portion along the third portion of the dielectric layer.

Abstract: The present disclosure relates to a method for treating a cancer and/or cancer metastasis in a subject comprising administering to the subject irinotecan loaded in a mesoporous silica nanoparticle. The present disclosure also provides a conjugate comprising an agent loaded in a mesoporous silica nanoparticle (MSN) defining at least one pore and having at least one functional group on a sidewall of the at least one pore.

Abstract: A package structure and a method of forming the same are provided. The package structure includes a first die, a second die, a first encapsulant, and a buffer layer. The first die and the second die are disposed side by side. The first encapsulant encapsulates the first die and the second die. The second die includes a die stack encapsulated by a second encapsulant encapsulating a die stack. The buffer layer is disposed between the first encapsulant and the second encapsulant and covers at least a sidewall of the second die and disposed between the first encapsulant and the second encapsulant. The buffer layer has a Young's modulus less than a Young's modulus of the first encapsulant and a Young's modulus of the second encapsulant.

Abstract: A method of forming a semiconductor device includes arranging a semi-finished substrate, which has been tested and is known to be good, on a carrier substrate. Encapsulating the semi-finished substrate in a first encapsulant and arranging at least one semiconductor die over the semi-finished substrate. Electrically coupling at least one semiconductor component of the at least one semiconductor die to the semi-finished substrate and encasing the at least one semiconductor die and portions of the first encapsulant in a second encapsulant. Removing the carrier substrate from the semi-finished substrate and bonding a plurality of external contacts to the semi-finished substrate.

Abstract: The present disclosure provides a hybrid memory system and a method of operating the same. The hybrid memory system includes a non-volatile memory, a volatile memory and a controller. The volatile memory stores data. The controller is configured to move the data from the volatile memory to the non-volatile memory in response to a command to enter a power-saving mode. The controller precludes the volatile memory from having a self-refresh operation performed thereon after the movement of the data.

Abstract: The present disclosure provides a dynamic random access memory (DRAM), and a method of operating the same. The DRAM includes a memory row and a buffer. The memory row is configured to store a data, wherein the memory row does not provide the data to the buffer in response to a request to read the data. The buffer is configured to store the data as a temporarily-stored data, wherein the buffer provides the temporarily-stored data in response to the request.

Abstract: A dynamic random access memory (DRAM) includes a memory array and a control device. The memory array includes a refresh unit. The refresh unit includes a first cell and a second cell. The first cell is configured to store data, and have a programmed voltage level by being programmed. The second cell is configured to have a test voltage level by being programmed in conjunction with the first cell, wherein the first cell and the second cell are controllable by a same row of the memory array. The control device is configured to increase a voltage difference between the programmed voltage level and a standard voltage level for determining binary logic when the test voltage level becomes lower than a threshold voltage level, wherein the threshold voltage level is higher than the standard voltage level.

Abstract: Present disclosure includes a system for preserving data in a volatile memory and a method thereof. The volatile memory comprises a plurality of refreshing units, and each of the refreshing units comprises a plurality of word lines for storing data. The system comprises an accessing unit. The accessing unit is configured to detect a row-hammer indication indicating a first word line is frequently accessed, wherein the accessing unit is configured to copy data stored in the first word line to a second word line when the row-hammer indication is detected on the first word line, wherein the data stored in the first and the second word lines are available to be selectively accessed.

Abstract: The present disclosure provides a dynamic random-access memory (DRAM) with a data correction function and a method of operating the same. The DRAM includes a memory array; a control circuit configured to receive a reading address and a defect information of the reading address; an access circuit configured to generate a reading data from the memory array according to the reading address from the control circuit; and a modifying circuit connected to the access circuit and the control circuit, wherein the modifying circuit is configured to modify a part of the reading data according to the defect information.

Abstract: The present disclosure provides a dynamic random-access memory (DRAM) with a data correction function and a method of operating the same. The DRAM includes a memory array; a control circuit configured to receive an inputting data and a temperature signal; a first error-correction code (ECC1) circuit configured to generate a first encoded data from the inputting data; and a second error-correction code (ECC2) circuit configured to generate a second encoded data from the inputting data.

Abstract: The present disclosure provides a hybrid memory system and a method of operating the same. The hybrid memory system includes a non-volatile memory, a volatile memory and a controller. The volatile memory stores data. The controller is configured to move the data from the volatile memory to the non-volatile memory in response to a command to enter a power-saving mode. The controller precludes the volatile memory from having a self-refresh operation performed thereon after the movement of the data.

Abstract: The present disclosure provides a dynamic random access memory (DRAM) including a memory array and a control device. The memory array includes a refresh unit. The refresh unit includes a first cell and a second cell. The first cell is configured to store data. The second cell is configured to have a stored electrical energy by being programmed with the first cell, wherein the first cell and the second cell are controllable by a same row of the memory array. The control device is configured to increase a refresh rate of the refresh unit to a first refresh rate when the stored electrical energy of the second cell becomes lower than a threshold electrical energy, wherein the threshold electrical energy is higher than a standard electrical energy for determining binary logic.

Abstract: A dynamic random access memory (DRAM) includes a memory array and a control device. The memory array includes a refresh unit. The refresh unit includes a first cell and a second cell. The first cell is configured to store data, and have a programmed voltage level by being programmed. The second cell is configured to have a test voltage level by being programmed in conjunction with the first cell, wherein the first cell and the second cell are controllable by a same row of the memory array. The control device is configured to increase a voltage difference between the programmed voltage level and a standard voltage level for determining binary logic when the test voltage level becomes lower than a threshold voltage level, wherein the threshold voltage level is higher than the standard voltage level.

Abstract: The present disclosure provides a dynamic random access memory (DRAM), and a method of operating the same. The DRAM includes a memory row and a buffer. The memory row is configured to store a data, wherein the memory row does not provide the data to the buffer in response to a request to read the data. The buffer is configured to store the data as a temporarily-stored data, wherein the buffer provides the temporarily-stored data in response to the request.

Abstract: The present disclosure provides a dynamic random access memory (DRAM) including a memory array and a control device. The memory array includes a refresh unit. The refresh unit includes a first cell and a second cell. The first cell is configured to store data. The second cell is configured to have a stored electrical energy by being programmed with the first cell, wherein the first cell and the second cell are controllable by a same row of the memory array. The control device is configured to increase a refresh rate of the refresh unit to a first refresh rate when the stored electrical energy of the second cell becomes lower than a threshold electrical energy, wherein the threshold electrical energy is higher than a standard electrical energy for determining binary logic.

Abstract: An operating method of a memory device includes the following operations: during a refresh operation with the first refresh rate, generating a first ECC according to first data, and generating a second ECC according to second data; determining whether an error exists in the first data or not during the refresh operation with a second refresh rate; determining whether the error exists in the second data or not during the refresh operation with a third refresh rate; and if it is determined that the error exists in the first data and/or the second data, correcting the first data and/or the second data. The second refresh rate and the third refresh rate are lower than the first refresh rate, and the third refresh rate is lower than the second refresh rate. The correcting ability of the second ECC is higher than the correcting ability of the first ECC.

Abstract: An operating method of a memory device includes the following operations: during a refresh operation with the first refresh rate, generating a first ECC according to first data, and generating a second ECC according to second data; determining whether an error exists in the first data or not during the refresh operation with a second refresh rate; determining whether the error exists in the second data or not during the refresh operation with a third refresh rate; and if it is determined that the error exists in the first data and/or the second data, correcting the first data and/or the second data. The second refresh rate and the third refresh rate are lower than the first refresh rate, and the third refresh rate is lower than the second refresh rate. The correcting ability of the second ECC is higher than the correcting ability of the first ECC.

Abstract: A dynamic random access memory (DRAM) DRAM includes a memory array, a temperature sensor and a control device. The temperature sensor is configured to sense a temperature of the DRAM. The control device is configured to adjust a sense frequency based on a retention ability of the memory array, and to activate the temperature sensor according to the adjusted sense frequency.

Abstract: A memory device includes a memory array, an error correction code (ECC) circuit, and a control circuit. The memory array includes plural memory rows and stores a plurality of data. The control circuit is configured to enter the memory device into a power saving mode with a first refresh rate to refresh the memory array, to control the ECC circuit to generate a first ECC according to first data during refreshing the memory array by the first refresh rate, to reduce the first refresh rate to a second refresh rate, to control the ECC circuit to determine whether an error exists in the first data during refreshing the memory array by the second refresh rate. If the error exists in the first data, the control circuit is further configured to control the ECC circuit to correct the first data.