Patents by Inventor Chung-sik Ham

Chung-sik Ham has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Panel-testing apparatus
    Patent number: 5426862
    Abstract: A panel testing apparatus for measuring the curvature of an inner surface, the thickness of an edge portion, and the thickness of a center portion of the panel comprises a lifting device for accepting and transporting the panel to a testing position, and a panel supporting device for maintaining the panel in a predetermined position during testing. The apparatus comprises a panel inner curvature measuring device, edge thickness measuring device, and a center thickness measuring device, each of which using one or more linear variable differential transformers for the purpose of providing panel measurement data.
    Type: Grant
    Filed: April 29, 1994
    Date of Patent: June 27, 1995
    Assignee: Samsung Corning Co., Ltd.
    Inventors: Chung-sik Ham, Jong-duk Kim, Ho-sung Lee