Abstract: A probe includes an insertion tube and a plurality of light emitters disposed on the distal end of the insertion tube. The probe further includes at least one intensity modulating element through which light from the plurality of light emitters is passed to project a plurality of fringe sets onto a surface. Each of the plurality of fringe sets intern have a structured-light pattern that is projected when one emitter group of at least one of the plurality of light emitters is emitting. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is also presented.

Abstract: A probe is presented that includes a light source, a coherent fiber bundle, and a pattern selector. The pattern selector is disposed between the light source and the proximal end of the coherent fiber bundle. The pattern selector includes at least one patterned zone through which light from the light source passes to project at least one fringe set onto a surface. Each of the at least one fringe sets has a structured-light pattern. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is presented.

Abstract: A system for determining an object distance z includes a plurality of light emitters. A group of at least one of the plurality of light emitters includes an emitter group, and the pattern projected when one emitter group is emitting includes a fringe set. The light pattern of one fringe set exhibits a phase-shift relative to the light patterns of the other fringe sets, and the phase-shift varies as the distance from the origin of the plurality of fringe sets varies. The system further includes a processing unit that is configured to compute a ripple metric value associated with each of a plurality of possible z values. The processing unit is further configured to determine an approximated z value using the computed ripple metric values. A probe system is also provided. The probe system is configured to project a plurality of fringe sets from the probe onto an object.

Abstract: A method for embedding frames of image data in a streaming video is disclosed, comprising the steps of receiving a plurality of frames of image data of a target object over a period of time; compressing the plurality of frames of image data; embedding the plurality of compressed frames of image data in a streaming video; initiating a control signal during the period of time to embed a particular frame of image data; selecting a frame of image data from the plurality of frames of image data received near the time the control signal is initiated; embedding a user data marker in the streaming video; and embedding the selected frame of image data in the streaming video as user data, wherein the embedded selected frame of image data has a higher quality than the embedded plurality of compressed frames of image data.

Abstract: An analog voltage isolation circuit includes an error amplifier-integrator having an error-output voltage, which is compared to a selected value referenced to the same ground potential as the input signal being measured. The comparator output varies the current flowing through the series-connected light-emitting diodes of first and second opto-isolators. The output of the first opto-isolator, with respect to the input ground potential, generates a first current fedback to the error amplifier-integrator, to establish both the frequency and duty-cycle of a rectangular-wave signal periodically varying proportional to the magnitude of the input voltage.

Abstract: An analog voltage isolation circuit includes an error amplifier-integrator having an error-output voltage, which is compared to a selected value referenced to the same ground potential as the input signal being measured. The comparator output varies the current flowing through the series-connected light-emitting diodes of first and second opto-isolators. The output of the first opto-isolator, with respect to the input ground potential, generates a first current fedback to the error amplifier-integrator, to establish both the frequency and duty-cycle of a rectangular-wave signal periodically varying proportional to the magnitude of the input voltage.