Patents by Inventor Claude Boccara

Claude Boccara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230032722
    Abstract: A full-field optical coherence tomography imaging method, FFOCT, using a system comprising an FFOCT device and a sample, the sample comprising a layer of interest to be imaged, the FFOCT device comprising an incoherent light source, an imager, a beam splitter defining a sample arm and a reference arm, the method comprising-generating sample light containing interest light originating from the layer of interest and reference light traveling from the reference arm, —acquiring an image from reference light and sample light combined in the beam splitter; wherein at least one of the sample arm and the reference arm comprises an optical curvature compensator that modifies a transverse variation distribution of an optical path length to match the transverse variation distributions of the optical path lengths travelled by the reference light and the interest light incident on the imager.
    Type: Application
    Filed: December 18, 2020
    Publication date: February 2, 2023
    Applicants: Paris Sciences et Lettres, Centre National de la Recherche Scientifique (CNRS), Ecole Superieure De Physique Et De Chimie Industrielles De La Ville De Paris
    Inventors: Viacheslav Mazlin, Pedro Francisco Baracal De Mece, Albert Claude Boccara
  • Patent number: 11543641
    Abstract: A system that includes an interference device including a reference arm on which a reflective surface is arranged, where the interference device produces, at each point of an imaging field when the sample is placed on a target arm of the interference device, interference between a reference wave and a target wave obtained by backscattering of incident light waves by means of a voxel of a slice of the sample at a given depth; an acquisition device suitable for acquiring, at a fixed path length difference between the target arm and the reference arm, a temporal series of N two-dimensional interferometric signals resulting from the interference produced at each point of the imaging field; and a processing unit that calculates an image representing temporal variations in intensity between said N two-dimensional interferometric signals.
    Type: Grant
    Filed: April 1, 2020
    Date of Patent: January 3, 2023
    Assignee: LLTECH MANAGEMENT
    Inventors: Albert Claude Boccara, Fabrice Harms
  • Patent number: 11499929
    Abstract: An infrared-detecting device, includes an infrared detector configured to emit a signal representative of the thermal radiation of a hotspot, and a light source configured to emit an incident beam, preferably in a window of UV or visible wavelength. The infrared-detecting device furthermore comprises a synchronizing device connected to the light source and to the infrared detector or to the processing module, and configured to emit a synchronization signal, the infrared detector being configured to be activated in a preset time window depending on said synchronization signal.
    Type: Grant
    Filed: December 21, 2017
    Date of Patent: November 15, 2022
    Assignee: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
    Inventors: Yannick De Wilde, Elodie Perros, Valentina Krachmalnicoff, Rémi Carminati, Albert-Claude Boccara
  • Patent number: 11408723
    Abstract: The present invention relates to a method for the non-invasive optical characterization of a heterogeneous medium, comprising: a step of illuminating, by means of a series of incident light waves, a given field of view of the heterogeneous medium, positioned in a focal plane of a microscope objective (30); a step of determining a first distortion matrix (Dur, Drr) in an observation basis defined between a conjugate plane of the focal plane (FP) and an observation plane, said first distortion matrix corresponding, in a correction basis defined between a conjugate plane of the focal plane and an aberration correction plane, to the term-by-term matrix product of a first reflection matrix (Rur) of the field of view, determined in the correction basis, with the phase conjugate matrix of a reference reflection matrix, defined for a model medium, in said correction basis; and a step of determining, from the first distortion matrix, at least one mapping of a physical parameter of the heterogeneous medium.
    Type: Grant
    Filed: July 16, 2019
    Date of Patent: August 9, 2022
    Assignees: Centre National de la Recherche Scientifique, ECOLE SUPÉRIEURE DE PHYSIQUE ET DE CHIMIE INDUSTRIELLES DE LA VILLE DE PARIS
    Inventors: Alexandre Aubry, Amaury Badon, Victor Barolle, Claude Boccara, Laura Cobus, Mathias Fink, William Lambert
  • Patent number: 11346819
    Abstract: In a first aspect, the present description relates to a system for non-invasively characterizing a heterogeneous medium using ultrasound, comprising at least one first array (10) of transducers configured to generate a series of incident ultrasound waves in a region of said heterogeneous medium and record the ultrasound waves which are backscattered by said region as a function of time, as well as a computing unit (42) which is coupled to said at least one first array of transducers and configured to: record an experimental reflection matrix defined between an emission basis at the input and the basis of the transducers at the output; determine, from said experimental reflection matrix, at least one first wideband reflection matrix defined in a focused base at the input and output; determine a first distortion matrix defined between said focused basis and an observation basis, said first distortion matrix resulting, directly or after a change of basis, from the term-by-term matrix product of said first wideba
    Type: Grant
    Filed: July 16, 2019
    Date of Patent: May 31, 2022
    Assignees: Centre National de la Recherche Scientifique, ECOLE SUPÉRIEURE DE PHYSIQUE ET DE CHIMIE INDUSTRIELLES DE LA VILLE DE PARIS
    Inventors: Alexandre Aubry, Amaury Badon, Victor Barolle, Claude Boccara, Laura Cobus, Mathias Fink, William Lambert
  • Publication number: 20220003721
    Abstract: In a first aspect, the present description relates to a system for non-invasively characterizing a heterogeneous medium using ultrasound, comprising at least one first array (10) of transducers configured to generate a series of incident ultrasound waves in a region of said heterogeneous medium and record the ultrasound waves which are backscattered by said region as a function of time, as well as a computing unit (42) which is coupled to said at least one first array of transducers and configured to: record an experimental reflection matrix defined between an emission basis at the input and the basis of the transducers at the output; determine, from said experimental reflection matrix, at least one first wideband reflection matrix defined in a focused base at the input and output; determine a first distortion matrix defined between said focused basis and an observation basis, said first distortion matrix resulting, directly or after a change of basis, from the term-by-term matrix product of said first wideba
    Type: Application
    Filed: July 16, 2019
    Publication date: January 6, 2022
    Applicants: Centre National de la Recherche Scientifique, ECOLE SUPÉRIEURE DE PHYSIQUE ET DE CHIMIE INDUSTRIELLES DE LA VILLE DE PARIS
    Inventors: Alexandre Aubry, Amaury Badon, Victor Barolle, Claude Boccara, Laura Cobus, Mathias Fink, William Lambert
  • Publication number: 20210345873
    Abstract: According to one aspect, the invention relates to a system (101) for in vivo, full-field interference microscopy imaging of a scattering three-dimensional sample.
    Type: Application
    Filed: September 27, 2019
    Publication date: November 11, 2021
    Applicants: PARIS SCIENCES ET LETTRES - QUARTIER LATIN, CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS), ECOLE SUPERIEURE DE PHYSIQUE ET DE CHIMIE INDUSTRIELLES DE LA VILLE DE PARIS
    Inventors: Viacheslav Mazlin, Peng Xiao, Mathias Fink, Albert Claude Boccara
  • Publication number: 20210310787
    Abstract: The present invention relates to a method for the non-invasive optical characterization of a heterogeneous medium, comprising: a step of illuminating, by means of a series of incident light waves, a given field of view of the heterogeneous medium, positioned in a focal plane of a microscope objective (30); a step of determining a first distortion matrix (Dur, Drr) in an observation basis defined between a conjugate plane of the focal plane (FP) and an observation plane, said first distortion matrix corresponding, in a correction basis defined between a conjugate plane of the focal plane and an aberration correction plane, to the term-by-term matrix product of a first reflection matrix (Rur) of the field of view, determined in the correction basis, with the phase conjugate matrix of a reference reflection matrix, defined for a model medium, in said correction basis; and a step of determining, from the first distortion matrix, at least one mapping of a physical parameter of the heterogeneous medium.
    Type: Application
    Filed: July 16, 2019
    Publication date: October 7, 2021
    Applicants: Centre National de la Recherche Scientifique, ECOLE SUPÉRIEURE DE PHYSIQUE ET DE CHIMIE INDUSTRIELLES DE LA VILLE DE PARIS
    Inventors: Alexandre Aubry, Amaury Badon, Victor Barolle, Claude Boccara, Laura Cobus, Mathias Fink, William Lambert
  • Publication number: 20210302341
    Abstract: An infrared-detecting device, includes an infrared detector configured to emit a signal representative of the thermal radiation of a hotspot, and a light source configured to emit an incident beam, preferably in a window of UV or visible wavelength. The infrared-detecting device furthermore comprises a synchronizing device connected to the light source and to the infrared detector or to the processing module, and configured to emit a synchronization signal, the infrared detector being configured to be activated in a preset time window depending on said synchronization signal.
    Type: Application
    Filed: December 21, 2017
    Publication date: September 30, 2021
    Inventors: Yannick DE WILDE, Elodie PERROS, Valentina KRACHMALNICOFF, Rémi CARMINATI, Albert-Claude BOCCARA
  • Patent number: 10743767
    Abstract: A system for the full-field interferential imaging of a sample, includes an illumination path with a light source, an interferometer with at least one first objective, and a separating element for receiving incident light waves via an input face and for forming an object arm for receiving the sample and a reference arm on which a reflection device is arranged, the reflection device being used to reflect incident light waves in a direction different from the direction of incidence. The separator element has a reflection coefficient and a transmission coefficient that are non-equal such that the proportion of the optical power of the incident light waves sent to the object arm is strictly larger than the proportion of the optical power of the light waves sent to the reference arm.
    Type: Grant
    Filed: July 25, 2017
    Date of Patent: August 18, 2020
    Assignee: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
    Inventors: Egidijus Auksorius, Albert Claude Boccara
  • Publication number: 20200233198
    Abstract: A system that includes an interference device including a reference arm on which a reflective surface is arranged, where the interference device produces, at each point of an imaging field when the sample is placed on a target arm of the interference device, interference between a reference wave and a target wave obtained by backscattering of incident light waves by means of a voxel of a slice of the sample at a given depth; an acquisition device suitable for acquiring, at a fixed path length difference between the target arm and the reference arm, a temporal series of N two-dimensional interferometric signals resulting from the interference produced at each point of the imaging field; and a processing unit that calculates an image representing temporal variations in intensity between said N two-dimensional interferometric signals.
    Type: Application
    Filed: April 1, 2020
    Publication date: July 23, 2020
    Applicant: LLTECH MANAGEMENT
    Inventors: Albert Claude Boccara, Fabrice Harms
  • Patent number: 10627613
    Abstract: The invention relates to a system (20) for full-field interference microscopy imaging of a three-dimensional diffusing sample (206).
    Type: Grant
    Filed: April 8, 2016
    Date of Patent: April 21, 2020
    Assignee: LLTECH MANAGEMENT
    Inventors: Albert Claude Boccara, Fabrice Harms
  • Publication number: 20190167109
    Abstract: A system for the full-field interferential imaging of a sample, includes an illumination path with a light source, an interferometer with at least one first objective, and a separating element for receiving incident light waves via an input face and for forming an object arm for receiving the sample and a reference arm on which a reflection device is arranged, the reflection device being used to reflect incident light waves in a direction different from the direction of incidence. The separator element has a reflection coefficient and a transmission coefficient that are non-equal such that the proportion of the optical power of the incident light waves sent to the object arm is strictly larger than the proportion of the optical power of the light waves sent to the reference arm.
    Type: Application
    Filed: July 25, 2017
    Publication date: June 6, 2019
    Inventors: Egidijus AUKSORIUS, Albert Claude BOCCARA
  • Patent number: 10222319
    Abstract: A device for optically detecting in transmission nanoparticles moving in a fluid sample includes a light source for emitting a spatially incoherent beam for illuminating the sample; an imaging optical system; and a two-dimensional optical detector. The imaging optical system includes a microscope objective. The two-dimensional optical detector includes a detection plane conjugated with an object focal plane of the microscope objective by said imaging optical system. The two-dimensional optical detector allows a sequence of images of an analysis volume of the sample to be acquired, each image resulting from optical interferences between the illuminating beam incident on the sample and the beams scattered by each of the nanoparticles present in the analysis volume during a preset duration shorter than one millisecond.
    Type: Grant
    Filed: September 29, 2015
    Date of Patent: March 5, 2019
    Assignees: ECOLE SUPÉRIEURE DE PHYSIQUE ET DE CHIMIE INDUSTRIELLES DE LA VILLE DE PARIS, CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, UNIVERSITÉ DE PIERRE ET MARIE CURIE, ECOLE NORMALE SUPÉRIEURE, INSTITUT NATIONAL DE LA SANTÉ ET DE LA RECHERCHE MÉDICALE
    Inventors: Albert Claude Boccara, Martine Boccara
  • Publication number: 20180120550
    Abstract: The invention relates to a system (20) for full-field interference microscopy imaging of a three-dimensional diffusing sample (206).
    Type: Application
    Filed: April 8, 2016
    Publication date: May 3, 2018
    Applicant: LLTECH MANAGEMENT
    Inventors: Albert Claude Boccara, Fabrice Harms
  • Publication number: 20170307509
    Abstract: A device for optically detecting in transmission nanoparticles moving in a fluid sample includes a light source for emitting a spatially incoherent beam for illuminating the sample; an imaging optical system; and a two-dimensional optical detector. The imaging optical system includes a microscope objective. The two-dimensional optical detector includes a detection plane conjugated with an object focal plane of the microscope objective by said imaging optical system. The two-dimensional optical detector allows a sequence of images of an analysis volume of the sample to be acquired, each image resulting from optical interferences between the illuminating beam incident on the sample and the beams scattered by each of the nanoparticles present in the analysis volume during a preset duration shorter than one millisecond.
    Type: Application
    Filed: September 29, 2015
    Publication date: October 26, 2017
    Applicant: ECOLE SUPÉRIEURE DE PHYSIQUE ET DE CHIMIE INDUSTRIELLES DE LA VILLE DE PARIS-ESPCI PARISTECH
    Inventors: Albert Claude Boccara, Martine Boccara
  • Patent number: 9255785
    Abstract: A device for three-dimensional imaging by full-field interferential microscopy of a volumic and scattering sample includes an imaging interferometer of variable magnification, allowing for the acquisition of at least one first and one second interferometric images resulting from the interference of a reference wave obtained by reflection of the incident wave on a reference mirror and an object wave obtained by backscattering of the incident wave by a slice of the sample at a given depth of the sample. The invention also relates to a processing unit that processes the interferometric images, a unit for axially displacing the interferometer relative to the sample for the acquisition of tomographic images for slices at different depths of the sample, and a unit for varying the magnification of the imaging interferometer for the acquisition of interferometric images of a slice for different magnification values.
    Type: Grant
    Filed: July 8, 2011
    Date of Patent: February 9, 2016
    Assignee: LLTECH MANAGEMENT
    Inventors: Albert Claude Boccara, Fabrice Harms, Bertrand Le Conte Chrestien De Poly
  • Patent number: 9185357
    Abstract: According to a first aspect, the invention relates to a multimodal optical sectioning microscope (200, 400, 600) for full-field imaging of a volumic and scattering sample comprising: —a full-field OCT system for providing an image of a first section in depth of the sample comprising an illumination sub-system (201, 401, 601) and a full-field imaging interferometer with a detection sub system (208, 408, 608) and an optical conjugation device for optically conjugating the sample and said detection sub system, wherein said optical conjugation device comprises a microscope objective (203, 403, 603), —a supplementary full-field optical sectioning imaging system for providing a fluorescent image of a second section in depth of said sample comprising a structured illumination microscope with an illumination sub system (623), means (421, 422) for generating at the focal plane of said microscope objective of said full-field imaging interferometer a variable spatial pattern illumination and a detection sub system (624)
    Type: Grant
    Filed: September 19, 2011
    Date of Patent: November 10, 2015
    Assignee: LLTECH MANAGEMENT
    Inventors: Albert Claude Boccara, Fabrice Harms, Bertrand Le Conte Chrestien De Poly
  • Patent number: 9025150
    Abstract: The invention relates to an incoherent light full field interference microscopy device for the imaging of a volumetric scattering sample (106). The device comprises an interference device (100) between a reference wave (401), produced by reflection of an incident wave by a reflective surface (105) of a reference arm of the interference device, and an object wave (402) produced by backscattering of the incident wave by a slice of the sample, an acquisition device (108) for at least a first interference signal and at least a second interference signal resulting from the interference of the reference and object waves, the at least two interference signals having a phase difference, an processing unit (403) for calculating an image of the slice of the sample, based on said interference signals.
    Type: Grant
    Filed: May 17, 2011
    Date of Patent: May 5, 2015
    Assignee: LLTech Management
    Inventors: Albert Claude Boccara, Fabrice Harms, Bertrand Le Conte Chrestien de Poly
  • Publication number: 20130182096
    Abstract: According to a first aspect, the invention relates to a multimodal optical sectioning microscope (200, 400, 600) for full-field imaging of a volumic and scattering sample comprising:—a full-field OCT system for providing an image of a first section in depth of the sample comprising an illumination sub-system (201, 401, 601) and a full-field imaging interferometer with a detection sub system (208, 408, 608) and an optical conjugation device for optically conjugating the sample and said detection sub system, wherein said optical conjugation device comprises a microscope objective (203, 403, 603),—a supplementary full-field optical sectioning imaging system for providing a fluorescent image of a second section in depth of said sample comprising a structured illumination microscope with an illumination sub system (623), means (421, 422) for generating at the focal plane of said microscope objective of said full-field imaging interferometer a variable spatial pattern illumination and a detection sub system (624),
    Type: Application
    Filed: September 19, 2011
    Publication date: July 18, 2013
    Applicant: LLTECH MANAGEMENT
    Inventors: Albert Claude Boccara, Fabrice Harms, Bertrand Le Conte Chrestien De Poly