Abstract: An apparatus for processing material with focused electromagnetic radiation, comprises: a source emitting electromagnetic radiation, means for directing the radiation onto the material, means for focusing the radiation on or in the material, a unit for generating a pattern in the optical path of the electromagnetic radiation, an at least partially reflective surface in the optical path before the focus of the focused radiation, said pattern being imaged onto said at least partially reflective surface through at least part of said directing means and said focusing means, at least one detector onto which an image of the pattern is reflected by said surface and which generates electrical signals corresponding to said image, said image containing information on the position of the focus, a computer receiving said electrical signals and programmed to process said image so as to generate an electrical signal depending on the focal position, and a divergence adjustment element arranged in said optical path and adapt

Abstract: Device for measuring wave fronts generated by a lens (4) for an eye, with a radiation source (14) for emitting test radiation (12) to be directed at the lens (4) and a sensor device (26) for detecting wave fronts of incident test radiation after interaction with the lens, wherein the sensor device scans the test radiation (20) after interaction with the lens (4) at a scanning frequency which is at least equal in size to the frequency at which changes in wave fronts occur in the test radiation (20) after interaction with the lens (4).

Abstract: Device for measuring wave fronts generated by a lens (4) for an eye, with a radiation source (14) for emitting test radiation (12) to be directed at the lens (4) and a sensor device (26) for detecting wave fronts of incident test radiation after interaction with the lens, wherein the sensor device scans the test radiation (20) after interaction with the lens (4) at a scanning frequency which is at least equal in size to the frequency at which changes in wave fronts occur in the test radiation (20) after interaction with the lens (4).

Abstract: An apparatus for processing material with focused electromagnetic radiation, comprises: a source emitting electromagnetic radiation, means for directing the radiation onto the material, means for focusing the radiation on or in the material, a unit for generating a pattern in the optical path of the electromagnetic radiation, an at least partially reflective surface in the optical path before the focus of the focused radiation, said pattern being imaged onto said at least partially reflective surface through at least part of said directing means and said focusing means, at least one detector onto which an image of the pattern is reflected by said surface and which generates electrical signals corresponding to said image, said image containing information on the position of the focus, a computer receiving said electrical signals and programmed to process said image so as to generate an electrical signal depending on the focal position, and a divergence adjustment element arranged in said optical path and adapt

Abstract: A process is proposed for testing a laser device that has been set up to emit pulsed focused laser radiation, the focal position of which is adjustable both in and across the direction of propagation of the laser radiation. The laser device includes a contact element that is transparent to the laser radiation, with an abutment surface for abutment of an object to be machined. Within the scope of the process, a test object that is transparent to the laser radiation at least in a machining region is applied onto the abutment surface of the contact element. Then laser radiation is beamed into the test object bearing against the abutment surface and in the process the focal position is moved in accordance with a predetermined test pattern, in order to generate enduring machining structures in the test object.

Abstract: A process for producing an interface unit and also a group of such interface units are specified. The interface unit exhibits a first reference surface for beaming in radiation, a second reference surface for emitting the radiation, and an axis extending in the direction from the first to the second reference surface. The production process comprises the steps of setting an optical path length of the interface unit between the first and second reference surfaces along the axis and the fixing of the set optical path length of the interface unit. The optical path length of the interface unit is set in such a way that radiation of a defined numerical aperture beamed in at the first reference surface exhibits a focus location that is predetermined with respect to the second reference surface in the direction of the axis. A precise and uniform focus location with respect to the second reference surface is obtained.

Abstract: The present invention relates to an apparatus 10 for ophthalmological laser surgery, with an optical imaging system for imaging a treatment laser beam 14 onto a focal point, with a temperature-measuring device for measuring a temperature assigned to the imaging system, and with an electronic control arrangement (22) connected to the temperature-measuring device, which is configured to control the focal-point setting in a manner depending on the measured temperature. The present invention further relates also to an associated method.

Abstract: An apparatus for ophthalmic laser surgery comprises a source (28) for a pulsed femtosecond laser beam, a telescope (32) expanding the laser beam, a scanner (36) downstream of the telescope, for deflecting the laser beam in a plane perpendicular to the beam path, and also an f-theta objective (44) downstream of the scanner, for focusing the laser beam. In accordance with the invention, an entrance lens (52) of the telescope (32) takes the form of a controllable lens of variable refractive power. The entrance lens (52) is preferentially constituted by an electrically controllable liquid lens or liquid-crystal lens.

Abstract: Device for measuring wave fronts generated by a lens (4) for an eye, with a radiation source (14) for emitting test radiation (12) to be directed at the lens (4) and a sensor device (26) for detecting wave fronts of incident test radiation after interaction with the lens, wherein the sensor device scans the test radiation (20) after interaction with the lens (4) at a scanning frequency which is at least equal in size to the frequency at which changes in wave fronts occur in the test radiation (20) after interaction with the lens (4).