Patents by Inventor Claus-Jurgen Lorenzen

Claus-Jurgen Lorenzen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5702550
    Abstract: To determine the carbon black distribution two measurements of spectral intensities of separately produced plasmas are carried out with different time delays relative to a particular laser pulse, the time delay for the second measurement for determining the spectral line intensities of a reference element carbon (I.sub.C') and at least one analysis element (I.sub.A.n') being smaller than for the first measurement; for determining the spectral line intensities of the reference element (I.sub.C) and the other analysis elements (I.sub.A.n).Evaluation of the measurements is performed by reference to calibration information based on reference measurements, which information shows the magnitude of the concentration ratio of the other analysis elements or the at least one analysis element to the reference element (c.sub.A.n /c.sub.C or c.sub.A.n /c.sub.R) as a function of the appurtenant intensity ratio values.
    Type: Grant
    Filed: March 21, 1996
    Date of Patent: December 30, 1997
    Assignee: Pirelli Coordinamento Pneumatici S.p.A.
    Inventors: Christoph Carlhoff, Martin Jogwich, Claus-Jurgen Lorenzen, Marco Nahmias
  • Patent number: 5537207
    Abstract: To determine the carbon black distribution two measurements of spectral intensities of separately produced plasmas are carried out with different time delays relative to a particular laser pulse, the time delay for the second measurement for determining the spectral line intensities of a reference element carbon (I.sub.C,) and at least one analysis element (I.sub.A.n,) being smaller than for the first measurement; for determining the spectral line intensities of the reference element (I.sub.C) and the other analysis elements (I.sub.A.n).Evaluation of the measurements is performed by reference to calibration information based on reference measurements, which information shows the magnitude of the concentration ratio of the other analysis elements or the at least one analysis element to the reference element (c.sub.A.n /c.sub.C or c.sub.A.n /c.sub.R) as a function of the appurtenant intensity ratio values.
    Type: Grant
    Filed: August 11, 1994
    Date of Patent: July 16, 1996
    Assignees: Fried. Krupp AG Hoesch-Krupp, Pirelli Coordinamento Phenumatici S.p.A.
    Inventors: Christoph Carlhoff, Martin Jogwich, Claus-Jurgen Lorenzen, Marco Nahmias
  • Patent number: 4995723
    Abstract: A method of analyzing elements of a metal melt contained in a melting vessel comprises the following steps: introducing an inert gas at a temperature in excess of 300.degree. C. laterally into a tube passing through a lateral wall of the melting vessel and opening thereinto; generating a laser beam; passing the laser beam through an adjustable first lens system; reflecting the laser beam by a mirror into the tube; guiding the laser beam through a quartz window which closes the tube; generating a plasma in the tube by focusing the laser beam by the adjustable first lens system onto the surface of the metal melt in the tube; guiding the light generated by the plasma through the quartz window to an adjustable second lens system; coupling the light by the adjustable second lens system with an optical waveguide; and introducing the light by the optical waveguide into a spectrometer.
    Type: Grant
    Filed: September 29, 1989
    Date of Patent: February 26, 1991
    Assignee: Fried. Krupp Gesellschaft Mit Beschrankter Haftung
    Inventors: Christoph Carlhoff, Claus-Jurgen Lorenzen, Klaus-Peter Nick
  • Patent number: 4993834
    Abstract: A polychromator in a Paschen-Runge mounting in which intensity measurements are made by means of a row of photodiodes. The spectral intensity distribution of at least two spectral regions on the Rowland circle is transmitted to the row of photodiodes by image conductors and is measured there.
    Type: Grant
    Filed: September 25, 1989
    Date of Patent: February 19, 1991
    Assignee: Fried. Krupp GmbH
    Inventors: Christoph Carlhoff, Claus-Jurgen Lorenzen, Klaus-Peter Nick