Abstract: A test mode control circuit for reconfiguring a device pin of an integrated circuit chip which is initially configured in a test mode includes an input register for applying trim/configuring data to one or more components on an integrated circuit chip; a device pin; an output register for receiving output data from an integrated circuit on an integrated circuit chip which integrated circuit has had one or more of its elements trimmed/reconfigured; an I/O logic circuit for controlling the device pin to operate as a test pin to selectively deliver the trim/configuring data to the input register and receive output data form the output register; a programmable ray including a plurality of logic state elements for permanently mapping a selected set of the trim/configuring data from the input register, the programmable array including a test bit; and a switching system for applying the trim/configuring data to the one or more components on the integrated circuit when the test bit is in a first, test mode and for ap

Abstract: A test mode control circuit for reconfiguring a device pin of an integrated circuit chip which is initially configured in a test mode includes an input register for applying trim/configuring data to one or more components on an integrated circuit chip; a device pin; an output register for receiving output data from an integrated circuit on an integrated circuit chip which integrated circuit has had one or more of its elements trimmed/reconfigured; an I/O logic circuit for controlling the device pin to operate as a test pin to selectively deliver the trim/configuring data to the input register and receive output data form the output register; a programmable ray including a plurality of logic state elements for permanently mapping a selected set of the trim/configuring data from the input register, the programmable array including a test bit; and a switching system for applying the trim/configuring data to the one or more components on the integrated circuit when the test bit is in a first, test mode and for ap

Abstract: An improved successive approximation analogue-to-digital converter system including a D/A converter and a comparison capability, wherein a first trial value is stored in a successive approximation register and a comparison is made of relative amplitude of D/A converter output with respect to analogue signal amplitude, and an iterative process is performed in which a subsequent trial value is stored in the successive approximation register before the comparison is repeated. The improvement comprises conducting only one comparison for each trial, with the subsequent trial value for a plurality of iterations being greater than one-half the first trial value, such that a first trial value determined in error is corrected during subsequent iterations. Apparatus implementing the improved successive approximation A/D is also described.

Abstract: A charge pump circuit for providing a bipolar output that substantially doubles the unipolar voltage input by utilizing a three-phase clock signal to charge a first capacitor in response to the first phase of the three-phase clock signal, then in response to either the second or third phase of the clock signal connect the first capacitor in series between the positive voltage input terminal and positive voltage output terminal to generate an output voltage which is positive in polarity and substantially double the voltage of the input source, then in response to the other of the second and third clock phases connect, between the input terminals, the first and second capacitors in series for providing a second polarity voltage across the second capacitor which is substantially double the source voltage and during either the following first or second clock pulse connect the second capacitor with its positive electrode connected to the negative input terminal and its negative electrode connected to the negative