Abstract: A method and apparatus for analyzing side-channel security vulnerabilities in a digital device. A first time sequence of measurements of side-channel related phenomena of the digital device, such as power draw or electromagnetic emissions is obtained. A second time sequence of debug outputs of the digital device, such as program counter contents or other device processor or register states, is obtained. The first time sequence and the second time sequence are obtained based on a common time reference, and thus correlated in time. A controller can provide a common timing signal to measurement equipment obtaining the first time sequence and to a debug tool obtaining the second time sequence, and the common time reference can be correspond to the common timing signal.

Abstract: A method and apparatus for analyzing side-channel security vulnerabilities in a digital device. A first time sequence of measurements of side-channel related phenomena of the digital device, such as power draw or electromagnetic emissions is obtained. A second time sequence of debug outputs of the digital device, such as program counter contents or other device processor or register states, is obtained. The first time sequence and the second time sequence are obtained based on a common time reference, and thus correlated in time. A controller can provide a common timing signal to measurement equipment obtaining the first time sequence and to a debug tool obtaining the second time sequence, and the common time reference can be correspond to the common timing signal.

Abstract: Methods and apparatus are provided for determining if an embedded system or integrated circuit is operating correctly, or if the device is faulty or counterfeit. Measurements of power consumption are used to determine the state of the device under test, these measurements being performed at multiple operating or environmental conditions to increase the ability of the apparatus to detect faulty and counterfeit devices.

Abstract: Methods and apparatus are provided for sampling an indicator of the internal state of an embedded system or integrated circuit, where the indicator is sampled in a manner synchronous to the internal clock of the embedded system or integrated circuit. The resulting samples can be used for determining secret data within the embedded system or integrated circuit, detecting failures, or detecting counterfeit devices.

Abstract: Methods and apparatus are provided for sampling an indicator of the internal state of an embedded system or integrated circuit, where the indicator is sampled in a manner synchronous to the internal clock of the embedded system or integrated circuit. The resulting samples can be used for determining secret data within the embedded system or integrated circuit, detecting failures, or detecting counterfeit devices.

Abstract: A PCB footprint consisting of a plurality of pads, positioned such that many different electronic components can be mounted which would otherwise require a custom circuit board. One or more of the leads can be connected via a low-impedance path to a ground plane, making a suitable platform for prototyping high-frequency designs.