Abstract: This disclosure relates generally to medical devices, systems, and methods for activation of a photoactive agent during a medical procedure. In an aspect, a catheter system for activation of a photoactive agent may comprise a catheter comprising an elongate shaft comprising a proximal portion, a distal portion, and a first lumen extending along the elongate shaft. A first flexible circuit may be disposed about the distal portion of the elongate shaft. A plurality of first light-emitting diodes (LEDs) may be disposed along the first flexible circuit. A second flexible circuit may be disposed about the distal portion of the elongate shaft. A plurality of second LEDs may be disposed along the second flexible circuit. A control unit may be coupled to the proximal end of the elongate shaft. The communications cable may be disposed within the catheter and may electrically couple the first LEDs with the control unit.

Abstract: Some aspects of the present disclosure pertain to spherical devices that comprise a wire having a memorized shape comprising a spherical outer wire layer and a spherical inner wire layer disposed within the spherical outer wire layer. Other aspects of the disclosure pertain to methods of forming such devices, mandrels for forming such devices, and methods of using such devices.

Abstract: An IC that includes a contiguous standard cell area with a 4x3 e-beam pad that is compatible with advanced manufacturing processes and an associated e-beam testable structure.

Abstract: A medical device that includes an outer body configured to visually mark a target tissue such that the target tissue is detectable by an imaging system. The medical device includes a sensor disposed within the outer body, wherein the sensor is configured to detect radiation at the target site.

Abstract: An IC that includes a contiguous standard cell area with a 4×3 e-beam pad that is compatible with advanced manufacturing processes and an associated e-beam testable structure.

Abstract: An IC that includes a contiguous standard cell area with a 4×3 e-beam pad that is compatible with advanced manufacturing processes and an associated e-beam testable structure.

Abstract: An IC that includes a contiguous standard cell area with a 4×3 e-beam pad that is compatible with advanced manufacturing processes and an associated e-beam testable structure.

Abstract: An IC that includes a contiguous standard cell area with a 4×3 e-beam pad that is compatible with advanced manufacturing processes and an associated e-beam testable structure.

Abstract: An IC that includes a contiguous standard cell area with a 4×3 e-beam pad that is compatible with advanced manufacturing processes and an associated e-beam testable structure.

Abstract: The present disclosure relates to the field of embolic coils. More specifically, the present disclosure relates to systems and methods for actively releasing an embolic coil from a delivery device into a body lumen of a patient. Delivery systems of the present disclosure may allow an embolic coil to be advanced external to the distal end of a delivery catheter without being automatically released, thereby allowing the embolic coil to be repositioned prior to deployment.

Abstract: A method for processing a semiconductor wafer uses non-contact electrical measurements indicative of at least one tip-to-side short or leakage, at least one corner short or leakage, and at least one via open or resistance, where such measurements are obtained from non-contact pads associated with respective tip-to-side short, corner short, and via open test areas.

Abstract: An IC includes a contiguous standard cell area with first, second, and third TS-GATE-short-configured test area geometries disposed therein. In some embodiments, the contiguous standard cell area may further include: fourth and fifth TS-GATE-short-configured test area geometries, and/or other test area geometries, such as tip-to-tip-short, tip-to-side-short, diagonal-short, corner-short, interlayer-overlap-short, via-chamfer-short, merged-via-short, snake-open, stitch-open, via-open, or metal-island-open.

Abstract: Occlusive plugs are provided which comprise a single elongate member that is insertable into and through a microcatheter and assumes a space-occupying shape when deployed into a vascular structure. The elongate member optionally includes one or more polymer fibers, one or more polymer sleeves to secure the polymer fibers to the elongate member, and/or a radiopaque marker band.

Abstract: Improved processes for manufacturing wafers, chips, or dies utilize in-line data obtained from non-contact electrical measurements (“NCEM”) of fill cells that contain structures configured target/expose a variety of open-circuit, short-circuit, leakage, or excessive resistance failure modes. Such processes may involve evaluating Designs of Experiments (“DOEs”), comprised of multiple NCEM-enabled fill cells, in at least two variants, all targeted to the same failure mode(s).

Abstract: A medical device may include a helical coil having a plurality of turns. The plurality of turns may define a lumen. The device may also include a composition. The composition may include gellan gum, at least one salt, water, and a treatment agent. The treatment agent may be disposed in the lumen.

Abstract: A method for processing a semiconductor wafer uses non-contact electrical measurements indicative of at least one tip-to-tip short or leakage, at least one via-chamfer short or leakage, and at least one corner short or leakage, where such measurements are obtained from cells with respective tip-to-tip short, via-chamfer short, and corner short test areas, using a charged particle-beam inspector with a moving stage and beam deflection to account for motion of the stage.

Abstract: An IC includes first and second designs of experiments (DOES), each comprised of at least two fill cells. The fill cells contain structures configured to obtain in-line data via non-contact electrical measurements (“NCEM”). The first DOE contains fill cells configured to enable non-contact (NC) detection of tip-to-side shorts, and the second DOE contains fill cells configured to enable NC detection of corner shorts.

Abstract: A medical system may include an elongate member having a proximal end and a distal end, the elongate member being movable between a collapsed configuration and an expanded configuration, and a first therapeutic agent configured to treat a condition of the lung.

Abstract: A method for processing a semiconductor wafer uses non-contact electrical measurements indicative of at least one tip-to-tip short or leakage, at least one tip-to-side short or leakage, and at least one side-to-side short or leakage, where such measurements are obtained from non-contact pads associated with respective tip-to-tip short, tip-to-side short, and side-to-side short test areas.

Abstract: A method for processing a semiconductor wafer uses non-contact electrical measurements indicative of at least one tip-to-tip short or leakage, at least one tip-to-side short or leakage, and at least one corner short or leakage, where such measurements are obtained from non-contact pads associated with respective tip-to-tip short, tip-to-side short, and corner short test areas.