Abstract: A block storing corrupt data is detected. Based on detecting the block storing corrupt data, threshold voltage (VT) distribution data corresponding to the block is accessed. The VT distribution data comprises one or more VT distribution measurements corresponding to the block. The VT distribution data corresponding to the block is compared with reference VT distribution data. The reference VT distribution data comprises one or more reference VT distributions. Based on a result of the comparison, it is determined whether to perform one or more heroic data recovery processes on the block.

Abstract: A block storing corrupt data is detected. Based on detecting the block storing corrupt data, threshold voltage (VT) distribution data corresponding to the block is accessed. The VT distribution data comprises one or more VT distribution measurements corresponding to the block. The VT distribution data corresponding to the block is compared with reference VT distribution data. The reference VT distribution data comprises one or more reference VT distributions. Based on a result of the comparison, it is determined whether to perform one or more heroic data recovery processes on the block.

Abstract: A block storing corrupt data is detected. Based on detecting the block storing corrupt data, threshold voltage (VT) distribution data corresponding to the block is accessed. The VT distribution data comprises one or more VT distribution measurements corresponding to the block. The VT distribution data corresponding to the block is compared with reference VT distribution data. The reference VT distribution data comprises one or more reference VT distributions. Based on a result of the comparison, it is determined whether to perform one or more heroic data recovery processes on the block.

Abstract: A system includes a memory device of multiple devices, and a processing device of the multiple devices, coupled with the memory device. The system identifies multiple device temperature values that are each indicative of a temperature at a respective device of the multiple devices of the system. The system determines that at least one device temperature value of the multiple device temperature values satisfies a respective thermal throttling threshold of multiple thermal throttling thresholds. The system performs a power reducing operation to reduce a power consumption of the system in accordance with a power reduction value based on the satisfaction of the respective thermal throttling threshold.

Abstract: Aspects of the present disclosure configure a system component, such as memory sub-system controller, to dynamically decode read data for zone-based memory allocations. The memory sub-system controller reads an entire memory block or zone. The memory sub-system controller decodes a first portion of the memory block or zone using a first decoding process. The memory sub-system controller determines that a second portion of the memory block or zone satisfies a criterion. In response, the memory sub-system controller applies a second decoding process to decode the second portion.

Abstract: A plurality of device temperature values that are each indicative of a temperature at a respective device of a plurality of devices of a system is identified. A respective composite temperature threshold ratio is determined for each device of the plurality of devices. A respective normalization value based on the respective composite temperature threshold ratio and the respective device temperature value is determined for each device of the plurality of devices. A largest normalization value of the plurality of devices is determined. A composite temperature of the system based on the largest normalization value of the plurality of devices is set.

Abstract: A system includes a memory device of multiple devices, and a processing device of the multiple devices, coupled with the memory device. The system identifies multiple device temperature values that are each indicative of a temperature at a respective device of the multiple devices of the system. The system determines that at least one device temperature value of the multiple device temperature values satisfies a respective thermal throttling threshold of multiple thermal throttling thresholds. The system performs a power reducing operation to reduce a power consumption of the system in accordance with a power reduction value based on the satisfaction of the respective thermal throttling threshold.

Abstract: Device temperature values that are each indicative of a temperature at a respective device of multiple devices of a system are identified. Whether at least one device temperature value of the of device temperature values satisfies a respective thermal throttling threshold of multiple thermal throttling thresholds is determined by comparing each of the device temperature values to a respective one of the multiple thermal throttling thresholds that each correspond to one of the plurality of devices. Responsive to determining that the at least one device temperatures value satisfies the respective thermal throttling threshold, a power reduction value that is indicative of an amount of power consumption of the system that is to be reduced is determined. A power reducing operation is performed to reduce the power consumption of the system in accordance with the power reduction value.

Abstract: Device temperature values that are each indicative of a temperature at a respective device of multiple devices of a system are identified. Whether at least one device temperature value of the of device temperature values satisfies a respective thermal throttling threshold of multiple thermal throttling thresholds is determined by comparing each of the device temperature values to a respective one of the multiple thermal throttling thresholds that each correspond to one of the plurality of devices. Responsive to determining that the at least one device temperatures value satisfies the respective thermal throttling threshold, a power reduction value that is indicative of an amount of power consumption of the system that is to be reduced is determined. A power reducing operation is performed to reduce the power consumption of the system in accordance with the power reduction value.

Abstract: A method and apparatus for compensating for repeatable runout using wide embedded runout correction fields is provided. In one embodiment, a disk surface is provided with a write head associated therewith. The disk surface has a data track having a width. An embedded runout correction (ERC) field is written onto the disk surface, wherein the ERC field has a width that is greater than the width of the data track.

Abstract: Detecting flaws in a disk drive includes sampling a read signal provided by reading a data pattern from a disk to obtain samples, obtaining significant samples from the samples, deriving a value from the significant samples, and reporting a flaw if a comparison between the derived value and a threshold value is unacceptable.

Abstract: A method and apparatus for detecting flaws requiring sparing of portions of storage media included as part of a hard disk drive are provided. A window of a selected portion of the storage medium is formed, and the density of defects detected within that window is calculated. If the density of defects exceeds a threshold amount, a signal is passed to the controller. The portion of the storage media containing the defects that caused the generation of the flag may then be spared. The present invention allows the potential for detected defects to significantly affect the ability of the storage medium to be assessed. Furthermore, the present invention does not require that the location of each defect be stored in memory. Accordingly, the present invention is economical to implement, and allows defects to be assessed in substantially real time and with improved accuracy.

Abstract: A hybrid capillary/mechanical two-phase thermal loop has a sensor connected in parallel with a number of evaporators to regulate the flowrate of a booster pump providing working fluid to the evaporator capillaries. This sensor is made of a coiled, conductive tube connected in parallel with the evaporators, with an inside diameter substantially greater than the inside diameters of the evaporator capillaries. A conductive wire extends within said tube, but is insulated from electrical contact with the tube. The working fluid contained within the tube acts as a dielectric between the tube and wire. The amount of liquid phase working fluid within the tube can be determined by measuring the electrical capacitance between the tube and wire. The flowrate of the booster pump is then regulated as a function of the measured capacitance to maintain a substantially constant amount of liquid phase working fluid within the sensor tube.