Abstract: A technique for reflectometry testing of a signal path is disclosed. The technique includes injecting a test signal based on a probe pseudo-noise sequence into the signal path and obtaining a response signal. A sliding reference pseudo-noise sequence is correlated against the response signal. Both the probe sequence and the reference sequence are generated at a chip rate. The correlation is obtained for integer chip time delays, and sub-chip resolution of a peak correlation delay is estimated from at least two samples of the correlation.

Abstract: A method of characterizing a signal path includes (i) generating a reference spread-spectrum signal; (ii) coupling the reference spread-spectrum signal into the signal path while the signal path is carrying an operational signal; (iii) receiving a reflected spread-spectrum signal from the signal path generated in response to the reference spread-spectrum signal; and (iv) correlating the reflected spread-spectrum signal with the reference spread-spectrum signal to produce a correlation result corresponding to a characteristic of the signal path.

Abstract: The invention includes an apparatus and method for testing an electronic signal path. The apparatus includes a signal generator (102) configured to inject a test signal into the electronic signal path at an injection point when coupled to the signal path. The apparatus further includes a detector (104) coupled to the signal generator and configured to receive a combined signal at the injection point when coupled to the electronic signal path and determine an autocorrelation of the combined signal. The apparatus further includes an analyzer coupled to the detector and configured to determine a characteristic of the electronic signal path from the autocorrelation. The method includes injecting (902) a test signal into the electronic signal path an injection point, receiving (904) a combined signal from the electronic signal path at the injection point, determining (906) an autocorrelation of the combined signal, and estimating (908) a characteristic of the electronic signal path from the autocorrelation.

Abstract: Non-contact reflectometry for testing a signal path is described. The technique includes using capacitive coupling to inject a test signal into the signal path and extract a response signal from the signal path. Reflectometry techniques are used to determine characteristics of the signal path from the response signal. The technique is compatible with performing testing of a signal path carrying an operational signal.

Abstract: A multicarrier spread spectrum (MC-SS) technique is disclosed which includes non-linearly modifying the sub-carriers in the receiver. A method (600) and receiver (200, 300) for processing an MC-SS signal, a transceiver for MC-SS communications (700), and an MC-SS radar (800) are describe.

Abstract: A method and apparatus for mapping a wire network is disclosed. The method includes obtaining a reflectometry test signal of the wire network. An estimated network impulse response is estimated from the reflectometry response. A wire network model is then initialized, and iteratively improved by simulating an impulse response of the wire network model and adjusting the wire network model to reduce differences between the simulated impulse response and estimated network impulse response.

Abstract: A system and method that utilizes direct sequence spread spectrum signal (DSSS) encoding to enable testing of a live wire, wherein an original data signal is modified and then transmitted along the wire, and a reflected signal is collected and analyzed using correlation techniques to determine characteristics of the live wire, including the location of a fault.

Abstract: The invention includes an apparatus and method for testing an electronic signal path. The apparatus includes a signal generator (102) configured to inject a test signal into the electronic signal path at an injection point when coupled to the signal path. The apparatus further includes a detector (104) coupled to the signal generator and configured to receive a combined signal at the injection point when coupled to the electronic signal path and determine an autocorrelation of the combined signal. The apparatus further includes an analyzer coupled to the detector and configured to determine a characteristic of the electronic signal path from the autocorrelation. The method includes injecting (902) a test signal into the electronic signal path an injection point, receiving (904) a combined signal from the electronic signal path at the injection point, determining (906) an autocorrelation of the combined signal, and estimating (908) a characteristic of the electronic signal path from the autocorrelation.

Abstract: A device and method for measuring the electrical properties of electronic signal paths, including wires and wireless channels. The device may be used for detecting open circuits, short circuits, and the lengths of wires.

Abstract: A technique for testing a signal path while an operational signal is present is disclosed. The technique may be performed without injecting a test signal into the signal path by using an operational signal already present in the signal path. A method of testing a signal path includes receiving an operational signal from the signal path and estimating a correlation of the operational signal. A system for testing a signal path includes an extractor configured to extract a sample of the operational signal when coupled to a signal path and a correlator configured to estimate a correlation of the operational signal. Various properties of the signal path may be determined using the technique.

Abstract: A method of characterizing a signal path comprising (i) generating 102 a reference spread-spectrum signal; (ii) coupling 104 the reference spread-spectrum signal into the signal path while the signal path is carrying an operational signal; (iii) receiving 106 a reflected spread-spectrum signal from the signal path generated in response to the reference spread-spectrum signal; and (iv) correlating 108 the reflected spread-spectrum signal with the reference spread-spectrum signal to produce a correlation result corresponding to a characteristic of the signal path.

Abstract: A system and method are disclosed for characterizing a signal path. The system includes a system clock configured to produce a system clock signal at a sample frequency. A frequency divider is configured to divide the sample frequency of the system clock signal by a factor of N to produce a chip clock signal at a chip frequency. The system further includes a pseudo-noise (PN) sequence generator configured to produce a PN sequence at the chip frequency and couple the PN sequence to the signal path while the signal path is carrying an operational signal. A sub-chip sampler is configured to correlate the PN sequence and a reflected PN sequence which has been reflected within the signal path to form a correlated signal and to sample the correlated signal at the sample frequency of the system clock signal.

Abstract: A system and method that utilizes direct sequence spread spectrum signal (DSSS) encoding to enable testing of a live wire, wherein an original data signal is modified and then transmitted along the wire, and a reflected signal is collected and analyzed using correlation techniques to determine characteristics of the live wire, including the location of a fault.

Abstract: A frequency domain reflectometer that is in electrical communication with a cable under test in order to determine cable characteristics including cable length and load characteristics such as capacitance, inductance, resistance, impedance (which is characterized as an open or short circuit condition), and the location of an open or short circuit, wherein the method of operation comprises the steps of generating an input signal, splitting the input signal to the cable under test and to a mixer, sending a reflected input signal to the mixer to thereby generate a mixed signal, removing high frequency components, digitizing a remaining component that contains information regarding impedance and length of the cable under test, performing the same steps for several different frequencies, and analyzing the plurality of digitized signals to thereby determine impedance and length of the cable under test.