Abstract: Disclosed is a probe assembly for use in electrical testing of a test object. The probe assembly has a probe supporter body elongated in a first direction. The probe supporter has a first side surface, a second side surface, a first facing surface and a second facing surface. The first and second facing surfaces are configured to face a test object, and substantially nonparallel to each other. The probe assembly has a plurality of first slots formed on the first side surface and the first facing surface and a plurality of second slots formed on the second side surface and the second facing surface. Each slot is configured to receive a portion of a probe.

Abstract: Disclosed is a probe assembly for use in electrical testing of a test object. The probe assembly has a probe supporter body elongated in a first direction. The probe supporter has a first side surface, a second side surface, a first facing surface and a second facing surface. The first and second facing surfaces are configured to face a test object, and substantially nonparallel to each other. The probe assembly has a plurality of first slots formed on the first side surface and the first facing surface and a plurality of second slots formed on the second side surface and the second facing surface. Each slot is configured to receive a portion of a probe.

Abstract: Disclosed is a probe assembly for use in electrical testing of a testing object and a method of the probe assembly. The probe assembly has a probe supporter body having a first side surface and a first facing surface and a plurality of wire probes. One of the plurality of wire probes has a first arm generally extending in a first direction, a second arm electrically and physically connected to the first arm and generally extending in a second direction other than the first direction, a first terminal portion formed at a distal end of the first arm and comprising a first tip, and a second terminal portion formed at a distal end of the second arm and comprising a second tip. The assembly further has a securing film placed over a portion of the second arm and keeping the portion of the second arm from moving.

Abstract: Disclosed is a probe assembly for use in electrical testing of an object, a probe, and a method of making the probe assembly. The probe assembly has a probe supporter body elongated in a first direction and comprising a first side surface, a second side surface, a first facing surface and a second facing surface, wherein the first and second facing surfaces are configured to face a testing object, wherein the first and second facing surfaces are substantially nonparallel to each other. The assembly further has a plurality of first slots formed on the first side surface and the first facing surface and a plurality of second slots formed on the second side surface and the second facing surface. Each slot is configured to receive a portion of a probe.

Abstract: A probe card for transmitting electric signals between a test head and an inspection object includes a printed circuit board provided with a plurality of electrode pads, a supporter attached to the printed circuit board and a plurality of probes attached to the support in a removable manner. The supporter includes a pair of banks, a channel formed between the banks and a plurality of insertion slots formed on a lower surface and opposite lateral surfaces of the supporter. Each of the probes includes a first arm portion fitted to each of the insertion slots on the opposite lateral surfaces of the supporter, a second arm portion extending from a first end of the first arm portion toward the channel, a connection terminal portion provided at a second end of the first arm portion and a contact terminal portion provided at a tip end of the second arm portion.