Abstract: A circuit comprises a first amplifier coupled to a first and a second node; a differential capacitive load coupled to the first and the second node, the differential capacitive load coupled between drains of transistors in a cross coupled transistor circuit; a current mirror coupled to a source of each transistor; and a capacitor coupled between the sources of the transistors. A plurality of amplifiers can be coupled to the differential capacitive load, wherein each amplifier comprises a clock-less pre-amplifier of a comparator.

Abstract: A circuit comprises a first amplifier coupled to a first and a second node; a differential capacitive load coupled to the first and the second node, the differential capacitive load coupled between drains of transistors in a cross coupled transistor circuit; a current mirror coupled to a source of each transistor; and a capacitor coupled between the sources of the transistors. A plurality of amplifiers can be coupled to the differential capacitive load, wherein each amplifier comprises a clock-less pre-amplifier of a comparator. The amplifiers may be abutted to one another such that an active transistor of a first differential stage in a first amplifier behaves as a dummy transistor for an adjacent differential stage in a second amplifier.

Abstract: A circuit comprises a first amplifier coupled to a first and a second node; a differential capacitive load coupled to the first and the second node, the differential capacitive load coupled between drains of transistors in a cross coupled transistor circuit; a current mirror coupled to a source of each transistor; and a capacitor coupled between the sources of the transistors. A plurality of amplifiers can be coupled to the differential capacitive load, wherein each amplifier comprises a clock-less pre-amplifier of a comparator.

Abstract: A negative-capacitance circuit comprises a first node coupled to a drain of a first transistor and a gate of a second transistor; a second node coupled to a drain of the second transistor and a gate of the first transistor; a capacitor coupled between a source of the first transistor and a source of the second transistor; a first current mirror coupled between a supply voltage and the source of the first transistor; and a second current mirror coupled between the supply voltage and the source of the second transistor. The circuit can be configured to drive the differential capacitive load between the first and second nodes in a shorter time period, thereby increasing the transfer bandwidth of the differential signal.

Abstract: A negative-capacitance circuit comprises a first node coupled to a drain of a first transistor and a gate of a second transistor; a second node coupled to a drain of the second transistor and a gate of the first transistor; a capacitor coupled between a source of the first transistor and a source of the second transistor; a first current mirror coupled between a supply voltage and the source of the first transistor; and a second current mirror coupled between the supply voltage and the source of the second transistor. The circuit can be configured to drive the differential capacitive load between the first and second nodes in a shorter time period, thereby increasing the transfer bandwidth of the differential signal.

Abstract: The differential output of a Programmable Gain Amplifier (PGA) is loaded by the input differential gate capacitance of a plurality of Analog to Digital convertors (ADC) comparators and the differential metal layer traces to interconnect these comparators to the PGA. The differential capacitive load presented to the PGA is quite large and reduces the bandwidth of this interconnect between the PGA and ADC. To overcome the performance degradation due to the differential capacitive load, an active negative-capacitor circuit cancels the effect of the large input capacitance of the ADC comparators. This cancelation extends the gain characteristics of the interconnect between the PGA's output and the inputs of the first stage of the comparators. The active negative-capacitance is comprised of a cross pair NMOS with a capacitor connecting their sources where each NMOS is biased by a current source.

Abstract: The differential output of a Programmable Gain Amplifier (PGA) is loaded by the input differential gate capacitance of a plurality of Analog to Digital converters (ADC) comparators and the differential metal layer traces to interconnect these comparators to the PGA. The differential capacitive load presented to the PGA is quite large and reduces the bandwidth of this interconnect between the PGA and ADC. To overcome the performance degradation due to the differential capacitive load, an active negative-capacitor circuit cancels the effect of the large input capacitance of the ADC comparators. This cancellation extends the gain characteristics of the interconnect between the PGA's output and the inputs of the first stage of the comparators. The active negative-capacitance is comprised of a cross pair NMOS with a capacitor connecting their sources where each NMOS is biased by a current source.

Abstract: The differential output of a Programmable Gain Amplifier (PGA) is loaded by the input differential gate capacitance of a plurality of Analog to Digital convertors (ADC) comparators and the differential metal layer traces to interconnect these comparators to the PGA. The differential capacitive load presented to the PGA is quite large and reduces the bandwidth of this interconnect between the PGA and ADC. To overcome the performance degradation due to the differential capacitive load, an active negative-capacitor circuit cancels the effect of the large input capacitance of the ADC comparators. This cancelation extends the gain characteristics of the interconnect between the PGA's output and the inputs of the first stage of the comparators. The active negative-capacitance is comprised of a cross pair NMOS with a capacitor connecting their sources where each NMOS is biased by a current source.

Abstract: One of the critical design parameters occurs when a digital signal is converted into an analog signal. As the supply voltage drops to less than 2 times of threshold voltage to reduce leakage and save power, generating a relative large swing with a resistor-ladder DAC becomes more difficult. For a 5 bit DAC, 32 sub-arrays are used to select the appropriate voltage from the series coupled resistor network. Each sub-array uses p-channel transistors where the sub-array extracting the lowest voltage 700 mV only has a 100 mV of gate to source voltage. To compensate for the reduced gate to source voltage, the sub-arrays are partitioned into four groups. In each group, the p-channel width is increased from 2 um to 5 um, as the tap voltage drops from 1.2 V to 0.7 V. This allows the p-channel transistor with a small gate to source voltage to have a larger width thereby improving performance.

Abstract: The core concept of this ADC is the high-speed fully-differential comparators which are clocked at 2.64 GHz and used in a 60 GHz transceiver. The comparator consists of a pre-amplifier stage, a capture stage, a regeneration cell and an output latch. The pre-amplifier stage is not clocked; therefore, the pre-amplifier stage does not suffer initialization and transient behavior effects when the clock signal switches state. The transient response of being enabled and disabled is eliminated. Instead, a capture stage transfers the contents of the pre-amplifier stage into a memory regeneration stage. The capture stage is clocked by pulses that are timed to minimize the clock kick-back generated by the memory regeneration stage. The clock kick-back is reduced even when many comparators are coupled to the PGA. The comparators, instead of having extra dummy fingers, are also aligned right next to each other to minimize the mismatching layout effect.

Abstract: The differential output of a Programmable Gain Amplifier (PGA) is loaded by the input differential gate capacitance of a plurality of Analog to Digital converters (ADC) comparators and the differential metal layer traces to interconnect these comparators to the PGA. The differential capacitive load presented to the PGA is quite large and reduces the bandwidth of this interconnect between the PGA and ADC. To overcome the performance degradation due to the differential capacitive load, an active negative-capacitor circuit cancels the effect of the large input capacitance of the ADC comparators. This cancellation extends the gain characteristics of the interconnect between the PGA's output and the inputs of the first stage of the comparators. The active negative-capacitance is comprised of a cross pair NMOS with a capacitor connecting their sources where each NMOS is biased by a current source.

Abstract: One of the critical design parameters occurs when a digital signal is converted into an analog signal. As the supply voltage drops to less than 2 times of threshold voltage to reduce leakage and save power, generating a relative large swing with a resistor-ladder DAC becomes more difficult. For a 5 bit DAC, 32 sub-arrays are used to select the appropriate voltage from the series coupled resistor network. Each sub-array uses p-channel transistors where the sub-array extracting the lowest voltage 700 mV only has a 100 mV of gate to source voltage. To compensate for the reduced gate to source voltage, the sub-arrays are partitioned into four groups. In each group, the p-channel width is increased from 2 um to 5 um, as the tap voltage drops from 1.2 V to 0.7 V. This allows the p-channel transistor with a small gate to source voltage to have a larger width thereby improving performance.