Patents by Inventor Dai Inagi

Dai Inagi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11971424
    Abstract: An automatic analyzer is provided which is easier to investigate when some troubles such as data abnormality occur in a sample analysis result as compared with an automatic analyzer according to the related art. The automatic analyzer includes: analysis units that perform analysis and quality control analysis for ensuring quality of the analysis; a storage medium that stores quality control results of the quality control analysis performed by the analysis units; a monitor that displays the quality control results; and a control PC that controls an operation of the analysis units (8, 9, and 16), executes, when an arbitrary result is selected from the quality control results stored in the storage medium, based on the selected quality control result, statistical calculation of the selected result and a quality control result performed in the past, and causes the monitor to display a statistical calculation screen as a statistical calculation result.
    Type: Grant
    Filed: March 20, 2019
    Date of Patent: April 30, 2024
    Assignees: HITACHI HIGH-TECH CORPORATION, ROCHE DIAGNOSTICS OPERATIONS, INC.
    Inventors: Yuichi Hirabayashi, Dai Inagi, Satoshi Yokotsuka, Youichi Aruga, Mohamed Abouelsoud
  • Publication number: 20230053059
    Abstract: A processing condition specifying method that includes Steps S31, S32, and S33. In Step S31, a prediction thickness information piece containing prediction values of thicknesses after processing on the substrate W is calculated for each of a plurality of recipe information pieces based on measurement thickness information containing measurement values of thicknesses of the substrate W. In Step S32, the prediction thickness information pieces each calculated for a corresponding one of the recipe information pieces are evaluated according to a prescribed evaluation method and a prediction thickness information piece is selected from among the prediction thickness information pieces. In Step S33, a recipe information piece corresponding to the selected prediction thickness information piece is specified. The measurement values contained in the measurement thickness information indicate a thickness of the substrate W measured before processing on the substrate W.
    Type: Application
    Filed: November 25, 2020
    Publication date: February 16, 2023
    Inventors: Dai INAGI, Tatsuya SHIMANO, Takashi OTA
  • Publication number: 20210025907
    Abstract: An automatic analyzer is provided which is easier to investigate when some troubles such as data abnormality occur in a sample analysis result as compared with an automatic analyzer according to the related art. The automatic analyzer includes: analysis units that perform analysis and quality control analysis for ensuring quality of the analysis; a storage medium that stores quality control results of the quality control analysis performed by the analysis units; a monitor that displays the quality control results; and a control PC that controls an operation of the analysis units (8, 9, and 16), executes, when an arbitrary result is selected from the quality control results stored in the storage medium, based on the selected quality control result, statistical calculation of the selected result and a quality control result performed in the past, and causes the monitor to display a statistical calculation screen as a statistical calculation result.
    Type: Application
    Filed: March 20, 2019
    Publication date: January 28, 2021
    Inventors: Yuichi HIRABAYASHI, Dai INAGI, Satoshi YOKOTSUKA, Youichi ARUGA, Mohamed ABOUELSOUD
  • Patent number: D849048
    Type: Grant
    Filed: November 29, 2017
    Date of Patent: May 21, 2019
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Misato Fukami, Masaki Takano, Junko Suzuki, Chikook Ha, Dai Inagi
  • Patent number: D882603
    Type: Grant
    Filed: November 29, 2017
    Date of Patent: April 28, 2020
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Misato Fukami, Masaki Takano, Junko Suzuki, Chikook Ha, Dai Inagi