Abstract: A signal-processing method adapted to perform predetermined signal processing based on a unit signal transmitted from a semiconductor device that includes at least two unit components arranged in a predetermined order, where each of the unit components includes a detection unit configured to detect change information responsive to a change in an incident physical quantity and a unit-signal-generation unit configured to generate the unit signal based on the change information, and that detects the distribution of the physical quantity is provided. The signal-processing method includes the steps of externally transmitting operation information that can specify an operation state of the semiconductor device from the semiconductor device and performing the predetermined signal processing based on the unit signal by referring to the operation information in a signal-processing unit provided outside the semiconductor device.

Abstract: An image sensor is disclosed, which includes: a pixel unit having a plurality of pixels each outputting incident light as a pixel signal; an amplifier amplifying the pixel signal output from the pixel unit; and a defective pixel detection circuit performing a defective pixel detection on signals output from the amplifier, wherein the defective pixel detection circuit adjusts the detection accuracy of the defective pixel detection in accordance with an exposure condition of the pixel unit.

Abstract: A signal-processing method adapted to perform predetermined signal processing based on a unit signal transmitted from a semiconductor device that includes at least two unit components arranged in a predetermined order, where each of the unit components includes a detection unit configured to detect change information responsive to a change in an incident physical quantity and a unit-signal-generation unit configured to generate the unit signal based on the change information, and that detects the distribution of the physical quantity is provided. The signal-processing method includes the steps of externally transmitting operation information that can specify an operation state of the semiconductor device from the semiconductor device and performing the predetermined signal processing based on the unit signal by referring to the operation information in a signal-processing unit provided outside the semiconductor device.

Abstract: An image sensor is disclosed, which includes: a pixel unit having a plurality of pixels each outputting incident light as a pixel signal; an amplifier amplifying the pixel signal output from the pixel unit; and a defective pixel detection circuit performing a defective pixel detection on signals output from the amplifier, wherein the defective pixel detection circuit adjusts the detection accuracy of the defective pixel detection in accordance with an exposure condition of the pixel unit.