Patents by Inventor Daisuke Hosoi

Daisuke Hosoi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12000507
    Abstract: A pipe extending from a first side toward a second side includes a side wall and a spool. The spool formed in the side wall is bent so as to protrude from an outer circumferential surface of the pipe, and extends to surround the outer circumferential surface. The spool includes a first portion located on the first side and a second portion located on the second side. There is a clearance between the first portion and the second portion in a top region of the spool, and the first portion and the second portion substantially abut each other in a base region.
    Type: Grant
    Filed: May 26, 2021
    Date of Patent: June 4, 2024
    Assignee: FUTABA INDUSTRIAL CO., LTD.
    Inventors: Daisuke Izumikawa, Mikuto Wakayama, Masahito Hosoi, Takashi Sumiya
  • Publication number: 20190184518
    Abstract: Abrasive grains according to the present invention are abrasive grains in which the surfaces thereof are coated with an additive and that are formed of inorganic abrasive particles having a positive zeta potential at pH 8 or lower. Also, it is preferable that the additive be picolinic acid or glutamic acid. It is preferable that the inorganic abrasive particles be cerium oxide particles. The present invention provides abrasive grains in which the surfaces thereof are coated with picolinic acid or glutamic acid and that are formed of cerium oxide particles having a positive zeta potential at pH 8 or lower, wherein the abrasive grains are manufactured by means of an abrasive grain manufacturing method including a step for performing wet grinding of cerium oxide in the presence of picolinic acid or glutamic acid.
    Type: Application
    Filed: June 26, 2017
    Publication date: June 20, 2019
    Inventors: Daisuke HOSOI, Shingo MACHIDA, Takashi SHIGETA
  • Publication number: 20130037515
    Abstract: Disclosed is a polishing slurry for sapphire polishing that is capable of obtaining polishing speeds and smooth surfaces during the polishing of sapphire substrates that are equivalent to or better than in prior polishing processes even if the number of polishers and polishing hours are reduced. Also disclosed is a sapphire substrate polishing method. The slurry includes alumina abrasives and has a pH adjusted to the range of 10.0 to 14.0, and the sapphire is polished by means of the CMP technique by applying said slurry. The aforementioned alumina abrasives more preferably include at least ?-alumina, and the content thereof is more preferably 0.01 to 50 wt %. The mean particle size of the aforementioned alumina abrasives is preferably 0.05 to 10 ?m.
    Type: Application
    Filed: April 27, 2011
    Publication date: February 14, 2013
    Applicant: BAIKOWSKI JAPAN CO., LTD.
    Inventors: Daisuke Hosoi, Takashi Shigeta