Abstract: Methods and apparatus for performance testing of an analog cordless telephone are addressed herein. A telephone base station is connected to a test controller which directs the base station to initiate a test. The test controller signals the telephone handset to transmit a plurality of test packets to the base station, each test packet being similar to an opcode used in signaling between the handset and the base station. For each test packet received, the base station passes a signal to the test controller. The test controller computes an error rate based on a difference between the number or packets received and the number of packets expected and computes communication performance between the handset and the base station based on the error rate.

Abstract: Methods and apparatus for performance testing of an analog cordless telephone are addressed herein. A telephone base station is connected to a test controller which directs the base station to initiate a test. The test controller signals the telephone handset to transmit a plurality of test packets to the base station, each test packet being similar to an opcode used in signaling between the handset and the base station. For each test packet received, the base station passes a signal to the test controller. The test controller computes an error rate based on a difference between the number or packets received and the number of packets expected and computes communication performance between the handset and the base station based on the error rate.

Abstract: Electrostatic discharge (ESD) protection for an electrical device is provided through an arrangement which detects an ESD event occurring in the device and reconfigures a processor in the device after the ESD event so that the event is essentially transparent to a user of the device. A detector circuit incorporated into the device detects the occurrence of the ESD event and, in response thereto, generates a trigger signal which is coupled to the processor. Upon receipt of this trigger signal, the processor retrieves status information that is stored in non-volatile memory and was previously contained in a program being executed just prior to the ESD event, reconfigures itself using the status information, and resumes operation with this status information. A data latch connects to the processor and buffers data from this processor to circuitry controlled by the processor.