Patents by Inventor Dan J. Wendt

Dan J. Wendt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for measuring strong microwave electric field strengths
    Patent number: 4816634
    Abstract: A method and apparatus for measuring strong microwave electric field strengths is disclosed. The apparatus includes a first active temperature probe in cooperation with susceptor means for measuring a temperature indicative of the heating effects of microwave radiation at a test location, and an ambient temperature probe for measuring ambient temperature. The temperature differential between the two probes is used by calibration means for determining electric field strength at the test location. The method includes the steps of heating a susceptor means with microwave radiation, and measuring a temperature indicative of the heating effects of microwave radiation at the test location. Ambient temperature is measured, and the temperature differential used to determine the magnitude of the electric field strength.
    Type: Grant
    Filed: October 23, 1987
    Date of Patent: March 28, 1989
    Inventors: Ronald R. Lentz, Dan J. Wendt, Jonathon D. Kemske, Peter S. Pesheck