Abstract: A method for eliminating the systematic measurement errors from a measurement system, for example a vector network analyzer, such that an accurate representation of the behavior of a nonlinear device can be measured or characterized. The cross-frequency phase and absolute amplitude of the measured voltage waves applied to and emanating from the nonlinear device are measured and error corrected. These waves may be used for nonlinear device characterization or modeling.

Abstract: The invention measures the X-parameters (or large-signal S and T scattering functions, sometimes called linearized scattering functions, which are the correct way to define “large-signal S-parameters”) with only two distinct phases for small-signals on a frequency grid established by intermodulation frequencies and harmonics of the large-tones, with guaranteed well-conditioned data from which the X-parameter functions can be solved explicitly, without the need for regression, and not limited by performance limits of the reference generator or phase-noise.

Abstract: The invention measures the X-parameters (or large-signal S and T scattering functions, sometimes called linearized scattering functions, which are the correct way to define “large-signal S-parameters”) with only two distinct phases for small-signals on a frequency grid established by intermodulation frequencies and harmonics of the large-tones, with guaranteed well-conditioned data from which the X-parameter functions can be solved explicitly, without the need for regression, and not limited by performance limits of the reference generator or phase-noise.

Abstract: A method for eliminating the systematic measurement errors from a measurement system, for example a vector network analyzer, such that an accurate representation of the behavior of a nonlinear device can be measured or characterized. The cross-frequency phase and absolute amplitude of the measured voltage waves applied to and emanating from the nonlinear device are measured and error corrected. These waves may be used for nonlinear device characterization or modeling.

Abstract: A split signal pulse generator (“SSPG”) that generates a difference signal from two split signals from a splitter module, where one of the split signals may be time delayed by a delay module, where the delay module may be a transmission line having a time delay or an adjustable delay line. The SSPG may include an input amplifier configured to shape an input signal received by the splitter module. A method of generating a difference signal is also provided.

Abstract: A split signal pulse generator (“SSPG”) that generates a difference signal from two split signals from a splitter module, where one of the split signals may be time delayed by a delay module, where the delay module may be a transmission line having a time delay or an adjustable delay line. The SSPG may include an input amplifier configured to shape an input signal received by the splitter module. A method of generating a difference signal is also provided.