Abstract: A production operator interface is created using self-contained ActiveX controls each of which provide an interface to a specific part of the overall test system. These controls all communicate among themselves automatically. The production interface uses an ActiveX "tester control" which provides an application programming interface to the rest of the software control system. A library of self-contained ActiveX controls is provided which contains "operator controls" which may be "dragged and dropped" into an operator window to provide the operator with information and the ability to control the test system. In addition a semiconductor test system needs to be adapted to work with one or more different packaged device handlers or wafer probers which position a semiconductor device for testing by the tester. An ActiveX operator control allows an operator to select a handler driver from a library of handler drivers.

Abstract: Automatic test equipment for semiconductor devices with low cost, easy to use software for developing and executing test programs. The tester is controlled with a computer work station running a commercially available spread sheet program. The commercially available spread sheet program is set as an application to provide a program development environment. In addition, programs made with the commercially available spread sheet program control the execution of tests on semiconductor devices. The tester is easy to program because use of the commercially available spread sheet program generates well known programming interfaces. In this way, the commercially available spread sheet program implements the software controlling the tester rather than merely providing spread sheet functions used by the application. The software controlling the automatic test equipment is therefore very easy to program or modify. It is also very easy to program.

Abstract: A production operator interface is created using self-contained ActiveX controls each of which provide an interface to a specific part of the overall test system. These controls all communicate among themselves automatically. The production interface uses an ActiveX "tester control" which provides an application programming interface to the rest of the software control system. A library of self-contained ActiveX controls is provided which contains "operator controls" which may be "dragged and dropped" into an operator window to provide the operator with information and the ability to control the test system. In addition a semiconductor test system needs to be adapted to work with one or more different packaged device handlers or wafer probers which position a semiconductor device for testing by the tester. An ActiveX operator control allows an operator to select a handler driver from a library of handler drivers.

Abstract: An electronic circuit tester for performing digital signal processing on signals generated by an electronic circuit including a multi-processor test computer, a plurality of driver/receiver channels, a plurality of capture instruments, and a plurality of high speed data paths. Capture instruments are programmed by the tester to sample a signal generated by an electronic circuit under test, convert the samples to digital form if necessary, and store the data samples in memory. The data samples are then moved from the memory of the capture instruments to the main memory of the multi-processor for analysis using digital signal processing techniques. After the initial group of data samples are moved from the capture instruments to main memory, subsequent programming of capture instruments and sampling of signals are performed concurrently with the movement and analysis of data samples. Multiple processors and multiple high speed data paths are preferably used to optimize test program throughput.