Patents by Inventor DANIEL JOSEPH BODOH

DANIEL JOSEPH BODOH has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Digital tests with radiation induced upsets
    Patent number: 10782343
    Abstract: Digital testing is performed on an integrated circuit while radiation upsets are induced at locations of the integrated circuit. For each digital test, a determination is made as to whether there is a variation in the output of the digital test from an expected output of the digital test. If there is variation, a time of the variation is indicated. In one example, a location of a defect in the digital circuit can be determined from the times of the variations. In other embodiments, a mapping of the digital circuit can be made from the times.
    Type: Grant
    Filed: April 17, 2018
    Date of Patent: September 22, 2020
    Assignee: NXP USA, INC.
    Inventors: Daniel Joseph Bodoh, Kent Bradley Erington
  • DIGITAL TESTS WITH RADIATION INDUCED UPSETS
    Publication number: 20190317146
    Abstract: Digital testing is performed on an integrated circuit while radiation upsets are induced at locations of the integrated circuit. For each digital test, a determination is made as to whether there is a variation in the output of the digital test from an expected output of the digital test. If there is variation, a time of the variation is indicated. In one example, a location of a defect in the digital circuit can be determined from the times of the variations. In other embodiments, a mapping of the digital circuit can be made from the times.
    Type: Application
    Filed: April 17, 2018
    Publication date: October 17, 2019
    Inventors: DANIEL JOSEPH BODOH, Kent Bradley Erington