Patents by Inventor Daniel K. Blackburn

Daniel K. Blackburn has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Data storage device tester
    Patent number: 8458526
    Abstract: A data storage device (DSD) tester for testing a DSD is disclosed. The DSD tester comprises control circuitry operable to receive a DSD log from the DSD, wherein the DSD log comprises at least one entry identifying at least one error condition. A sequence of commands associated with the error condition is executed in order to determine whether the DSD is defective.
    Type: Grant
    Filed: March 29, 2010
    Date of Patent: June 4, 2013
    Assignee: Western Digital Technologies, Inc.
    Inventors: Lawrence J. Dalphy, Curtis E. Stevens, Daniel K. Blackburn
  • Data storage device tester
    Patent number: 8332695
    Abstract: A data storage device (DSD) tester for testing a DSD is disclosed. The DSD tester comprises a plurality of bays, a screen, and control circuitry operable to detect when a first DSD has been inserted into a first bay. Independent of operator input, a graphical user interface (GUI) displayed on the screen is automatically updated to reflect the first DSD has been inserted into the first bay. Independent of operator input, a DSD test is automatically executed on the first DSD. When the first DSD is removed from the first bay, independent of operator input, the GUI is automatically updated to reflect the first DSD has been removed from the first bay.
    Type: Grant
    Filed: March 29, 2010
    Date of Patent: December 11, 2012
    Assignee: Western Digital Technologies, Inc.
    Inventors: Lawrence J. Dalphy, Daniel K. Blackburn
  • DATA STORAGE DEVICE TESTER
    Publication number: 20110149424
    Abstract: A data storage device (DSD) tester for testing a DSD is disclosed. The DSD tester comprises a plurality of bays, a screen, and control circuitry operable to detect when a first DSD has been inserted into a first bay. Independent of operator input, a graphical user interface (GUI) displayed on the screen is automatically updated to reflect the first DSD has been inserted into the first bay. Independent of operator input, a DSD test is automatically executed on the first DSD. When the first DSD is removed from the first bay, independent of operator input, the GUI is automatically updated to reflect the first DSD has been removed from the first bay.
    Type: Application
    Filed: March 29, 2010
    Publication date: June 23, 2011
    Applicant: WESTERN DIGITAL TECHNOLOGIES, INC.
    Inventors: Lawrence J. Dalphy, Daniel K. Blackburn
  • DATA STORAGE DEVICE TESTER
    Publication number: 20110154113
    Abstract: A data storage device (DSD) tester for testing a DSD is disclosed. The DSD tester comprises control circuitry operable to receive a DSD log from the DSD, wherein the DSD log comprises at least one entry identifying at least one error condition. A sequence of commands associated with the error condition is executed in order to determine whether the DSD is defective.
    Type: Application
    Filed: March 29, 2010
    Publication date: June 23, 2011
    Applicant: WESTERN DIGITAL TECHNOLOGIES, INC.
    Inventors: Lawrence J. Dalphy, Curtis E. Stevens, Daniel K. Blackburn