Patents by Inventor Daniel Lefebvre

Daniel Lefebvre has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11555694
    Abstract: A method for controlling a laser profiler, the laser profiler being configured for generating a laser line on a surface to be inspected, the method comprising: receiving an image of the laser line; determining an actual intensity of the laser line; calculating an amplification factor for the laser line based on the actual intensity of the laser line, a target intensity for the laser line, a power of the laser, a camera gain of the camera and an exposure time of the laser line on the surface to be inspected, the amplification factor allowing the actual intensity of the laser line to reach the target intensity while minimizing the power of the laser; and based on the calculated amplification factor, adjusting at least one parameter of the laser profiler so that the actual intensity of the laser line corresponds to the target intensity.
    Type: Grant
    Filed: July 17, 2020
    Date of Patent: January 17, 2023
    Assignee: SYSTEMES PAVEMETRICS INC.
    Inventors: Eric Samson, Jean-François Hebert, Richard Habel, Daniel Lefebvre
  • Publication number: 20220018654
    Abstract: A method for controlling a laser profiler, the laser profiler being configured for generating a laser line on a surface to be inspected, the method comprising: receiving an image of the laser line; determining an actual intensity of the laser line; calculating an amplification factor for the laser line based on the actual intensity of the laser line, a target intensity for the laser line, a power of the laser, a camera gain of the camera and an exposure time of the laser line on the surface to be inspected, the amplification factor allowing the actual intensity of the laser line to reach the target intensity while minimizing the power of the laser; and based on the calculated amplification factor, adjusting at least one parameter of the laser profiler so that the actual intensity of the laser line corresponds to the target intensity.
    Type: Application
    Filed: July 17, 2020
    Publication date: January 20, 2022
    Applicant: SYSTEMES PAVEMETRICS INC.
    Inventors: Eric SAMSON, Jean-François HEBERT, Richard HABEL, Daniel LEFEBVRE
  • Patent number: 11204241
    Abstract: Provided herein is a method for measuring the size distribution and/or hardness of free falling rock pieces. The method comprises projecting at least one laser line on the falling rock pieces by a laser device; capturing images of the falling rock pieces at an angle from the at least one laser line by at least one camera; and obtaining size distribution data of the falling rock pieces based on data obtained from a topographical map generated from the captured images. Certain embodiments further comprise: obtaining at least one of the volume and area of individual rock pieces from the topographical map; conducting a data analysis on at least one of the volume and area measurements of the rock pieces to reduce at least one of sampling and measurement errors; determining the size distribution of the falling rock pieces based on the data analysis and, optionally, evaluating a rock hardness index for the rock.
    Type: Grant
    Filed: February 15, 2018
    Date of Patent: December 21, 2021
    Assignees: Her Majesty The Queen in Right of Canada as Represented by the Minister of Natural Resources Canada, Institut National d'Optique/National Optics Institute
    Inventors: Magella Bilodeau, Andre Demers, Daniel Lefebvre, Sebastien Roy
  • Publication number: 20200041264
    Abstract: Provided herein is a method for measuring the size distribution and/or hardness of free falling rock pieces. The method comprises projecting at least one laser line on the falling rock pieces by a laser device; capturing images of the falling rock pieces at an angle from the at least one laser line by at least one camera; and obtaining size distribution data of the falling rock pieces based on data obtained from a topographical map generated from the captured images. Certain embodiments further comprise: obtaining at least one of the volume and area of individual rock pieces from the topographical map; conducting a data analysis on at least one of the volume and area measurements of the rock pieces to reduce at least one of sampling and measurement errors; determining the size distribution of the falling rock pieces based on the data analysis and, optionally, evaluating a rock hardness index for the rock.
    Type: Application
    Filed: February 15, 2018
    Publication date: February 6, 2020
    Inventors: Magella BILODEAU, Andre DEMERS, Daniel LEFEBVRE, Sebastien ROY
  • Patent number: 9696143
    Abstract: There is described an optical system for sensing the surface of an object. The system comprises: a light source for emitting at least one light beam centered on the optical axis of the system; a light reflector for reflecting the at least one incident light beam to generate at least two hollow conical light beams centered on the optical axis and having different opening angles, the at least two reflected hollow conical light beams for illuminating the surface; and an image capture device for imaging the illuminated surface.
    Type: Grant
    Filed: December 18, 2015
    Date of Patent: July 4, 2017
    Assignee: INSTITUT NATIONAL D'OPTIQUE
    Inventors: Daniel Lefebvre, Éric Samson, Michel Doucet, Sébastien Roy
  • Publication number: 20160178356
    Abstract: There is described an optical system for sensing the surface of an object. The system comprises: a light source for emitting at least one light beam centered on the optical axis of the system; a light reflector for reflecting the at least one incident light beam to generate at least two hollow conical light beams centered on the optical axis and having different opening angles, the at least two reflected hollow conical light beams for illuminating the surface; and an image capture device for imaging the illuminated surface.
    Type: Application
    Filed: December 18, 2015
    Publication date: June 23, 2016
    Inventors: Daniel LEFEBVRE, Éric SAMSON, Michel DOUCET, Sébastien ROY
  • Patent number: 9131219
    Abstract: A method for determining a centerline for a triangulation-based optical profilometry system, compensating for the spatial variations of the reflectance of an object's surface. The method comprises providing a luminous line on the object, the luminous line being a triangulation line superposed with a compensation line; capturing an image of the triangulation line and of the compensation line; for each position along the imaged triangulation line, determining a transverse triangulation profile from the imaged triangulation line and a transverse compensation profile from the imaged compensation line; determining a transverse correction profile given by the reciprocal of the transverse compensation profile; multiplying the transverse triangulation profile with the transverse correction profile to obtain a corrected transverse triangulation profile; computing a center of the corrected transverse triangulation profile. The centers determined at positions along the triangulation line form the centerline.
    Type: Grant
    Filed: December 18, 2012
    Date of Patent: September 8, 2015
    Assignee: INSTITUT NATIONAL D'OPTIQUE
    Inventors: Michel Doucet, Michel Robert, Daniel Lefebvre
  • Publication number: 20140168368
    Abstract: A method for determining a centerline for a triangulation-based optical profilometry system, compensating for the spatial variations of the reflectance of an object's surface. The method comprises providing a luminous line on the object, the luminous line being a triangulation line superposed with a compensation line; capturing an image of the triangulation line and of the compensation line; for each position along the imaged triangulation line, determining a transverse triangulation profile from the imaged triangulation line and a transverse compensation profile from the imaged compensation line; determining a transverse correction profile given by the reciprocal of the transverse compensation profile; multiplying the transverse triangulation profile with the transverse correction profile to obtain a corrected transverse triangulation profile; computing a center of the corrected transverse triangulation profile. The centers determined at positions along the triangulation line form the centerline.
    Type: Application
    Filed: December 18, 2012
    Publication date: June 19, 2014
    Applicant: Institut National D'Optique
    Inventors: Michel DOUCET, Michel Robert, Daniel Lefebvre
  • Patent number: 7159352
    Abstract: The present invention is directed to an end cap apparatus. In one embodiment, the elongate base member has a support member, and at least one bracket attached to the support member to allow the elongate base member to be attached to a structure. The end cap apparatus also has a price label containment member secured to the support member of the elongate base member for displaying a price label.
    Type: Grant
    Filed: March 9, 2004
    Date of Patent: January 9, 2007
    Inventors: Daniel Lefebvre, David Black, Glenn Golden, Christopher Wiegert