Patents by Inventor Daniel Lefebvre
Daniel Lefebvre has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11555694Abstract: A method for controlling a laser profiler, the laser profiler being configured for generating a laser line on a surface to be inspected, the method comprising: receiving an image of the laser line; determining an actual intensity of the laser line; calculating an amplification factor for the laser line based on the actual intensity of the laser line, a target intensity for the laser line, a power of the laser, a camera gain of the camera and an exposure time of the laser line on the surface to be inspected, the amplification factor allowing the actual intensity of the laser line to reach the target intensity while minimizing the power of the laser; and based on the calculated amplification factor, adjusting at least one parameter of the laser profiler so that the actual intensity of the laser line corresponds to the target intensity.Type: GrantFiled: July 17, 2020Date of Patent: January 17, 2023Assignee: SYSTEMES PAVEMETRICS INC.Inventors: Eric Samson, Jean-François Hebert, Richard Habel, Daniel Lefebvre
-
Publication number: 20220018654Abstract: A method for controlling a laser profiler, the laser profiler being configured for generating a laser line on a surface to be inspected, the method comprising: receiving an image of the laser line; determining an actual intensity of the laser line; calculating an amplification factor for the laser line based on the actual intensity of the laser line, a target intensity for the laser line, a power of the laser, a camera gain of the camera and an exposure time of the laser line on the surface to be inspected, the amplification factor allowing the actual intensity of the laser line to reach the target intensity while minimizing the power of the laser; and based on the calculated amplification factor, adjusting at least one parameter of the laser profiler so that the actual intensity of the laser line corresponds to the target intensity.Type: ApplicationFiled: July 17, 2020Publication date: January 20, 2022Applicant: SYSTEMES PAVEMETRICS INC.Inventors: Eric SAMSON, Jean-François HEBERT, Richard HABEL, Daniel LEFEBVRE
-
Patent number: 11204241Abstract: Provided herein is a method for measuring the size distribution and/or hardness of free falling rock pieces. The method comprises projecting at least one laser line on the falling rock pieces by a laser device; capturing images of the falling rock pieces at an angle from the at least one laser line by at least one camera; and obtaining size distribution data of the falling rock pieces based on data obtained from a topographical map generated from the captured images. Certain embodiments further comprise: obtaining at least one of the volume and area of individual rock pieces from the topographical map; conducting a data analysis on at least one of the volume and area measurements of the rock pieces to reduce at least one of sampling and measurement errors; determining the size distribution of the falling rock pieces based on the data analysis and, optionally, evaluating a rock hardness index for the rock.Type: GrantFiled: February 15, 2018Date of Patent: December 21, 2021Assignees: Her Majesty The Queen in Right of Canada as Represented by the Minister of Natural Resources Canada, Institut National d'Optique/National Optics InstituteInventors: Magella Bilodeau, Andre Demers, Daniel Lefebvre, Sebastien Roy
-
Publication number: 20200041264Abstract: Provided herein is a method for measuring the size distribution and/or hardness of free falling rock pieces. The method comprises projecting at least one laser line on the falling rock pieces by a laser device; capturing images of the falling rock pieces at an angle from the at least one laser line by at least one camera; and obtaining size distribution data of the falling rock pieces based on data obtained from a topographical map generated from the captured images. Certain embodiments further comprise: obtaining at least one of the volume and area of individual rock pieces from the topographical map; conducting a data analysis on at least one of the volume and area measurements of the rock pieces to reduce at least one of sampling and measurement errors; determining the size distribution of the falling rock pieces based on the data analysis and, optionally, evaluating a rock hardness index for the rock.Type: ApplicationFiled: February 15, 2018Publication date: February 6, 2020Inventors: Magella BILODEAU, Andre DEMERS, Daniel LEFEBVRE, Sebastien ROY
-
Patent number: 9696143Abstract: There is described an optical system for sensing the surface of an object. The system comprises: a light source for emitting at least one light beam centered on the optical axis of the system; a light reflector for reflecting the at least one incident light beam to generate at least two hollow conical light beams centered on the optical axis and having different opening angles, the at least two reflected hollow conical light beams for illuminating the surface; and an image capture device for imaging the illuminated surface.Type: GrantFiled: December 18, 2015Date of Patent: July 4, 2017Assignee: INSTITUT NATIONAL D'OPTIQUEInventors: Daniel Lefebvre, Éric Samson, Michel Doucet, Sébastien Roy
-
Publication number: 20160178356Abstract: There is described an optical system for sensing the surface of an object. The system comprises: a light source for emitting at least one light beam centered on the optical axis of the system; a light reflector for reflecting the at least one incident light beam to generate at least two hollow conical light beams centered on the optical axis and having different opening angles, the at least two reflected hollow conical light beams for illuminating the surface; and an image capture device for imaging the illuminated surface.Type: ApplicationFiled: December 18, 2015Publication date: June 23, 2016Inventors: Daniel LEFEBVRE, Éric SAMSON, Michel DOUCET, Sébastien ROY
-
Patent number: 9131219Abstract: A method for determining a centerline for a triangulation-based optical profilometry system, compensating for the spatial variations of the reflectance of an object's surface. The method comprises providing a luminous line on the object, the luminous line being a triangulation line superposed with a compensation line; capturing an image of the triangulation line and of the compensation line; for each position along the imaged triangulation line, determining a transverse triangulation profile from the imaged triangulation line and a transverse compensation profile from the imaged compensation line; determining a transverse correction profile given by the reciprocal of the transverse compensation profile; multiplying the transverse triangulation profile with the transverse correction profile to obtain a corrected transverse triangulation profile; computing a center of the corrected transverse triangulation profile. The centers determined at positions along the triangulation line form the centerline.Type: GrantFiled: December 18, 2012Date of Patent: September 8, 2015Assignee: INSTITUT NATIONAL D'OPTIQUEInventors: Michel Doucet, Michel Robert, Daniel Lefebvre
-
Publication number: 20140168368Abstract: A method for determining a centerline for a triangulation-based optical profilometry system, compensating for the spatial variations of the reflectance of an object's surface. The method comprises providing a luminous line on the object, the luminous line being a triangulation line superposed with a compensation line; capturing an image of the triangulation line and of the compensation line; for each position along the imaged triangulation line, determining a transverse triangulation profile from the imaged triangulation line and a transverse compensation profile from the imaged compensation line; determining a transverse correction profile given by the reciprocal of the transverse compensation profile; multiplying the transverse triangulation profile with the transverse correction profile to obtain a corrected transverse triangulation profile; computing a center of the corrected transverse triangulation profile. The centers determined at positions along the triangulation line form the centerline.Type: ApplicationFiled: December 18, 2012Publication date: June 19, 2014Applicant: Institut National D'OptiqueInventors: Michel DOUCET, Michel Robert, Daniel Lefebvre
-
Patent number: 7159352Abstract: The present invention is directed to an end cap apparatus. In one embodiment, the elongate base member has a support member, and at least one bracket attached to the support member to allow the elongate base member to be attached to a structure. The end cap apparatus also has a price label containment member secured to the support member of the elongate base member for displaying a price label.Type: GrantFiled: March 9, 2004Date of Patent: January 9, 2007Inventors: Daniel Lefebvre, David Black, Glenn Golden, Christopher Wiegert