Abstract: The resistors of heater elements are formed by chemical vapor deposition of polycrystalline silicon at at least one of a flat temperature profile of 620.degree. C. and a ramped temperature profile of 620.degree. C. to 640.degree. C. in a first embodiment. Such method of forming the polysilicon result in a predominantly uniform grain size of approximately 1000 .ANG., where grain size can vary between 200 .ANG. to 1000 .ANG.. Alternatively, the resistors are formed by chemical vapor deposition of amorphous polysilicon at at least one of a flat temperature profile at a temperature below 580.degree. C. and a ramped temperature profile of 565.degree. C. to 575.degree. C. In the alternative embodiment, the polysilicon has a grain size of at least 1000 .ANG.. During the ion implantation of either p-type or n-type dopants into the polysilicon, a flood gun located in an ion implanter emits low energy electrons to neutralize the build-up of positive charges on the polysilicon surface.