Abstract: Various embodiments of the present invention are generally directed to a method and apparatus for providing different bit set modes for a resistive sense memory (RSM) array, such as a spin-torque transfer random access memory (STRAM) or resistive random access memory (RRAM) array. In accordance with some embodiments, a group of RSM cells in a non-volatile semiconductor memory array is identified for application of a bit set operation. A bit set value is selected from a plurality of bit set values each separately writable to the RSM cells to place said cells in a selected resistive state. The selected bit set value is thereafter written to at least a portion of the RSM cells in the identified group.

Abstract: A non-volatile memory cell and associated method of use. In accordance with some embodiments, the memory cell includes a transistor comprising source and drain regions spanned by a gate region, and a resistive sense element (RSE) connected to the drain region of the transistor. The RSE is programmed to a first resistance by flowing a first write current through the RSE and then through the drain and source regions of the transistor. The RSE is programmed to a second resistance by flowing a second write current through the drain region and then through the RSE, the second write current bypassing the source region.

Abstract: Various embodiments are generally directed to a method and apparatus associated with operating a first memory device with multiple interfaces and a status register. In some embodiments, a first interface is engaged by a host. A memory device that has a plurality of memory cells comprised of at least a magnetic tunneling junction and a spin polarizing magnetic material is connected to a second interface. A status register is maintained by logging at least an error or busy signal during data transfer operations through the first and second interfaces.

Abstract: Various embodiments of the present invention are generally directed to a method and apparatus for providing different bit set modes for a resistive sense memory (RSM) array, such as a spin-torque transfer random access memory (STRAM) or resistive random access memory (RRAM) array. In accordance with some embodiments, a group of RSM cells in a non-volatile semiconductor memory array is identified for application of a bit set operation. A bit set value is selected from a plurality of bit set values each separately writable to the RSM cells to place said cells in a selected resistive state. The selected bit set value is thereafter written to at least a portion of the RSM cells in the identified group.

Abstract: Method and apparatus for operating a memory device with a status register. In some embodiments, the memory device has a plurality of individually programmable non-volatile memory cells comprised of at least a resistive sense memory. The memory device engages an interface and maintains a status register in some embodiments by logging at least an error or busy signal during data transfer operations.

Abstract: Various embodiments of the present invention are generally directed to a method and apparatus for providing different bit set modes for a resistive sense memory (RSM) array, such as a spin-torque transfer random access memory (STRAM) or resistive random access memory (RRAM) array. In accordance with some embodiments, a group of RSM cells in a non-volatile semiconductor memory array is identified for application of a bit set operation. A bit set value is selected from a plurality of bit set values each separately writable to the RSM cells to place said cells in a selected resistive state. The selected bit set value is thereafter written to at least a portion of the RSM cells in the identified group.

Abstract: Method and apparatus are disclosed for storing data to non-volatile resistive sense memory (RSM) memory cells of a semiconductor memory array, including but not limited to resistive random access memory (RRAM) and spin-torque transfer random access memory (STTRAM or STRAM) cells. In accordance with various embodiments, a plurality of addressable data blocks from a host device are stored in a buffer. At least a portion of each of the addressable data blocks are serially transferred to a separate register of a plurality of registers. The transferred portions of said addressable data blocks are thereafter simultaneously transferred from the registers to selected RSM cells of the array.

Abstract: Various embodiments of the present invention are generally directed to a method and apparatus for carrying out a partial block update operation upon a resistive sense memory (RSM) array, such as formed from STRAM or RRAM cells. The RSM array is arranged into multi-cell blocks (sectors), each block having a physical block address (PBA). A first set of user data is written to a selected block at a first PBA. A partial block update operation is performed by writing a second set of user data to a second block at a second PBA, the second set of user data updating a portion of the first set of user data in the first PBA. The first and second blocks are thereafter read to retrieve the second set of user data and a remaining portion of the first set of user data.

Abstract: In accordance with various embodiments, a column of non-volatile memory cells is connected between opposing first and second control lines. A fixed reference voltage is applied to the second control line. The memory cells are simultaneously programmed to a first resistive state by applying a first voltage to the first control line that is greater than the fixed reference voltage. Less than all of the memory cells are subsequently simultaneously programmed to a different, second resistive state by applying a second voltage to the first control line that is less than the fixed reference voltage, so that at the conclusion of the respective programming steps a first portion of the memory cells along said column are at the first resistive state and a second portion of the memory cells along said column are at the second resistive state.

Abstract: A non-volatile memory cell and associated method of use are disclosed. In accordance with various embodiments, the memory cell includes a switching device and a resistive sense element (RSE) connected in series between first and second control lines. The first control line is supplied with a variable voltage and the second control line is maintained at a fixed reference voltage. A first resistive state of the RSE is programmed by lowering the variable voltage of the first control line below the fixed reference voltage of the second control line to flow a body-drain current through the switching device. A different, second resistive state of the RSE is programmed by raising the variable voltage of the first control line above the fixed reference voltage to flow a drain-source current through the switching device.

Abstract: Various embodiments of the present invention are generally directed to a method and apparatus for carrying out a partial block update operation upon a resistive sense memory (RSM) array, such as formed from STRAM or RRAM cells. The RSM array is arranged into multi-cell blocks (sectors), each block having a physical block address (PBA). A first set of user data is written to a selected block at a first PBA. A partial block update operation is performed by writing a second set of user data to a second block at a second PBA, the second set of user data updating a portion of the first set of user data in the first PBA. The first and second blocks are thereafter read to retrieve the second set of user data and a remaining portion of the first set of user data.

Abstract: Various embodiments of the present invention are generally directed to a method and apparatus for carrying out a partial block update operation upon a resistive sense memory (RSM) array, such as formed from STRAM or RRAM cells. The RSM array is arranged into multi-cell blocks (sectors), each block having a physical block address (PBA). A first set of user data is written to a selected block at a first PBA. A partial block update operation is performed by writing a second set of user data to a second block at a second PBA, the second set of user data updating a portion of the first set of user data in the first PBA. The first and second blocks are thereafter read to retrieve the second set of user data and a remaining portion of the first set of user data.

Abstract: Method and apparatus are disclosed for storing data to non-volatile resistive sense memory (RSM) memory cells of a semiconductor memory array, including but not limited to resistive random access memory (RRAM) and spin-torque transfer random access memory (STTRAM or STRAM) cells. In accordance with various embodiments, a plurality of addressable data blocks from a host device are stored in a buffer. At least a portion of each of the addressable data blocks are serially transferred to a separate register of a plurality of registers. The transferred portions of said addressable data blocks are thereafter simultaneously transferred from the registers to selected RSM cells of the array.

Abstract: Various embodiments of the present invention are generally directed to a method and apparatus for providing different bit set modes for a resistive sense memory (RSM) array, such as a spin-torque transfer random access memory (STRAM) or resistive random access memory (RRAM) array. In accordance with some embodiments, a group of RSM cells in a non-volatile semiconductor memory array is identified for application of a bit set operation. A bit set value is selected from a plurality of bit set values each separately writable to the RSM cells to place said cells in a selected resistive state. The selected bit set value is thereafter written to at least a portion of the RSM cells in the identified group.

Abstract: Various embodiments are generally directed to a method and apparatus associated with operating a first memory device with multiple interfaces and a status register. In some embodiments, a first interface is engaged by a host. A memory device that has a plurality of memory cells comprised of at least a magnetic tunneling junction and a spin polarizing magnetic material is connected to a second interface. A status register is maintained by logging at least an error or busy signal during data transfer operations through the first and second interfaces.

Abstract: Various embodiments of the present invention are generally directed to a method and apparatus for carrying out a partial block update operation upon a resistive sense memory (RSM) array, such as formed from STRAM or RRAM cells. The RSM array is arranged into multi-cell blocks (sectors), each block having a physical block address (PBA). A first set of user data is written to a selected block at a first PBA. A partial block update operation is performed by writing a second set of user data to a second block at a second PBA, the second set of user data updating a portion of the first set of user data in the first PBA. The first and second blocks are thereafter read to retrieve the second set of user data and a remaining portion of the first set of user data.

Abstract: Method and apparatus for operating a memory device with a status register. In some embodiments, the memory device has a plurality of individually programmable non-volatile memory cells comprised of at least a resistive sense memory. The memory device engages an interface and maintains a status register in some embodiments by logging at least an error or busy signal during data transfer operations.

Abstract: A non-volatile memory cell and associated method of use are disclosed. In accordance with various embodiments, the memory cell includes a switching device and a resistive sense element (RSE) connected in series between first and second control lines. The first control line is supplied with a variable voltage and the second control line is maintained at a fixed reference voltage. A first resistive state of the RSE is programmed by lowering the variable voltage of the first control line below the fixed reference voltage of the second control line to flow a body-drain current through the switching device. A different, second resistive state of the RSE is programmed by raising the variable voltage of the first control line above the fixed reference voltage to flow a drain-source current through the switching device.

Abstract: A magnetic memory cell that includes at least two magnetoresistive memory bits is presented. The memory cell is capable of storing at least two logical states. The first logical state occurs when the bits share the same orientation, such as a parallel orientation or an antiparallel orientation. The second logical state occurs when the bits have opposite orientations. In the second logical state one of the bits has a parallel orientation and the other bit has an antiparallel orientation.

Abstract: A magneto-resistive memory system is presented that includes a radiation-hardened and low power memory cell. The magneto-resistive memory cell includes a word line select transistor in the cell to help eliminate unselected cell disturbances. Furthermore, the magneto-resistive memory cell includes a full-turn write word line that writes true and complimentary bit values using less current than previous cell architectures. The improved memory cell may be used in a memory system with precision current drivers and auto-zero sense amplifiers in order to further lower power and improve overall system reliability.