Abstract: A microscope with at least one illumination beam that is phase modulated in a section along its cross-section with a modulation frequency and a microscope lens for focusing the illumination beam into a test as well as a detection beam path and at least one means of demodulation, wherein at least one polarization altering item is scheduled in the illuminating beam path, for which a phase plate is subordinated that exhibits at least two areas with different phase influence.

Abstract: Laser scanning microscope or spectral detector having a detection beam path and first imaging optics which image spectrally dispersed sample light in a Fourier plane such that the individual spectral components of the sample light are spatially separated from one another therein. A micromirror arrangement is provided in this plane, and a spectrally selective change in direction of the detection beam is carried out by controlling the micromirrors, where a useful light component of the detection beam arrives on a detector. At least one second micromirror arrangement and a 1:1 imaging of the first micromirror arrangement in the second micromirror arrangement is provided. Alternatively, the same micromirror arrangement is passed at least twice, where, in the light path between the first pass and second pass, a spatial offset of the light beam of at least the first pass and second pass is generated on the micromirror arrangement by optical means.