Abstract: Apparatus adapted for use with an existing wire tugger includes a primary frame, a slide frame configured to receive the wire tugger, and a jack that causes the slide frame and existing wire tugger to move up and down, thereby enabling a user to position the upper end adapter of the existing wire tugger proximate to an overhead wire pull location. The system enables the existing wire puller to be transported and physically oriented to address a broader range of overhead wire pulling applications on jobsites. A wheeled cart facilitates traversing throughout jobs and vertical wire-puller mounting, thereby mitigating space constraints while allowing for easier set-up and a broader range of uses. Various interchangeable end adapters facilitate temporary coupling and stabilization with respect to different conduit sizes.

Abstract: Apparatus adapted for use with an existing wire tugger includes a primary frame, a slide frame configured to receive the wire tugger, and a jack that causes the slide frame and existing wire tugger to move up and down, thereby enabling a user to position the upper end adapter of the existing wire tugger proximate to an overhead wire pull location. The system enables the existing wire puller to be transported and physically oriented to address a broader range of overhead wire pulling applications on jobsites. A wheeled cart facilitates traversing throughout jobs and vertical wire-puller mounting, thereby mitigating space constraints while allowing for easier set-up and a broader range of uses. Various interchangeable end adapters facilitate temporary coupling and stabilization with respect to different conduit sizes.

Abstract: A processor, scan controller, and method for protecting sensitive information from electronic hacking is disclosed. To maintain the security of the sensitive data present in a processor, the scan controller denies access to the scan chain until data is cleared from scan-observable portions of the processor, then clears the scan chain again prior to exiting test mode and resuming normal operation. Clearing or otherwise modifying data stored in the scan-observable portions of a processor when transitioning to and/or from a test mode will prevent unauthorized personnel from simply shifting secure data out of the scan chain, and from pre-loading data into the scan chain prior to normal operation in an attempt to set sensitive state information.

Abstract: A circuit device having data retention latches utilizes a test interface and system test controller to control one or more components of the circuit device to ensure proper conditions for testing the data retention latches. The data retention latches each include a scan component that is part of a scan chain, a first latching component that is powered in a first voltage domain and a second latching component that is powered in a second voltage domain, where one of the voltage domains can be effectively shut down when the circuit device is placed in a low-voltage mode. The system test controller can control a scan controller used to scan test data in and out of the scan chain. The system test controller further can control a power controller used to manage a power down sequence and a power up sequence so as to ensure that the data retention latches are not placed in spurious states.