Abstract: Methods and devices for high-temperature sealing of metallic components to ceramic components. The disclosed methods and devices for sealing enable a first environment containing one or more fluids to be isolated from at least one other environment containing one or more fluids. The seal may operate at least part of the time at an elevated temperature, such as a temperature above 100° C., above 300° C., and, in some embodiments, as high as 1000° C. In a typical embodiment, the elevated temperature may be in the range of 600-800° C. The first and/or second environments may be at elevated pressures for at least some fraction of the time. The elevated pressure may be above 100 psig, above 500 psig, and, in some embodiments, as high as 15,000 psig. In a typical embodiment, the elevated pressure may be in the range of 1,000-5,000 psig, and more specifically 1,500-3,000 psig.

Abstract: A chalcogenide glass radiation sensor comprising a chalcogenide glass layer coupled to at least two electrodes and a metal source, and a method using the same are disclosed. The chalcogenide glass layer has a resistivity and the at least two electrodes are configured to facilitate the measurement of the resistivity of the chalcogenide glass layer. The coupling of the metal source and the chalcogenide glass layer is such that the resistivity of the chalcogenide glass layer changes upon exposure to ionizing radiation. The metal source is configured to be external to an electric field that may form between the at least two electrodes as the resistivity of the chalcogenide glass layer is measured.

Abstract: A chalcogenide glass radiation sensor comprising a chalcogenide glass layer coupled to at least two electrodes and a metal source, and a method using the same are disclosed. The chalcogenide glass layer has a resistivity and the at least two electrodes are configured to facilitate the measurement of the resistivity of the chalcogenide glass layer. The coupling of the metal source and the chalcogenide glass layer is such that the resistivity of the chalcogenide glass layer changes upon exposure to ionizing radiation. The metal source is configured to be external to an electric field that may form between the at least two electrodes as the resistivity of the chalcogenide glass layer is measured.

Abstract: A testing apparatus is described that enables both single and double-ended tubular members to be tested under pressure and at elevated temperatures. For double-ended tubular members, the apparatus comprises first and second pressure seals at either end of the tubular member under test, both seals including annular compliant members that bear upon the internal surface of the tubular member. A heater is positioned within the tubular member and one of the pressure seals has an orifice through which the heater is connected to a power source. Pressurization occurs through an orifice in the other pressure seal and cooling apparatus surrounds the first and second ends of the tubular member to cool the pressure seals, thereby enabling the annular compliant members to retain their compliancy when the tubular member is heated to test temperature. For single-ended tubular members, a single pressure seal is used having pathways for both electrical and pressurization connections to the interior of the tubular member.