Patents by Inventor David Anthony Graham

David Anthony Graham has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High voltage integrated circuit testing interface assembly
    Patent number: 11624778
    Abstract: An integrated circuit testing assembly, comprising a slab having a slab axis, and a first electrode and second electrode affixed relative to the slab. The first electrode has a first major axis parallel to the slab axis, is coupled to receive a first voltage for coupling to a first set of pins on an integrated circuit, and includes a first surface area facing the slab axis, wherein the first surface area does not include a surface discontinuity. The second electrode has a second major axis parallel to the slab axis, is coupled to receive a second voltage for coupling to second first set of pins on an integrated circuit, and includes a second surface area facing the slab axis, wherein the second surface area does not include a surface discontinuity.
    Type: Grant
    Filed: March 16, 2020
    Date of Patent: April 11, 2023
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Andrew Patrick Couch, Phillip Marcus Blitz, David Anthony Graham
  • High-voltage isolator testing
    Patent number: 10871514
    Abstract: A handler for holding an electronic device during high voltage testing includes conductive lead guides for shorting leads on one side of the isolator together and connectors connecting the lead guides to conductors.
    Type: Grant
    Filed: May 10, 2016
    Date of Patent: December 22, 2020
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Chi-Tsung Lee, Ming-Chuan You, Chien-Lin Wu, David Anthony Graham, Andrew Patrick Couch
  • HIGH VOLTAGE INTEGRATED CIRCUIT TESTING INTERFACE ASSEMBLY
    Publication number: 20200300909
    Abstract: An integrated circuit testing assembly, comprising a slab having a slab axis, and a first electrode and second electrode affixed relative to the slab. The first electrode has a first major axis parallel to the slab axis, is coupled to receive a first voltage for coupling to a first set of pins on an integrated circuit, and includes a first surface area facing the slab axis, wherein the first surface area does not include a surface discontinuity. The second electrode has a second major axis parallel to the slab axis, is coupled to receive a second voltage for coupling to second first set of pins on an integrated circuit, and includes a second surface area facing the slab axis, wherein the second surface area does not include a surface discontinuity.
    Type: Application
    Filed: March 16, 2020
    Publication date: September 24, 2020
    Inventors: Andrew Patrick Couch, Phillip Marcus Blitz, David Anthony Graham
  • HIGH-VOLTAGE ISOLATOR TESTING
    Publication number: 20170328947
    Abstract: A handler for holding an electronic device during high voltage testing includes conductive lead guides for shorting leads on one side of the isolator together and connectors connecting the lead guides to conductors.
    Type: Application
    Filed: May 10, 2016
    Publication date: November 16, 2017
    Inventors: Chi-Tsung Lee, Ming-Chuan You, Chien-Lin Wu, David Anthony Graham, Andrew Patrick Couch