Patents by Inventor David B. Spencer
David B. Spencer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9956609Abstract: According to some aspects, a system for producing a target molten metal composition is provided. The system includes a sorting device that sorts input pieces of metal based on a control signal. Sorted pieces of metal are melted in a furnace, and a sensor measures the composition of molten metal in the furnace and in response generates a control signal that is sent to the sorting device.Type: GrantFiled: June 23, 2015Date of Patent: May 1, 2018Assignee: Melt Cognition, LLCInventors: Robert De Saro, Diran Apelian, David B. Spencer, Michael Scott Mellen
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Patent number: 8861675Abstract: Disclosed herein is a metal sorting device including an X-ray tube, a dual energy detector array, a microprocessor, and an air ejector array. The device senses the presence of samples in the x-ray sensing region and initiates identifying and sorting the samples. After identifying and classifying the category of a sample, at a specific time, the device activates an array of air ejectors located at specific positions in order to place the sample in the proper collection bin.Type: GrantFiled: February 15, 2012Date of Patent: October 14, 2014Assignee: Spectramet, LLCInventors: Edward J. Sommer, Jr., Charles E. Roos, David B. Spencer, R. Lynn Conley
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Patent number: 8855809Abstract: Systems for sorting materials, such as those made of metal, are described. The systems may operate by irradiating the materials with x-rays and then detecting fluoresced x-rays, transmitted x-rays, or both. Detection of the fluoresced x-rays may be performed using an x-ray fluorescence detector array. The systems may be configured to provide high throughput sorting of small pieces of materials.Type: GrantFiled: August 31, 2012Date of Patent: October 7, 2014Assignee: Spectramet, LLCInventors: David B. Spencer, Jeffrey J. Webster, Aldo M. Reti, Edward J. Sommer, Jr., Richard E. Hill, R. Lynn Conley
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Publication number: 20130264249Abstract: A piece of material that includes low-Z elements is classified based on photonic emissions detected from the piece of material. Both XRF spectroscopy and OES techniques, for example, Laser-Induced Breakdown Spectroscopy (LIBS) and spark discharge spectroscopy, may be used to classify the piece of material. A stream of pieces of material are moved along a conveying system into a stimulation and detection area. Each piece of material, in turn, is stimulated with a first and second stimulus, of a same or different type, causing the piece of material to emit emissions, for example, photons, which may include at least one of x-ray photons (i.e., x-rays) and optical emissions. These emissions then are detected by one or more detectors of a same or different type. The piece of materials is then classified, for example, using a combination of hardware, software and/or firmware, based on the detected emissions, and then sorted.Type: ApplicationFiled: June 3, 2013Publication date: October 10, 2013Inventors: Edward J. Sommer, JR., David B. Spencer, R. Lynn Conley, Richard E. Hill, Robert H. Parrish, Charles E. Roos
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Patent number: 8553838Abstract: A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection.Type: GrantFiled: May 24, 2011Date of Patent: October 8, 2013Assignee: Sprectramet, LLCInventors: Edward J. Sommer, Robert H. Parrish, David B. Spencer, Charles E. Roos
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Patent number: 8476545Abstract: A piece of material that includes low-Z elements is classified based on photonic emissions detected from the piece of material. Both XRF spectroscopy and OES techniques, for example, Laser-Induced Breakdown Spectroscopy (LIBS) and spark discharge spectroscopy, may be used to classify the piece of material. A stream of pieces of material are moved along a conveying system into a stimulation and detection area. Each piece of material, in turn, is stimulated with a first and second stimulus, of a same or different type, causing the piece of material to emit emissions, for example, photons, which may include at least one of x-ray photons (i.e., x-rays) and optical emissions. These emissions then are detected by one or to more detectors of a same or different type. The piece of materials is then classified, for example, using a combination of hardware, software and/or firmware, based on the detected emissions, and then sorted.Type: GrantFiled: June 29, 2010Date of Patent: July 2, 2013Assignee: Spectramet, LLCInventors: Edward J. Sommer, David B. Spencer, R. Lynn Conley, Richard E. Hill, Robert H. Parrish, Charles E. Roos
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Publication number: 20130079918Abstract: Systems for sorting materials, such as those made of metal, are described. The systems may operate by irradiating the materials with x-rays and then detecting fluoresced x-rays, transmitted x-rays, or both. Detection of the fluoresced x-rays may be performed using an x-ray fluorescence detector array. The systems may be configured to provide high throughput sorting of small pieces of materials.Type: ApplicationFiled: August 31, 2012Publication date: March 28, 2013Applicant: Spectramet, LLCInventors: David B. Spencer, Jeffrey J. Webster, Aldo M. Reti, Edward J. Sommer, JR., Richard E. Hill, R. Lynn Conley
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Publication number: 20120148018Abstract: Disclosed herein is a metal sorting device including an X-ray tube, a dual energy detector array, a microprocessor, and an air ejector array. The device senses the presence of samples in the x-ray sensing region and initiates identifying and sorting the samples. After identifying and classifying the category of a sample, at a specific time, the device activates an array of air ejectors located at specific positions in order to place the sample in the proper collection bin.Type: ApplicationFiled: February 15, 2012Publication date: June 14, 2012Applicant: SPECTRAMET, LLCInventors: Edward J. Sommer, Jr., Charles E. Roos, David B. Spencer, R. Lynn Conley
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Patent number: 8144831Abstract: Disclosed herein is a metal sorting device including an X-ray tube, a dual energy detector array, a microprocessor, and an air ejector array. The device senses the presence of samples in the x-ray sensing region and initiates identifying and sorting the samples. After identifying and classifying the category of a sample, at a specific time, the device activates an array of air ejectors located at specific positions in order to place the sample in the proper collection bin.Type: GrantFiled: December 3, 2010Date of Patent: March 27, 2012Assignee: Spectramet, LLCInventors: Edward J. Sommer, Jr., Charles E. Roos, David B. Spencer, R. Lynn Conley
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Publication number: 20110222654Abstract: A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection.Type: ApplicationFiled: May 24, 2011Publication date: September 15, 2011Applicant: Spectrament, LLC.Inventors: Edward J. Sommer, Robert H. Parrish, David B. Spencer, Charles E. Roos
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Patent number: 7978814Abstract: A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection.Type: GrantFiled: October 26, 2009Date of Patent: July 12, 2011Assignee: Spectramet, LLCInventors: Edward J. Sommer, Robert H. Parrish, David B. Spencer, Charles E. Roos
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Publication number: 20110116596Abstract: Disclosed herein is a metal sorting device including an X-ray tube, a dual energy detector array, a microprocessor, and an air ejector array. The device senses the presence of samples in the x-ray sensing region and initiates identifying and sorting the samples. After identifying and classifying the category of a sample, at a specific time, the device activates an array of air ejectors located at specific positions in order to place the sample in the proper collection bin.Type: ApplicationFiled: December 3, 2010Publication date: May 19, 2011Applicant: SPECTRAMET, LLCInventors: Edward J. Sommer, JR., Charles E. Roos, David B. Spencer, R. Lynn Conley
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Patent number: 7848484Abstract: Disclosed herein is a metal sorting device including an X-ray tube, a dual energy detector array, a microprocessor, and an air ejector array. The device senses the presence of samples in the x-ray sensing region and initiates identifying and sorting the samples. After identifying and classifying the category of a sample, at a specific time, the device activates an array of air ejectors located at specific positions in order to place the sample in the proper collection bin.Type: GrantFiled: June 29, 2009Date of Patent: December 7, 2010Assignee: Spectramet, LLCInventors: Edward J. Sommer, Jr., Charles E. Roos, David B. Spencer, R. Lynn Conley
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Publication number: 20100264070Abstract: A piece of material that includes low-Z elements is classified based on photonic emissions detected from the piece of material. Both XRF spectroscopy and OES techniques, for example, Laser-Induced Breakdown Spectroscopy (LIBS) and spark discharge spectroscopy, may be used to classify the piece of material. A stream of pieces of material are moved along a conveying system into a stimulation and detection area. Each piece of material, in turn, is stimulated with a first and second stimulus, of a same or different type, causing the piece of material to emit emissions, for example, photons, which may include at least one of x-ray photons (i.e., x-rays) and optical emissions. These emissions then are detected by one or to more detectors of a same or different type. The piece of materials is then classified, for example, using a combination of hardware, software and/or firmware, based on the detected emissions, and then sorted.Type: ApplicationFiled: June 29, 2010Publication date: October 21, 2010Applicant: SPECTRAMET, LLCInventors: Edward J. Sommer, JR., David B. Spencer, R. Lynn Conley, Richard E. Hill, Robert H. Parrish, Charles E. Roos
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Patent number: 7763820Abstract: A piece of material that includes low-Z elements is classified based on photonic emissions detected from the piece of material. Both XRF spectroscopy and OES techniques, for example, Laser-Induced Breakdown Spectroscopy (LIBS) and spark discharge spectroscopy, may be used to classify the piece of material. A stream of pieces of material are moved along a conveying system into a stimulation and detection area. Each piece of material, in turn, is stimulated with a first and second stimulus, of a same or different type, causing the piece of material to emit emissions, for example, photons, which may include at least one of x-ray photons (i.e., x-rays) and optical emissions. These emissions then are detected by one or more detectors of a same or different type. The piece of materials is then classified, for example, using a combination of hardware, software and/or firmware, based on the detected emissions, and then sorted.Type: GrantFiled: November 27, 2007Date of Patent: July 27, 2010Assignee: Spectramet, LLCInventors: Edward J. Sommer, Jr., David B. Spencer, R. Lynn Conley, Richard E. Hill, Robert H. Parrish, Charles E. Roos
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Publication number: 20100111252Abstract: A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection.Type: ApplicationFiled: October 26, 2009Publication date: May 6, 2010Applicant: Spectramet, LLCInventors: Edward J. Sommer, JR., Robert H. Parrish, David B. Spencer, Charles E. Roos
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Patent number: 7616733Abstract: A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection.Type: GrantFiled: June 13, 2008Date of Patent: November 10, 2009Assignee: Spectramet, LLCInventors: Edward J. Sommer, Robert H. Parrish, David B. Spencer, Charles E. Roos
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Publication number: 20090261024Abstract: Disclosed herein is a metal sorting device including an X-ray tube, a dual energy detector array, a microprocessor, and an air ejector array. The device senses the presence of samples in the x-ray sensing region and initiates identifying and sorting the samples. After identifying and classifying the category of a sample, at a specific time, the device activates an array of air ejectors located at specific positions in order to place the sample in the proper collection bin.Type: ApplicationFiled: June 29, 2009Publication date: October 22, 2009Applicant: SPECTRAMET, LLCInventors: Edward J. Sommer, JR., Charles E. Roos, David B. Spencer, R. Lynn Conley
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Patent number: 7564943Abstract: Disclosed herein is a metal sorting device including an X-ray tube, a dual energy detector array, a microprocessor, and an air ejector array. The device senses the presence of samples in the x-ray sensing region and initiates identifying and sorting the samples. After identifying and classifying the category of a sample, at a specific time, the device activates an array of air ejectors located at specific positions in order to place the sample in the proper collection bin.Type: GrantFiled: August 3, 2006Date of Patent: July 21, 2009Assignee: Spectramet, LLCInventors: Edward J. Sommer, Jr., Charles E. Roos, David B. Spencer, R. Lynn Conley
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Publication number: 20080279329Abstract: A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection.Type: ApplicationFiled: June 13, 2008Publication date: November 13, 2008Applicant: Spectramet, LLCInventors: Edward J. Sommer, JR., Robert H. Parrish, David B. Spencer, Charles E. Roos