Patents by Inventor David Berman

David Berman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20080273258
    Abstract: A method for reading a magnetic medium having a data band thereon, the data band comprising a plurality of simultaneously written tracks. The method includes receiving signals from a plurality of adjacent readers simultaneously reading data tracks, wherein at least some of the readers that are currently reading overlie adjacent data tracks such that the reader generates signals from the adjacent data tracks; receiving a signal from at least one reader reading an alignment band; for at least each reader overlying adjacent data tracks, determining a fractional overlap of the reader relative to the underlying adjacent data tracks based on the signal from the reader reading the alignment band; and extracting data from readback of the data tracks based at least in part on the determined fractional overlaps of the readers relative to the adjacent data tracks thereunder.
    Type: Application
    Filed: July 24, 2008
    Publication date: November 6, 2008
    Inventors: David Berman, W. Stanley Czarnecki, Icko E.T. Iben, Wayne Isami Imaino
  • Patent number: 7428120
    Abstract: A system and method for reading a magnetic medium having a data band thereon, the data band comprising a plurality of written data tracks and in some embodiments at least one alignment band. The system in one embodiment includes a plurality of adjacent readers for simultaneously reading the data tracks, at least some of the readers overlapping multiple data tracks. At least one reader is also present for reading the at least one alignment band. A mechanism determines a fractional overlap of each reader on the data tracks based on readback of the alignment band. A mechanism extracts data from readback of the data tracks based at least in part on the fractional overlap.
    Type: Grant
    Filed: March 30, 2007
    Date of Patent: September 23, 2008
    Assignee: International Business Machines Corporation
    Inventors: David Berman, W. Stanley Czarnecki, Icko E. T. Iben, Wayne Isami Imaino
  • Patent number: 7406153
    Abstract: Apparatus for analysis of a sample includes a radiation source, which is configured to direct a beam of radiation along a beam axis to impinge on a target area on a surface of the sample. A detector assembly is configured to sense the radiation scattered from the sample. A beam control assembly includes a beam blocker, which has a lower side adjoining the surface of the sample, and which contains front and rear slits perpendicular to the lower side that together define a beam plane that contains the beam axis and passes through the target area. The front slit is located between the radiation source and the target area, and the rear slit is located between the target area and the detector assembly.
    Type: Grant
    Filed: August 15, 2006
    Date of Patent: July 29, 2008
    Assignee: Jordan Valley Semiconductors Ltd.
    Inventor: David Berman
  • Publication number: 20080159475
    Abstract: A method for inspection includes irradiating a sample using an X-ray beam, which is focused so as to define a spot on a surface of the sample. At least one of the sample and the X-ray beam is shifted so as to scan the spot along a scan path that crosses a feature on the surface. Respective intensities of X-ray fluorescence emitted from the sample responsively to the X-ray beam are measured at a plurality of locations along the scan path, at which the spot has different, respective degrees of overlap with the feature. The intensities measured at the plurality of the locations are processed in order to compute an adjusted value of the emitted X-ray fluorescence over the scan path. A thickness of the feature is estimated based on the adjusted value.
    Type: Application
    Filed: December 20, 2007
    Publication date: July 3, 2008
    Inventors: Isaac Mazor, David Berman, Boris Yokhin, Alexander Tokar
  • Publication number: 20080043911
    Abstract: Apparatus for analysis of a sample includes a radiation source, which is configured to direct a beam of radiation along a beam axis to impinge on a target area on a surface of the sample. A detector assembly is configured to sense the radiation scattered from the sample. A beam control assembly includes a beam blocker, which has a lower side adjoining the surface of the sample, and which contains front and rear slits perpendicular to the lower side that together define a beam plane that contains the beam axis and passes through the target area. The front slit is located between the radiation source and the target area, and the rear slit is located between the target area and the detector assembly.
    Type: Application
    Filed: August 15, 2006
    Publication date: February 21, 2008
    Inventor: David Berman
  • Publication number: 20080043914
    Abstract: A method for analysis of a sample includes directing a beam of radiation to impinge on a target area on a surface of the sample along a beam axis at a plurality of different elevation angles. For each of the different angles, a respective offset of the beam in a direction transverse to the beam axis is determined. While sensing the radiation scattered from the sample at each of the different elevation angles in succession, a transverse correction is applied to at least one of the beam and the sample in order to compensate for the respective offset at each of the different elevation angles.
    Type: Application
    Filed: July 3, 2007
    Publication date: February 21, 2008
    Inventors: Isaac Mazor, David Berman
  • Publication number: 20070274447
    Abstract: A computer-implemented method for inspection of a sample includes defining a plurality of locations on a surface of the sample, irradiating the surface at each of the locations with a beam of X-rays, and measuring an angular distribution of the X-rays that are emitted from the surface responsively to the beam, so as to produce a respective plurality of X-ray spectra. The X-ray spectra are analyzed to produce respective figures-of-merit indicative of a measurement quality of the X-ray spectra at the respective locations. One or more locations are selected out of the plurality of locations responsively to the figures-of-merit, and a property of the sample is estimated using the X-ray spectra measured at the selected locations.
    Type: Application
    Filed: May 15, 2007
    Publication date: November 29, 2007
    Inventors: Isaac Mazor, Alex Dikopoltsev, Boris Yokhin, Tzachi Rafaeli, Alex Tokar, David Berman, Moshe Beylin
  • Publication number: 20070231828
    Abstract: Elevated Hedgehog (Hh) pathway activity, including ligand stimulated Hh pathway activity, was detected in prostate tumors, and determined to be associated with growth and proliferation of the cancer cells. Accordingly, methods are provided for treating a prostate cancer associated with elevated Hh pathway activity by reducing or inhibiting the Hh pathway activity. Also provided are methods of identifying a prostate tumor of a subject as, or as capable of becoming lethal and/or metastatic.
    Type: Application
    Filed: November 7, 2006
    Publication date: October 4, 2007
    Applicant: Johns Hopkins University
    Inventors: Philip Beachy, David Berman, Sunil Karhadkar, Edward Schaeffer, Angelo DeMarzo
  • Patent number: 7253986
    Abstract: A system and method for reading a magnetic medium having a data band thereon, the data band comprising a plurality of simultaneously written data tracks and at least one alignment band. The system in one embodiment includes a plurality of adjacent readers for simultaneously reading the data tracks. At least one reader is also present for reading the at least one alignment band. A mechanism determines a fractional overlap of each reader on the data tracks based on readback of the alignment band. A mechanism extracts data from readback of the data tracks based at least in part on the fractional overlap.
    Type: Grant
    Filed: August 30, 2005
    Date of Patent: August 7, 2007
    Assignee: International Business Machines Corporation
    Inventors: David Berman, W. Stanley Czarnecki, Icko F. Iben, Wayne Isami Imaino
  • Publication number: 20070165326
    Abstract: A system and method for reading a magnetic medium having a data band thereon, the data band comprising a plurality of written data tracks and in some embodiments at least one alignment band. The system in one embodiment includes a plurality of adjacent readers for simultaneously reading the data tracks, at least some of the readers overlapping multiple data tracks. At least one reader is also present for reading the at least one alignment band. A mechanism determines a fractional overlap of each reader on the data tracks based on readback of the alignment band. A mechanism extracts data from readback of the data tracks based at least in part on the fractional overlap.
    Type: Application
    Filed: March 30, 2007
    Publication date: July 19, 2007
    Inventors: David Berman, W. Czarnecki, Icko Iben, Wayne Imaino
  • Publication number: 20070130668
    Abstract: A patient gown includes a garment having an access opening overlying a portion of a patient's body when worn; and a drape attached to the garment for movement between a covered position in which the drape covers the access opening to conceal, and maintain patient privacy of, the portion of the patient's body, and an exposed position in which the drape is uncovered from the access opening to expose, and enable access to, the portion of the patient's body. The patient's modesty is maintained while at the same time allowing unfettered access by a health care professional to different portions of the patient's body. The gown is medical personnel convenient especially for medical procedures, while retaining wanted coverage of the patient so as to avoid embarrassment due to unavoidable, undesired exposure of the body of the patient.
    Type: Application
    Filed: December 14, 2005
    Publication date: June 14, 2007
    Inventors: David Berman, Ronnye Shamam
  • Patent number: 7231016
    Abstract: A method for inspection of a sample having a surface layer. The method includes acquiring a first reflectance spectrum of the sample while irradiating the sample with a collimated beam of X-rays, and processing the first reflectance spectrum to measure a diffuse reflection property of the sample. A second reflectance spectrum of the sample is acquired while irradiating the sample with a converging beam of the X-rays. The second reflectance spectrum is analyzed using the diffuse reflection property so as to determine a characteristic of the surface layer of the sample.
    Type: Grant
    Filed: April 4, 2006
    Date of Patent: June 12, 2007
    Assignee: Jordan Valley Applied Radiation, Ltd.
    Inventors: David Berman, Isaac Mazor, Boris Yokhin, Amos Gvirtzman
  • Publication number: 20070047131
    Abstract: A system and method for reading a magnetic medium having a data band thereon, the data band comprising a plurality of simultaneously written data tracks and at least one alignment band. The system in one embodiment includes a plurality of adjacent readers for simultaneously reading the data tracks. At least one reader is also present for reading the at least one alignment band. A mechanism determines a fractional overlap of each reader on the data tracks based on readback of the alignment band. A mechanism extracts data from readback of the data tracks based at least in part on the fractional overlap.
    Type: Application
    Filed: August 30, 2005
    Publication date: March 1, 2007
    Inventors: David Berman, W. Czarnecki, Icko Iben, Wayne Imaino
  • Patent number: 7139142
    Abstract: A signal sampler digitally samples magnetic signals detected by read head(s) of a magnetic tape drive, and a signal quality system extracts from the digital samples of a format required signal of the magnetic signals, such as a data set separator pattern, an estimated amplitude of write equalization transitions of the format required signal; and compares the extracted estimated amplitude to acceptable amplitude.
    Type: Grant
    Filed: October 29, 2004
    Date of Patent: November 21, 2006
    Assignee: International Business Machines Corporation
    Inventors: David Berman, Eric Rolf Christensen
  • Patent number: 7130376
    Abstract: A method for inspection of a sample that includes a first layer having a known reflectance property and a second layer formed over the first layer. The method includes directing radiation toward a surface of the sample and sensing the radiation reflected from the surface so as to generate a reflectance signal as a function of elevation angle relative to the surface. A feature due to reflection of the radiation from the first layer is identified in the reflectance signal. The reflectance signal is calibrated responsively to the identified feature and to the known reflectance property of the first layer. The calibrated reflectance signal is analyzed to determine a characteristic of the second layer. Other enhanced inspection methods are disclosed, as well.
    Type: Grant
    Filed: December 7, 2005
    Date of Patent: October 31, 2006
    Assignee: Jordan Valley Applied Radiation Ltd.
    Inventors: David Berman, Alex Dikopoltsev, Dileep Agnihotri
  • Patent number: 7102839
    Abstract: Channel parameters for a magnetic readback channel are optimized by detecting a readback signal that is recorded on a magnetic medium. The readback signal contains a plurality of predetermined-length control fields. Each control field is arranged between two user data fields and contains at least one transition. At least one selected readback parameter, such as a frequency of a readback channel system clock, a gain of the readback channel, a equalization response of the readback signal, and/or an amplitude asymmetry of the readback channel, is optimized based on information contained in at least one control field.
    Type: Grant
    Filed: October 31, 2003
    Date of Patent: September 5, 2006
    Assignee: International Business Machines Corporation
    Inventors: David Berman, Constantin Michael Melas
  • Publication number: 20060182220
    Abstract: A method for inspection of a sample having a surface layer. The method includes acquiring a first reflectance spectrum of the sample while irradiating the sample with a collimated beam of X-rays, and processing the first reflectance spectrum to measure a diffuse reflection property of the sample. A second reflectance spectrum of the sample is acquired while irradiating the sample with a converging beam of the X-rays. The second reflectance spectrum is analyzed using the diffuse reflection property so as to determine a characteristic of the surface layer of the sample.
    Type: Application
    Filed: April 4, 2006
    Publication date: August 17, 2006
    Inventors: David Berman, Isaac Mazor, Boris Yokhin, Amos Gvirtzman
  • Publication number: 20060176982
    Abstract: An apparatus, system, and method are disclosed for asymmetric maximum likelihood detection. An initialization module initializes a plurality of branch metrics and a plurality of path memories. A coefficient module calculates a plurality of coefficients. A computation module calculates a first and second specified likelihood function. A selection module calculates a third specified branch metric as the maximum of the first and second specified likelihood functions. A path metrics module calculates a third specified path memory from a first and second specified path memory. A results module identifies a data output value from one or more path memories.
    Type: Application
    Filed: February 9, 2005
    Publication date: August 10, 2006
    Inventors: David Berman, Evangelos Eleftherion, Robert Hutchins, Glen Jaquette, Constantin Melas, Sedat Oelcer
  • Publication number: 20060153333
    Abstract: A method for inspection of a sample that includes a first layer having a known reflectance property and a second layer formed over the first layer. The method includes directing radiation toward a surface of the sample and sensing the radiation reflected from the surface so as to generate a reflectance signal as a function of elevation angle relative to the surface. A feature due to reflection of the radiation from the first layer is identified in the reflectance signal. The reflectance signal is calibrated responsively to the identified feature and to the known reflectance property of the first layer. The calibrated reflectance signal is analyzed to determine a characteristic of the second layer. Other enhanced inspection methods are disclosed, as well.
    Type: Application
    Filed: December 7, 2005
    Publication date: July 13, 2006
    Inventors: David Berman, Alex Dikopoltsev, Dileep Agnihotri
  • Patent number: 7068753
    Abstract: A method for inspection of a sample having a surface layer. The method includes acquiring a first reflectance spectrum of the sample while irradiating the sample with a collimated beam of X-rays, and processing the first reflectance spectrum to measure a diffuse reflection property of the sample. A second reflectance spectrum of the sample is acquired while irradiating the sample with a converging beam of the X-rays. The second reflectance spectrum is analyzed using the diffuse reflection property so as to determine a characteristic of the surface layer of the sample.
    Type: Grant
    Filed: July 30, 2004
    Date of Patent: June 27, 2006
    Assignee: Jordan Valley Applied Radiation Ltd.
    Inventors: David Berman, Isaac Mazor, Boris Yokhin, Amos Gvirtzman